Facilitated wavelength selection and model development for rapid determination of the purity of organic spelt (Triticum spelta L.) flour using spectral imaging

Talanta ◽  
2016 ◽  
Vol 155 ◽  
pp. 347-357 ◽  
Author(s):  
Wen-Hao Su ◽  
Da-Wen Sun
2012 ◽  
Vol 27 ◽  
pp. 93-105 ◽  
Author(s):  
Qianxuan Zhang ◽  
Qingbo Li ◽  
Guangjun Zhang

Water content in plants is one of the most common biochemical parameters limiting efficiency of photosynthesis and crop productivity. Therefore, it has very important meaning to predict the water content rapidly and nondestructively. The objective of this study was to investigate the feasibility of detecting the water content in the leaf using the diffuse reflectance spectra limited in the VIS/NIR region (400–1100 nm), which could be used to determine other biochemical parameters such as chlorophyll and nitrogen content. The experiment with leaves in different water stress was conducted. The statistical test result indicated that the determination of water content in leaf could be successfully performed by VIS/NIR spectroscopy combined with chemometrics method. The performances of different pretreatment methods were compared. The model with best performance was obtained from the first derivative spectra. In order to make the calibration model more parsimonious and stable, a hybrid wavelength selection method was proposed to extract the efficient feature wavelength. Under the optimal condition, an RMSEP of 0.73% with 25 variables was obtained for water content prediction using extern validation. The conclusions presented could lead to the development of portable instrument for synchronous detecting water content and other biochemical parameters rapidly and nondestructively.


Author(s):  
T. Y. Tan ◽  
W. K. Tice

In studying ion implanted semiconductors and fast neutron irradiated metals, the need for characterizing small dislocation loops having diameters of a few hundred angstrom units usually arises. The weak beam imaging method is a powerful technique for analyzing these loops. Because of the large reduction in stacking fault (SF) fringe spacing at large sg, this method allows for a rapid determination of whether the loop is faulted, and, hence, whether it is a perfect or a Frank partial loop. This method was first used by Bicknell to image small faulted loops in boron implanted silicon. He explained the fringe spacing by kinematical theory, i.e., ≃l/(Sg) in the fault fringe in depth oscillation. The fault image contrast formation mechanism is, however, really more complicated.


2017 ◽  
Vol 45 (2) ◽  
pp. 455-464
Author(s):  
T.T. Xue ◽  
J. Liu ◽  
Y.B. Shen ◽  
G.Q. Liu

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