Performance optimization of indirectly heated cathode based electron gun by controlling high voltage surface flashover and beam positioning at target plane

Vacuum ◽  
2021 ◽  
pp. 110759
Author(s):  
V. Goel ◽  
A. Roy ◽  
N. Maiti
Keyword(s):  
High Voltage ◽  
Performance Optimization ◽  
Electron Gun ◽  
Surface Flashover ◽  
Heated Cathode

100 KV Scanning Microscope

1972 ◽  
Vol 30 ◽  
pp. 472-473 ◽  
Author(s):  
A. V. Crewe ◽  
M. W. Retsky
Keyword(s):  
High Voltage ◽  
Voltage Divider ◽  
Electron Gun ◽  
Objective Lens ◽  
Parallel Beam ◽  
Emission Point ◽  
Error Amplifier ◽  
External Reference ◽  
Scanning Transmission ◽  
Transmission Microscope

A 100 kv scanning transmission microscope has been built. Briefly, the design is as follows: The electron gun consists of a field emission point and a 3 cm Butler gun. The beam has a crossover outside the gun and is collimated by a condenser lens.The parallel beam passes through a defining aperture and is focused by the objective lens onto the specimen. The elastic electrons are detected by two annular detectors, each subtending a different angle, and the unscattered and inelastic electrons are collected by a third detector. The spectrometer that will separate the inelastic and unscattered electrons has not yet been built.The lens current supplies are stable to within one part per million per hour and have been described elsewhere.The high voltage is also stable to 1 ppm/hr. It consists of the raw supply from a 100 kv Spellman power supply controlled by an external reference voltage, high voltage divider, and error amplifier.

A New High Intensity Grid Cap for RCA-EMU-3 Electron Microscopes

1968 ◽  
Vol 26 ◽  
pp. 316-317
Author(s):  
George Christov ◽  
Bolivar J. Lloyd
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
High Voltage ◽  
High Intensity ◽  
Electron Gun ◽  
Tungsten Filament ◽  
Fluorescent Screen ◽  
Electron Microscopes ◽  
Pass Through ◽  
Ground Potential

A new high intensity grid cap has been designed for the RCA-EMU-3 electron microscope. Various parameters of the new grid cap were investigated to determine its characteristics. The increase in illumination produced provides ease of focusing on the fluorescent screen at magnifications from 1500 to 50,000 times using an accelerating voltage of 50 KV.The EMU-3 type electron gun assembly consists of a V-shaped tungsten filament for a cathode with a thin metal threaded cathode shield and an anode with a central aperture to permit the beam to course the length of the column. The cathode shield is negatively biased at a potential of several hundred volts with respect to the filament. The electron beam is formed by electrons emitted from the tip of the filament which pass through an aperture of 0.1 inch diameter in the cap and then it is accelerated by the negative high voltage through a 0.625 inch diameter aperture in the anode which is at ground potential.

High voltage threshold for stable operation in a dc electron gun

2016 ◽  
Vol 109 (1) ◽  
pp. 014103 ◽  
Author(s):  
Masahiro Yamamoto ◽  
Nobuyuki Nishimori
Keyword(s):  
High Voltage ◽  
Electron Gun ◽  
Stable Operation ◽  
Voltage Threshold

High-Voltage Electron Microscopy

1969 ◽  
Vol 2 (2) ◽  
pp. 95-133 ◽  
Author(s):  
V. E. Cosslett
Keyword(s):  
Electron Microscopy ◽  
High Voltage ◽  
Image Intensifier ◽  
Chromatic Aberration ◽  
Biological Tissues ◽  
Electron Gun ◽  
Resolving Power ◽  
Small Aperture ◽  
High Voltage Electron Microscopy ◽  
Voltage Electron

SummaryThe main advantage of high voltage in electron microscopy is greater penetration. When using an aperture of optimum size the thickness of specimen that can be imaged increases almost linearly with applied voltage in the case of light elements, both when the criterion is image intensity and when it is resolution. For heavy elements the increase is less rapid. With a small aperture the increase in observable thickness is still less rapid, and ‘saturates’ towards I MV. For a specimen of given thickness, image definition increases nearly linearly with voltage owing to the decrease in chromatic aberration. Although ultimate resolving power improves with voltage, the gain is slight and is offset by a fall in contrast. The optimum voltage for very high resolution is probably between 200 and 300 kV. Radiation damage arising from ionization decreases with rising voltage, making easier the examination of sensitive materials such as polymers. On the other hand, ejection of atoms by head-on collision increases rapidly above a threshold voltage, causing observable defects in metals.In construction, a high-voltage microscope differs from the normal type only in size and in having an accelerator instead of a simple electron gun. In operation it differs little, apart from precautions to avoid fiashover in the accelerator. A decrease in response of viewing screens and photographic emulsions is more than compensated by higher brightness of the electron gun. The chief applications so far of the high-voltage microscope have been for studying thick films of metals, magnetic materials, ceramics and polymers. Improved preparation techniques should make it possible to study sections of biological tissues up to 5 μ thick. The observation of micro-organisms and other specimens in the wet state can be carried out in double-walled cells, but only at poor resolution. Still higher voltages, up to 3 or MV coupled with the use of an energy analyser or an image intensifier, should improve further the microscopy of such thick specimens.

Development of Field-Emission Gun for High-Voltage Electron Microscope

1990 ◽  
Vol 48 (2) ◽  
pp. 94-95
Author(s):  
T. Tomita ◽  
S. Katoh ◽  
H. Kitajima ◽  
Y. Kokubo ◽  
Y. Ishida
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Field Emission ◽  
High Voltage ◽  
High Vacuum ◽  
Electron Gun ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
High Voltage Electron ◽  
Acceleration Tube

It is well known that the combination of a field emission gun (FEG) and a conventional transmission electron microscope (CTEM) is extremely important for nanometer area analysis in analytical electron microscopy. However, the smaller illumination angle and reduced energy spread of FEG than those of a conventional electron gun (W hair pin filament or LaB6) give a slowly damping envelop function in phase contrast transfer function (PCTF). Thus the FEG ensures application not only to analytical microscopy but also to high resolution electron microscopy to improve the information limit.In a high voltage electron microscope (above 200 kV), high-speed vacuum pumps have to be provided below the acceleration tube to get an ultra high vacuum (UHV) around the field emission tip located at the top of the acceleration tube. However, this method is not always the best way to provide UHV because of the poor vacuum conductance caused by the electrodes inside the acceleration tube.

Investigation of the throughput of the dosing device gas leak for gas discharge electron gun

2012 ◽  
Vol 16 (5) ◽  
pp. 25-30
Author(s):  
I.V. Mel'nik ◽  
S.B. Tugaj
Keyword(s):  
Experimental Data ◽  
Mathematical Model ◽  
Glow Discharge ◽  
High Voltage ◽  
Beam Current ◽  
Electron Gun ◽  
Technological Equipment ◽  
Gas Leak ◽  
Electron Guns ◽  
Empirical Coefficients

Model of capacity of valve with conic rod, which is used for control of beam current of high voltage glow discharge electron guns, is considered. Because of complicity of valve details geometry, mathematical model of dozed item is improved by suitable choosing of empirical coefficients and its approximation. On the base of modeling and experimental data analyzing of dependence of valve exploitation characteristics from geometry parameters of dozed item is provided. Obtained results can be used for simulation of stability of operation of high voltage glow discharge electron guns inconsisting of technological equipment

Sign in / Sign up

Export Citation Format

Share Document