Surface Topography Characterization Using an Atomic Force Microscope Mounted on a Coordinate Measuring Machine

AbstractThe article presents a redesigned sensor holder for an atomic force microscope (AFM) with an adjustable probe direction, which is integrated into a nano measuring machine (NMM-1). The AFM, consisting of a commercial piezoresistive cantilever operated in closed-loop intermitted contact-mode, is based on two rotational axes, which enable the adjustment of the probe direction to cover a complete hemisphere. The axes greatly enlarge the metrology frame of the measuring system by materials with a comparatively high coefficient of thermal expansion. The AFM is therefore operated within a thermostating housing with a long-term temperature stability of 17 mK. The sensor holder, connecting the rotational axes and the cantilever, inserted one adhesive bond, a soldered connection and a geometrically undefined clamping into the metrology circle, which might also be a source of measurement error. It has therefore been redesigned to a clamped senor holder, which is presented, evaluated and compared to the previous glued sensor holder within this paper. As will be shown, there are no significant differences between the two sensor holders. This leads to the conclusion, that the three aforementioned connections do not deteriorate the measurement precision, significantly. As only a minor portion of the positioning range of the piezoelectric actuator is needed to stimulate the cantilever near its resonance frequency, a high-speed closed-loop control that keeps the cantilever within its operating range using this piezoelectric actuator further on as actuator was implemented and is presented within this article.

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Atomic force microscope with an adjustable probe direction and piezoresistive cantilevers operated in tapping-mode / Im Tapping-Modus betriebenes Rasterkraftmikroskop mit einstellbarer Antastrichtung und piezoresistiven Cantilevern

tm - Technisches Messen ◽

10.1515/teme-2019-0035 ◽

2019 ◽

Vol 86 (s1) ◽

pp. 12-16

Author(s):

Janik Schaude ◽

Julius Albrecht ◽

Ute Klöpzig ◽

Andreas C. Gröschl ◽

Tino Hausotte

Keyword(s):

Atomic Force Microscope ◽

Metrological Traceability ◽

Step Height ◽

Tapping Mode ◽

Atomic Force ◽

In Situ Calibration ◽

Measuring Machine ◽

Piezoresistive Cantilevers

AbstractThis article presents a new tilting atomic force microscope (AFM) with an adjustable probe direction and piezoresistive cantilever operated in tapping-mode. The AFM is based on two rotational axes, which enable the adjustment of the probe direction to cover a complete hemisphere. The whole setup is integrated into a nano measuring machine (NMM-1) and the metrological traceability of the piezoresistive cantilever is warranted by in situ calibration on the NMM-1. To demonstrate the capabilities of the tilting AFM, measurements were conducted on a step height standard.

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Quantification of Axonal Outgrowth on a Surface with Asymmetric Topography

MRS Proceedings ◽

10.1557/opl.2014.266 ◽

2014 ◽

Vol 1621 ◽

pp. 243-248

Author(s):

Elise Spedden ◽

Cristian Staii

Keyword(s):

Atomic Force Microscope ◽

Surface Topography ◽

Nerve Regeneration ◽

Growth Cone ◽

Effective Potential ◽

Axonal Outgrowth ◽

Directional Bias ◽

Atomic Force ◽

Neuronal Growth Cone ◽

Neuron Growth

ABSTRACTTopographical features are known to influence the axonal outgrowth of neurons. Understanding what kinds of topographical features are most effective at growth cone guidance and how outgrowth responds to these structures is of great importance to the study of nerve regeneration. To this end we analyze axonal outgrowth on tilted nanorod substrates which have been shown to impart directional bias to neuron growth. We utilize the Atomic Force Microscope to characterize the surface features present on these substrates and how such features are influencing the axonal outgrowth. Additionally, using a model which considers the neuronal growth cone as an object influenced by an effective potential we determine an effective force imparted on the growth cone by the surface topography.

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Use of the Atomic Force Microscope To Determine the Effect of Substratum Surface Topography on Bacterial Adhesion

Langmuir ◽

10.1021/la011142p ◽

2002 ◽

Vol 18 (6) ◽

pp. 2343-2346 ◽

Cited By ~ 103

Author(s):

R. D. Boyd ◽

J. Verran ◽

M. V. Jones ◽

M. Bhakoo

Keyword(s):

Atomic Force Microscope ◽

Surface Topography ◽

Bacterial Adhesion ◽

Atomic Force

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Contributions of lunate cells and wax crystals to the surface anisotropy of Nepenthes slippery zone

