Monitoring explosive crystallization phenomenon of amorphous silicon thin films during short pulse duration XeF excimer laser annealing using real-time optical diagnostic measurements
2006 ◽
Vol 326-328
◽
pp. 195-198
Keyword(s):
Crystal Growth of Silicon Thin Films on Glass by Excimer Laser Annealing: A Molecular-Dynamics Study
2006 ◽
Vol 45
(5B)
◽
pp. 4344-4346
◽
Keyword(s):
2011 ◽
Vol 49
(7)
◽
pp. 804-810
◽
Keyword(s):
2002 ◽
Vol 46
(8)
◽
pp. 1085-1090
◽