Fabrication of ball-shaped atomic force microscope tips by ion-beam-induced deposition of platinum on multiwall carbon nanotubes

Preliminary results of Raman scattering measurements of multiwall carbon nanotubes (MWCNT) are presented. The nanotubes have been carefully dissolved, separated and then characterized by AFM. The micro-Raman spectra are taken with 514,5nm wavelength excitations in the range 4K - 400K. Basically the spectra are quite similar to the well known single wall carbon nanotube spectra, but the low frequency band is absent. The major Raman bands, observed in single wall nanotubes are found in the spectra. In particular the disorder effects are visible due to the pronounced D band at ~1350 cm-1. Metallic and semiconducting type of conductivity is distinguished through analysis of the G (LO) mode at ~1600 cm-1. A new feature in these spectra exists at ~843 cm-1. Low energy radial breathing mode absence has been explained.

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Focused Ion Beam Fabrication of Individual Carbon Nanotube Devices

MRS Proceedings ◽

10.1557/proc-1020-gg08-01 ◽

2007 ◽

Vol 1020 ◽

Author(s):

Lee Chow ◽

Guangyu Chai

Keyword(s):

Carbon Nanotubes ◽

Carbon Nanotube ◽

Atomic Force Microscope ◽

Focused Ion Beam ◽

Ion Beam ◽

Side Wall ◽

Multiwall Carbon Nanotube ◽

Atomic Force ◽

Electron Field ◽

Carbon Nanotube Devices

AbstractFocused ion beam (FIB) techniques have found many applications in nanoscience and nanotechnology applications in recent years. However, not much work has been done using FIB to fabricate carbon nanotube devices. This is mainly due to the fact that carbon nanotubes are very fragile and energetic ion beam from FIB can easily damage the carbon nanotubes. Here we report the fabrication of carbon nanotube (CNT) devices, including electron field emitters, atomic force microscope tips, and nano-pores for biomedical applications. This is made possible by a unique, coaxial configuration consisting of a CNT embedded in a graphitic carbon coating, which was developed by us for FIB processing of carbon nanotubes. The CNT-based atomic force microscope tip has been demonstrated. The electron field emission from the tip and the side wall of CNT will be discussed. We will also report the fabrication of a multiwall carbon nanotube nanopore for future applications.

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Measurement of contact resistance of multiwall carbon nanotubes by electrical contact using a focused ion beam

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2011.01.058 ◽

2012 ◽

Vol 272 ◽

pp. 169-172 ◽

Cited By ~ 21

Author(s):

Libao An ◽

Craig R. Friedrich

Keyword(s):

Carbon Nanotubes ◽

Contact Resistance ◽

Focused Ion Beam ◽

Ion Beam ◽

Electrical Contact ◽

Multiwall Carbon Nanotubes ◽

Multiwall Carbon

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MORPHOLOGY CONTROL OF CARBON NANOTUBES THROUGH FOCUSED ION BEAMS

NANO ◽

10.1142/s1793292008001398 ◽

2008 ◽

Vol 03 (06) ◽

pp. 449-454 ◽

Cited By ~ 5

Author(s):

M. LOYA ◽

J. E. PARK ◽

L. H. CHEN ◽

K. S. BRAMMER ◽

P. R. BANDARU ◽

...

Keyword(s):

Carbon Nanotubes ◽

Focused Ion Beam ◽

Ion Beam ◽

Multiwall Carbon Nanotubes ◽

Chemical Properties ◽

Defect Engineering ◽

Ion Milling ◽

Induced Changes ◽

Physical And Chemical ◽

Multiwall Carbon

This research demonstrates the capability of controlled, focused ion beam (FIB)–assisted tailoring of morphologies in both multiwall carbon nanotubes (CNTs) and Y junction nonlinear CNT systems through defect engineering. We have shown that a 30 keV FIB Ga + ion beam at low ion milling currents of 1 pA can be used to partially reduce the CNT diameter, to provide electrical conduction bottleneck morphologies for linear CNTs, and to introduce both additive and subractive defects at Y junction locations of Y-CNT samples. Our aim is for this work to provide motivation for additional research to determine the effects of ion-beam-induced changes in modulating the physical and chemical properties of nanotubes.

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Electrostatic displacement of multiwalled carbon nanotubes by scanning a voltage-applied tip of an atomic force microscope

The European Physical Journal Applied Physics ◽

10.1051/epjap:2004199 ◽

2004 ◽

Vol 28 (3) ◽

pp. 301-304 ◽

Cited By ~ 3

Author(s):

D.-H. Kim ◽

J.-Y. Koo ◽

J.-J. Kim

Keyword(s):

Carbon Nanotubes ◽

Atomic Force Microscope ◽

Multiwalled Carbon Nanotubes ◽

Multiwalled Carbon ◽

Atomic Force

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Boehmite Nanofibers as a Dispersant for Nanotubes in an Aqueous Sol

10.26434/chemrxiv.6652955.v1 ◽

2018 ◽

Author(s):

Gen Hayase

Keyword(s):

Carbon Nanotubes ◽

Aspect Ratio ◽

Aqueous Solutions ◽

High Aspect Ratio ◽

Multiwall Carbon Nanotubes ◽

Multiwall Carbon ◽

Nanotube Films

By exploiting the dispersibility and rigidity of boehmite nanofibers (BNFs) with a high aspect ratio of 4 nm in diameter and several micrometers in length, multiwall-carbon nanotubes (MWCNTs) were successfully dispersed in aqueous solutions. In these sols, the MWCNTs were dispersed at a ratio of about 5–8% relative to BNFs. Self-standing BNF–nanotube films were also obtained by filtering these dispersions and showing their functionality. These films can be expected to be applied to sensing materials.

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