Development of highly sensitive [Ru(bpy)3]2+ - Based optical oxygen sensing thin films in the presence with Fe3O4 and Fe3O4@Ag NPs

An optical oxygen sensor based on the phosphorescence quenching of palladium tetrakis(4-carboxyphenyl)porphyrin (PdTCPP) self-assembled film (SAM) on alumina plate was developed. The phosphorescence intensity of PdTCPP film decreased with increasing oxygen pressure, indicating that the film can be used as an optical oxygen-sensing device based on phosphorescence quenching by oxygen. The ratio I0/I100 as a sensitivity measure of the sensing film is estimated to be 17.7, showing that the film is a highly sensitive device for oxygen pressure. The film obeyed Stern–Volmer plots with a multisite model and possessed good operational stability and a fast response. Response times are 36 s for deoxygenated to oxygenated conditions and 148 s for the reverse conditions.

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Highly sensitive absorption measurements in organic thin films and optical media

10.1117/12.50677 ◽

1991 ◽

Cited By ~ 3

Author(s):

Andrew Skumanich

Keyword(s):

Thin Films ◽

Organic Thin Films ◽

Optical Media ◽

Highly Sensitive ◽

Absorption Measurements

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Highly sensitive ultraviolet photodetectors fabricated from rare earth metal ions doped NiO thin films via nebulizer spray pyrolysis method

Sensors and Actuators A Physical ◽

10.1016/j.sna.2021.113242 ◽

2021 ◽

pp. 113242

Author(s):

I. Loyola Poul Raj ◽

S. Valanarasu ◽

S. Vinoth ◽

N. Chidhambaram ◽

R.S. Rimal Isaac ◽

...

Keyword(s):

Thin Films ◽

Rare Earth ◽

Rare Earth Metal ◽

Earth Metal ◽

Spray Pyrolysis Method ◽

Pyrolysis Method ◽

Highly Sensitive ◽

Nebulizer Spray Pyrolysis ◽

Ultraviolet Photodetectors ◽

Nebulizer Spray

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XPS study of Nb-doped oxygen sensing TiO2 thin films prepared by sol-gel method

Thin Solid Films ◽

10.1016/s0040-6090(98)00534-3 ◽

1998 ◽

Vol 326 (1-2) ◽

pp. 238-244 ◽

Cited By ~ 176

Author(s):

M.Z. Atashbar ◽

H.T. Sun ◽

B. Gong ◽

W. Wlodarski ◽

R. Lamb

Keyword(s):

Thin Films ◽

Oxygen Sensing ◽

Sol Gel ◽

Tio2 Thin Films ◽

Gel Method ◽

Sol Gel Method ◽

Xps Study

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Switchable and adjustable AIE activity of Pt(II) complexes achieving swift-responding and highly sensitive oxygen sensing

Sensors and Actuators B Chemical ◽

10.1016/j.snb.2020.128987 ◽

2021 ◽

Vol 326 ◽

pp. 128987

Author(s):

Ling Di ◽

Zhengqiang Xia ◽

Honghao Wang ◽

Yang Xing ◽

Zhanxu Yang

Keyword(s):

Oxygen Sensing ◽

Highly Sensitive

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Highly sensitive and moderately cooled THz sensing: a challenge for Y-Ba-Cu-O superconducting thin films

Millimetre Wave and Terahertz Sensors and Technology XIII ◽

10.1117/12.2574041 ◽

2020 ◽

Author(s):

Alain J. Kreisler ◽

Annick F. Dégardin ◽

Romain Ladret ◽

Vishal Jagtap

Keyword(s):

Thin Films ◽

Superconducting Thin Films ◽

Highly Sensitive ◽

Thz Sensing

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Micrometric Growth Defects of DLC Thin Films

C – Journal of Carbon Research ◽

10.3390/c5040073 ◽

2019 ◽

Vol 5 (4) ◽

pp. 73 ◽

Cited By ~ 2

Author(s):

Thibault Maerten ◽

Cédric Jaoul ◽

Roland Oltra ◽

Patrice Duport ◽

Christophe Le Niniven ◽

...

Keyword(s):

Thin Films ◽

Defect Density ◽

Electrochemical Techniques ◽

Electrochemical Activation ◽

Diamond Like Carbon ◽

Growth Defects ◽

Chemical Inertness ◽

Highly Sensitive ◽

Deposition Processes

Defects in diamond-like carbon coatings deposited on corrosion sensitive 100Cr6 steel have been studied. Diamond-like carbon (DLC) thin films are promising for corrosion protection due to chemical inertness and low electrical conductivity. Nevertheless, the performance of these coating is highly sensitive to the presence of uncoated areas. These defects represent the primary way of substrate degradation in aggressive environments. An in situ optical microscopy coupled to an electrochemical activation was developed to reveal micrometric growth defects and observe that they were at the origin of corrosion. A square wave voltammetry was applied to increase the sensitivity of electrochemical techniques based on the detection of the dissolution of the bare metal surface triggered by the presence of uncoated spots. This method can be utilized to quantify defect density arising from vapor deposition processes.

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