The influence of information depth and information breadth on brokers’ idea newness in online maker communities

2020 ◽  
pp. 104142
Author(s):  
Christian Resch ◽  
Alexander Kock
Keyword(s):  
1992 ◽  
Vol 275 (1-2) ◽  
pp. 114-120 ◽  
Author(s):  
J. Ferrón ◽  
E.C. Goldberg

2008 ◽  
Vol 255 (5) ◽  
pp. 2474-2477 ◽  
Author(s):  
H. Mönig ◽  
I. Lauermann ◽  
A. Grimm ◽  
C. Camus ◽  
C.A. Kaufmann ◽  
...  

Author(s):  
A. Kumar ◽  
U. Welzel ◽  
M. Wohlschlögel ◽  
W. Baumann ◽  
Eric J. Mittemeijer

1990 ◽  
Vol 34 ◽  
pp. 105-121 ◽  
Author(s):  
K. J. Romand ◽  
F. Gaillard ◽  
M. Charbonnier ◽  
D. S. Urch

In the field of material analysis and characterization interest has considerably shifted over the last few decades from bulk to surface and very thin film problems. At the present state a wide range of surface analytical techniques - such as x-ray photoelectron (XPS), Auger electron (AES), secondary ion mass (SIMS), ion scattering (ISS) spectroscopies - have become available but every one of them exhibits specific analytical features and information content. Within the context of this paper the main parameter to be considered is the information depth i.e the layer thickness from which the majority of information-bearing particles escape and hence are detected. For XPS and AES, this parameter is associated with the mean-free path of photoelectrans or Auger electrons and typically is in the range from 0.5 to 4 nm. In SIMS the ejected secondary ions are emitted from the outer 2 or 3 atomic layers (i.e. from about 1 nm) while the single-collision binary process occuring in ISS is restricted to atoms from the top most atomic layer (0.2-0.3 nm).


2005 ◽  
Vol 105 ◽  
pp. 71-76 ◽  
Author(s):  
Kurt Helming ◽  
Uwe Preckwinkel

Starting from simple geometric considerations concerning directions and orientations, intelligent strategies for pole figure measurements were developed for the area detector. The amount and quality of texture information contained in measured or available data sets can be directly controlled. The texture approximation is done by the component method. The method does not have any restrictions concerning the grids of sample directions in the pole figures. An almost constant information depth can be obtained at a low angle of incidence of the primary beam for the study of thin surface layers.


2018 ◽  
Vol 96 (5) ◽  
pp. 431-435 ◽  
Author(s):  
Clayton W. Schultz ◽  
Jessica X.H. Wong ◽  
Hua-Zhong Yu

Fingerprinting is an essential form of identification for both biometric security and forensics today. Herein, we describe the procedure and principle of creating highly resolved, chemically robust, 3D fingerprint physical replicas, which is based on the solvent-assisted molding of transparent plastics and motion-promoted growth of semi-crystalline polymeric nanostructures. Prior to fingerprinting atop, polycarbonate, a commercial polymer with excellent durability and optical transparency, is first swelled and softened with a mild solvent (acetone). The molding motion conforms polymer chains between fingerprint ridges, which facilitates the formation of semi-crystalline spherulites and results in greater opacity between ridges than underneath ridges. Besides being more enduring than digital scanning and ink printed counterparts, the plastic fingerprint replicas can provide additional morphological information (depth of the ridge) and high-level details (distribution of sweat pores).


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