Royal Society Open Science ◽

10.1098/rsos.180766 ◽

2018 ◽

Vol 5 (9) ◽

pp. 180766 ◽

Cited By ~ 1

Author(s):

Lixin Wang ◽

Dashuai Tao ◽

Shiyun Dong ◽

Shanshan Li ◽

Yu Tian

Keyword(s):

Atomic Force Microscope ◽

Surface Topography ◽

Friction Force ◽

Body Length ◽

Structural Features ◽

Large Displacements ◽

Surface Anisotropy ◽

Atomic Force ◽

Microstructure Examination ◽

Wax Crystals

Nepenthes slippery zone presents surface anisotropy depending on its specialized structures. Herein, via macro–micro–nano scaled experiments, we analysed the contributions of lunate cells and wax crystals to this anisotropy. Macroscopic climbing of insects showed large displacements (triple body length within 3 s) and high velocities (6.16–20.47 mm s −1 ) in the inverted-fixed (towards digestive zone) slippery zone, but failed to climb forward in the normal-fixed (towards peristome) one. Friction force of insect claws sliding across inverted-fixed lunate cells was about 2.4 times of that sliding across the normal-fixed ones, whereas showed unobvious differences (1.06–1.11 times) between the inverted- and normal-fixed wax crystals. Innovative results from atomic force microscope scanning and microstructure examination demonstrated the upper layer of wax crystals causes the cantilever tip to generate rather small differences in friction data (1.92–2.72%), and the beneath layer provides slightly higher differences (4.96–7.91%). The study confirms the anisotropic configuration of lunate cells produces most of the anisotropy, whereas both surface topography and structural features of the wax crystals generate a slight contribution. These results are helpful for understanding the surface anisotropy of Nepenthes slippery zone, and guide the design of bioinspired surface with anisotropic properties.

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The Effect of an Electrostatic Force on Imaging a Surface Topography by Noncontact Atomic Force Microscope

Japanese Journal of Applied Physics ◽

10.1143/jjap.40.l986 ◽

2001 ◽

Vol 40 (Part 2, No. 9A/B) ◽

pp. L986-L988 ◽

Cited By ~ 11

Author(s):

Tadashi Shiota ◽

Keiji Nakayama

Keyword(s):

Atomic Force Microscope ◽

Surface Topography ◽

Electrostatic Force ◽

Atomic Force

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Processing and Analysis of Long-Range Scans with an Atomic Force Microscope (AFM) in Combination with Nanopositioning and Nanomeasuring Technology for Defect Detection and Quality Control

Sensors ◽

10.3390/s21175862 ◽

2021 ◽

Vol 21 (17) ◽

pp. 5862

Author(s):

Ingo Ortlepp ◽

Jaqueline Stauffenberg ◽

Eberhard Manske

Keyword(s):

Quality Control ◽

High Resolution ◽

Atomic Force Microscope ◽

Range Of Motion ◽

Defect Detection ◽

Large Range ◽

The Other ◽

Atomic Force ◽

Measuring Machine ◽

The One

This paper deals with a planar nanopositioning and -measuring machine, the so-called nanofabrication machine (NFM-100), in combination with a mounted atomic force microscope (AFM). This planar machine has a circular moving range of 100 mm. Due to the possibility of detecting structures in the nanometre range with an atomic force microscope and the large range of motion of the NFM-100, structures can be analysed with high resolution and precision over large areas by combining the two systems, which was not possible before. On the basis of a grating sample, line scans over lengths in the millimetre range are demonstrated on the one hand; on the other hand, the accuracy as well as various evaluation methods are discussed and analysed.

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Atomic Force and Ultrasonic Force Microscopic Surface Characterization of Laser Treated Head Sliders

10.1115/imece2001/nde-25806 ◽

2001 ◽

Author(s):

Carl Druffner ◽

Edward J. Schumaker ◽

Liming Shen ◽

Shamachary Sathish ◽

Ganesh N. Raikar ◽

...

Keyword(s):

Atomic Force Microscope ◽

Surface Topography ◽

Surface Characterization ◽

Atomic Force ◽

Hard Disc Drive ◽

Microscope Imaging ◽

Disc Drive ◽

Microscopic Surface

Abstract The surface of laser treated hard disc drive head sliders has been imaged using the Atomic Force Microscope and Ultrasonic Force Microscope. The contrast of the surface topography image from the Atomic Force Microscope is compared with the elasticity image generated by the Ultrasonic Force Microscope on the same sample region. Images of microcracking in the laser treated regions are presented. The possible reasons for the development of microcracking and the enhanced contrast of the Ultrasonic Force Microscope imaging of these microcracks are discussed.

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