In Situ Coherent X-ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification

The three-point bending behavior of a single Au nanowire deformed by an atomic force microscope was monitored by coherent X-ray diffraction using a sub-micrometer sized hard X-ray beam. Three-dimensional reciprocal-space maps were recorded before and after deformation by standard rocking curves and were measured by scanning the energy of the incident X-ray beam during deformation at different loading stages. The mechanical behavior of the nanowire was visualized in reciprocal space and a complex deformation mechanism is described. In addition to the expected bending of the nanowire, torsion was detected. Bending and torsion angles were quantified from the high-resolution diffraction data.

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In-Situ Coherent X-Ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification

10.20944/preprints201809.0359.v1 ◽

2018 ◽

Author(s):

Anton Davydok ◽

Thomas W. Cornelius ◽

Zhe Ren ◽

Cedric Leclere ◽

Gilbert Chahine ◽

...

Keyword(s):

Three Dimensional ◽

Reciprocal Space ◽

X Ray Diffraction ◽

Complex Deformation ◽

X Ray ◽

Three Point Bending ◽

Atomic Force ◽

Au Nanowire ◽

Before And After

The three-point bending behavior of a single Au nanowire deformed with an atomic force microscope was monitored by coherent X-ray diffraction using a sub-micrometer sized hard X-ray beam. While three-dimensional reciprocal-space maps were recorded before and after deformation by standard rocking curves, they were measured by scanning the energy of the incident X-ray beam during deformation at different loading stages. The mechanical behavior of the nanowire is visualized in reciprocal space and a complex deformation mechanism is described. In addition to the expected bending of the nanowire, torsion is detected. Bending and torsion angles are quantified from the high resolution diffraction data.

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Preparation and Research on the Lateral Elastic Modulus of the MnO2 Nanowires

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.662.84 ◽

2013 ◽

Vol 662 ◽

pp. 84-87

Author(s):

Yong Jiang ◽

Jian Cheng Deng ◽

Yan Huai Ding ◽

Jiu Ren Yin ◽

Ping Zhang

Keyword(s):

Elastic Modulus ◽

Crystal Form ◽

Bending Test ◽

X Ray Diffraction ◽

Nanowire Diameter ◽

X Ray ◽

Three Point Bending ◽

Force Microscopy ◽

Atomic Force ◽

Mno2 Nanowires

MnO2 nanowires with large aspect ratio were successfully synthesized via a hydrothermal method. In this method, Mn(NO3)2 was as a source of manganese and NH4NO3 as an oxidant. The structure and morphology of the MnO2 nanowires were characterized by X ray diffraction (XRD) and scanning electron microscope (SEM). Their lateral elastic modulus was characterized via a nanoscale three-point bending test by atomic force microscopy (AFM) equipped with picoforce. The results indicate that the crystal form of MnO2 was β-MnO2. The elastic modulus of the nanowires decreased with the increase in nanowire diameter. This elastic modulus was in the range of 33.36-77.84GPa as the diameter ranged from 240 to 185nm.

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Three dimensional V2O5/NaV6O15 hierarchical heterostructures: Controlled synthesis and synergistic effect investigated by in situ X-ray diffraction

Nano Energy ◽

10.1016/j.nanoen.2016.06.057 ◽

2016 ◽

Vol 27 ◽

pp. 147-156 ◽

Cited By ~ 38

Author(s):

Chaojiang Niu ◽

Xiong Liu ◽

Jiashen Meng ◽

Lin Xu ◽

Mengyu Yan ◽

...

Keyword(s):

Synergistic Effect ◽

Three Dimensional ◽

Controlled Synthesis ◽

X Ray Diffraction ◽

X Ray

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Characterization of X-ray irradiated graphene oxide coatings using X-ray diffraction, X-ray photoelectron spectroscopy, and atomic force microscopy

Powder Diffraction ◽

10.1017/s0885715613000109 ◽

2013 ◽

Vol 28 (2) ◽

pp. 68-71 ◽

Cited By ~ 40

Author(s):

Thomas N. Blanton ◽

Debasis Majumdar

Keyword(s):

Atomic Force Microscopy ◽

Graphene Oxide ◽

Photoelectron Spectroscopy ◽

High Energy ◽

X Ray Diffraction ◽

Carbon Phase ◽

X Ray ◽

Force Microscopy ◽

Atomic Force ◽

Before And After

In an effort to study an alternative approach to make graphene from graphene oxide (GO), exposure of GO to high-energy X-ray radiation has been performed. X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM) have been used to characterize GO before and after irradiation. Results indicate that GO exposed to high-energy radiation is converted to an amorphous carbon phase that is conductive.

