Secondary electron emission from insulators and negative electron affinity semiconductors

AbstractSecondary electron emission spectroscopy is used to examine the emission characteristics of diamond films as a function of the bulk and surface properties. We find significant variation in the secondary electron yields measured from diamond surfaces even when energy distribution measurements indicate that a low or negative electron affinity is present. In particular, we observe that the material properties, such as bulk and surface uniformity, surface composition, and impurity and defect concentrations, have a strong affect on the secondary electron yield measurements. Furthermore, the energy distribution of the emitted electrons is found to vary with adsorbate species. In certain cases, the energy distribution changes with adsorbate coverage even though the measured electron intensity remains unchanged. From an analysis of the data, we identify bulk and surface properties needed to optimize the emission characteristics.

Download Full-text

Fine structure in the secondary electron emission peak for diamond crystal with (100) negative electron affinity surface

Applied Physics Letters ◽

10.1063/1.122876 ◽

1998 ◽

Vol 73 (25) ◽

pp. 3727-3729 ◽

Cited By ~ 12

Author(s):

V. M. Asnin ◽

I. L. Krainsky

Keyword(s):

Fine Structure ◽

Electron Affinity ◽

Electron Emission ◽

Secondary Electron ◽

Diamond Crystal ◽

Secondary Electron Emission ◽

Emission Peak ◽

Negative Electron Affinity

Download Full-text

THEORETICAL RESEARCH OF SECONDARY ELECTRON EMISSION FROM NEGATIVE ELECTRON AFFINITY SEMICONDUCTORS

Surface Review and Letters ◽

10.1142/s0218625x18501810 ◽

2019 ◽

Vol 26 (04) ◽

pp. 1850181 ◽

Cited By ~ 3

Author(s):

AI-GEN XIE ◽

YANG YU ◽

YA-YI CHEN ◽

YU-QING XIA ◽

HAO-YU LIU

Keyword(s):

Electron Affinity ◽

Electron Emission ◽

Secondary Electron ◽

Secondary Electron Emission ◽

Primary Electron ◽

Theoretical Research ◽

Negative Electron Affinity ◽

Secondary Electron Yield ◽

Electron Yield ◽

Yield Formula

Based on primary range [Formula: see text], relationships among parameters of secondary electron yield [Formula: see text] and the processes and characteristics of secondary electron emission (SEE) from negative electron affinity (NEA) semiconductors, the universal formulas for [Formula: see text] at [Formula: see text] and at [Formula: see text] for NEA semiconductors were deduced, respectively; where [Formula: see text] is incident energy of primary electron. According to the characteristics of SEE from NEA semiconductors with [Formula: see text], [Formula: see text], deduced universal formulas for [Formula: see text] at [Formula: see text] and at [Formula: see text] for NEA semiconductors and experimental data, special formulas for [Formula: see text] at 0.5[Formula: see text] of several NEA semiconductors with [Formula: see text] were deduced and proved to be true experimentally, respectively; where [Formula: see text] is the [Formula: see text] at which [Formula: see text] reaches maximum secondary electron yield. It can be concluded that the formula for [Formula: see text] of NEA semiconductors with [Formula: see text] was deduced and could be used to calculate [Formula: see text], and that the method of calculating the 1/[Formula: see text] of NEA semiconductors with [Formula: see text] is plausible; where [Formula: see text] is the probability that an internal secondary electron escapes into vacuum upon reaching the surface of emitter, and 1/[Formula: see text] is mean escape depth of secondary electron.

Download Full-text

Fine structure in the secondary electron emission peak for CVD diamond films with negative electron affinity

9th International Vacuum Microelectronics Conference ◽

10.1109/ivmc.1996.601840 ◽

2002 ◽

Author(s):

V.M. Asnin ◽

I.L. Krainsky

Keyword(s):

Fine Structure ◽

Electron Affinity ◽

Electron Emission ◽

Secondary Electron ◽

Secondary Electron Emission ◽

Diamond Films ◽

Cvd Diamond ◽

Emission Peak ◽

Negative Electron Affinity

Download Full-text

Calculation of secondary electron emission for emitters, with low or negative electron affinity, and comparison with experiment

Vacuum ◽

10.1016/0042-207x(74)90133-x ◽

1974 ◽

Vol 24 (1) ◽

pp. 40

Keyword(s):

Electron Affinity ◽

Electron Emission ◽

Secondary Electron ◽

Secondary Electron Emission ◽

Negative Electron Affinity ◽

Comparison With Experiment

Download Full-text

Surface damage effects on secondary electron emission From the negative electron affinity diamond surface

MRS Proceedings ◽

10.1557/proc-416-311 ◽

1995 ◽

Vol 416 ◽

Cited By ~ 2

Author(s):

D. P. Malta ◽

J. B. Posthill ◽

T. P. Humphreys ◽

M. J. Mantini ◽

R. J. Markunas

Keyword(s):

Electron Affinity ◽

Electron Emission ◽

Photoelectron Spectroscopy ◽

Secondary Electron ◽

Natural Diamond ◽

Hydrogen Plasma ◽

Secondary Electron Emission ◽

Surface Damage ◽

Diamond Surface ◽

Negative Electron Affinity

ABSTRACTThe effects of surface damage on the secondary electron emission characteristics of a natural diamond (100) surface have been investigated using ultraviolet photoelectron spectroscopy and scanning electron microscopy. Surface damage was intentionally induced by abrading the (100) diamond face with diamond paste. Removal of the damage was achieved by a sequence of ion implantation, graphitization, electrochemical etching and oxygen/argon plasma etching. Prior to characterization performed between steps in the sequence, the surface was hydrogenated by exposure to a hydrogen plasma in attempts to create a negative electron affinity surface condition. Upon removal of the surface damage, the secondary electron yield from the negative electron affinity surface was enhanced by a factor of ˜20 over that from the damaged negative electron affinity surface.

Download Full-text