X-ray nanodiffraction in forward scattering and Bragg geometry of a single isolated Ag–Au nanowire

2016 ◽  
Vol 617 ◽  
pp. 9-13
Author(s):  
S. Fernández ◽  
M.I. Richard ◽  
D. Floettoto ◽  
G. Richter ◽  
O. Mandula ◽  
...  
Keyword(s):  
Forward Scattering ◽  
X Ray ◽  
Au Nanowire ◽  
Bragg Geometry

Investigation of the phase shift in X-ray forward diffraction using an X-ray interferometer

1998 ◽  
Vol 5 (3) ◽  
pp. 967-968 ◽  
Author(s):  
Keiichi Hirano ◽  
Atsushi Momose
Keyword(s):  
Phase Shift ◽  
Silicon Crystal ◽  
Dynamical Theory ◽  
Perfect Crystal ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Bragg Geometry

The phase shift of forward-diffracted X-rays by a perfect crystal is discussed on the basis of the dynamical theory of X-ray diffraction. By means of a triple Laue-case X-ray interferometer, the phase shift of forward-diffracted X-rays by a silicon crystal in the Bragg geometry was investigated.

scholarly journals In Situ Coherent X-ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification

2018 ◽  
Vol 2 (4) ◽  
pp. 24 ◽  
Author(s):  
Anton Davydok ◽  
Thomas Cornelius ◽  
Zhe Ren ◽  
Cedric Leclere ◽  
Gilbert Chahine ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Reciprocal Space ◽  
X Ray Diffraction ◽  
Complex Deformation ◽  
X Ray ◽  
Three Point Bending ◽  
Atomic Force ◽  
Au Nanowire ◽  
Before And After

The three-point bending behavior of a single Au nanowire deformed by an atomic force microscope was monitored by coherent X-ray diffraction using a sub-micrometer sized hard X-ray beam. Three-dimensional reciprocal-space maps were recorded before and after deformation by standard rocking curves and were measured by scanning the energy of the incident X-ray beam during deformation at different loading stages. The mechanical behavior of the nanowire was visualized in reciprocal space and a complex deformation mechanism is described. In addition to the expected bending of the nanowire, torsion was detected. Bending and torsion angles were quantified from the high-resolution diffraction data.

Short‐range order in submonolayer Ni on GaAs(110) by x‐ray photoelectron forward scattering

1988 ◽  
Vol 6 (3) ◽  
pp. 1495-1498 ◽  
Author(s):  
W. F. Egelhoff ◽  
D. A. Steigerwald ◽  
J. E. Rowe ◽  
T. D. Bussing
Keyword(s):  
Short Range ◽  
Short Range Order ◽  
Forward Scattering ◽  
Range Order ◽  
X Ray

X-Ray Dynamic Diffraction on Multiblock Interferometers in Laue and Bragg Geometry

1991 ◽  
Vol 125 (1) ◽  
pp. 57-66 ◽  
Author(s):  
V. V. Aristov ◽  
S. M. Kuznetsov ◽  
A. V. Kouyumchyan ◽  
A. A. Snigirev
Keyword(s):  
X Ray ◽  
Dynamic Diffraction ◽  
Bragg Geometry

Structural Characterization of Thin Metal Overlayers by X-ray Photoelectron and Auger-Electron Forward Scattering

1986 ◽  
Vol 83 ◽  
Author(s):  
W. F. Egelhoff
Keyword(s):  
Ultrathin Films ◽  
Surface Segregation ◽  
Metal Films ◽  
Epitaxial Films ◽  
Forward Scattering ◽  
Crystalline Lattice ◽  
Auger Electrons ◽  
X Ray ◽  
Metal Overlayers

ABSTRACTForward scattering of XPS and Auger electrons by atoms in a crystalline lattice produce beams of enhanced intensity radiating out from the surface at angles corresponding to the internuclear axes present in the top few atomic layers. This effect has been applied to analyze the mechanism of surface segregation in ultrathin metal films, to analyze the interdiffusion at the interfaces of ultrathin films, and to assess the effects of substrate contamination on the growth of epitaxial films. The systems studied in this work are Cu, Ni, and Co on Ni(100), however the purpose of this work is not to investigate these particular systems but to use them to illustrate the capabilities of forward scattering.

X-ray reflection properties of elastically bent perfect crystals in Bragg geometry

1993 ◽  
Vol 26 (3) ◽  
pp. 405-412 ◽  
Author(s):  
I. Uschmann ◽  
E. Förster ◽  
K. Gäbel ◽  
G. Hölzer ◽  
M. Ensslen
Keyword(s):  
X Ray ◽  
Bragg Geometry

Controlling Aspect Ratio of Copper Group Nanowire Arrays by Electrochemical Deposition in the Nanopores of AAO

2011 ◽  
Vol 335-336 ◽  
pp. 429-432 ◽  
Author(s):  
Xiu Yu Sun ◽  
Fa Qiang Xu
Keyword(s):  
Aspect Ratio ◽  
Nanowire Arrays ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
X Ray ◽  
Anodic Aluminum ◽  
Au Nanowire ◽  
The Face ◽  
Face Centered ◽  
Xrd Patterns

Highly ordered Cu, Ag and Au nanowire arrays with high aspect ratio and highly dense self-supporting nanowire patterns of copper group were successfully prepared using cyclic voltammetry with the assistance of anodic aluminum oxide (AAO) template. The X-ray diffraction (XRD) patterns of the metal nanowries were indexed to the face-centered cubic structure. The field emission scanning electron microscope (FE-SEM) results demonstrated that the length of nanowire could be controlled by changing the electrodepositon conditions. The aspect ratio of nanowire arrays can be tuned.

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