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X-Ray Single Crystal Structural Analysis of Magnetically Oriented Microcrystals

Acta Crystallographica Section A Foundations and Advances ◽

10.1107/s2053273314088615 ◽

2014 ◽

Vol 70 (a1) ◽

pp. C1138-C1138

Author(s):

Chiaki Tsuboi ◽

Kazuki Aburaya ◽

Shingo Higuchi ◽

Fumiko Kimura ◽

Masataka Maeyama ◽

...

Keyword(s):

Molecular Structure ◽

Crystal Structure ◽

Single Crystal ◽

Three Dimensional ◽

Diffraction Measurement ◽

X Ray Diffraction ◽

Data Set ◽

Uv Curable ◽

X Ray

We have developed magnetically oriented microcrystal array (MOMA) technique that enables single crystal X-ray diffraction analyses from microcrystalline powder. In this method, microcrystals suspended in a UV-curable monomer matrix are there-dimensionally aligned by special rotating magnetic field, followed by consolidation of the matrix by photopolymerization. From thus achieved MOMAs, we have been succeeded in crystal structure analysis for some substances [1, 2]. Though MOMA method is an effective technique, it has some problems as follows: in a MOMA, the alignment is deteriorated during the consolidation process. In addition, the sample microcrystals cannot be recovered from a MOMA. To overcome these problems, we performed an in-situ X-ray diffraction measurement using a three-dimensional magnetically oriented microcrystal suspension (3D MOMS) of L-alanine. An experimental setting of the in-situ X-ray measurement of MOMS is schematically shown in the figure. L-alanine microcrystal suspension was poured into a glass capillary and placed on the rotating unit equipped with a pair of neodymium magnets. Rotating X-ray chopper with 10°-slits was placed between the collimator and the suspension. By using this chopper, it was possible to expose the X-ray only when the rotating MOMS makes a specific direction with respect to the impinging X-ray. This has the same effect as the omega oscillation in conventional single crystal measurement. A total of 22 XRD images of 10° increments from 0° to 220° were obtained. The data set was processed by using conventional software to obtain three-dimensional molecular structure of L-alanine. The structure is in good agreement with that reported for the single crystal. R1 and wR2 were 6.53 and 17.4 %, respectively. RMSD value between the determined molecular structure and the reported one was 0.0045 Å. From this result, we conclude that this method can be effective and practical to be used widely for crystal structure analyses.

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Large Area Supersonic Jet Epitaxy of AlN, GaN, and SiC on Silicon

MRS Proceedings ◽

10.1557/proc-449-277 ◽

1996 ◽

Vol 449 ◽

Author(s):

L.J. Lauhon ◽

S. A. Ustin ◽

W. Ho

Keyword(s):

Supersonic Jet ◽

X Ray Diffraction ◽

Large Area ◽

Free Jets ◽

X Ray ◽

Force Microscopy ◽

Atomic Force ◽

Supersonic Jet Epitaxy ◽

Carrier Gases

ABSTRACTAlN, GaN, and SiC thin films were grown on 100 mm diameter Si(111) and Si(100) substrates using Supersonic Jet Epitaxy (SJE). Precursor gases were seeded in lighter mass carrier gases and free jets were formed using novel slit-jet apertures. The jet design, combined with substrate rotation, allowed for a uniform flux distribution over a large area of a 100 mm wafer at growth pressures of 1–20 mTorr. Triethylaluminum, triethylgailium, and ammonia were used for nitride growth, while disilane, acetylene, and methylsilane were used for SiC growth. The films were characterized by in situ optical reflectivity, x-ray diffraction (XRD), atomic force microscopy (AFM), and spectroscopic ellipsometry (SE).

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