Atomic Force and Ultrasonic Force Microscopic Surface Characterization of Laser Treated Head Sliders

Author(s):  
Carl Druffner ◽  
Edward J. Schumaker ◽  
Liming Shen ◽  
Shamachary Sathish ◽  
Ganesh N. Raikar ◽  
...  

Abstract The surface of laser treated hard disc drive head sliders has been imaged using the Atomic Force Microscope and Ultrasonic Force Microscope. The contrast of the surface topography image from the Atomic Force Microscope is compared with the elasticity image generated by the Ultrasonic Force Microscope on the same sample region. Images of microcracking in the laser treated regions are presented. The possible reasons for the development of microcracking and the enhanced contrast of the Ultrasonic Force Microscope imaging of these microcracks are discussed.

Author(s):  
Kathleen M. Marr ◽  
Mary K. Lyon

Photosystem II (PSII) is different from all other reaction centers in that it splits water to evolve oxygen and hydrogen ions. This unique ability to evolve oxygen is partly due to three oxygen evolving polypeptides (OEPs) associated with the PSII complex. Freeze etching on grana derived insideout membranes revealed that the OEPs contribute to the observed tetrameric nature of the PSIl particle; when the OEPs are removed, a distinct dimer emerges. Thus, the surface of the PSII complex changes dramatically upon removal of these polypeptides. The atomic force microscope (AFM) is ideal for examining surface topography. The instrument provides a topographical view of individual PSII complexes, giving relatively high resolution three-dimensional information without image averaging techniques. In addition, the use of a fluid cell allows a biologically active sample to be maintained under fully hydrated and physiologically buffered conditions. The OEPs associated with PSII may be sequentially removed, thereby changing the surface of the complex by one polypeptide at a time.


2016 ◽  
Vol 23 (5) ◽  
pp. 1110-1117 ◽  
Author(s):  
M. V. Vitorino ◽  
Y. Fuchs ◽  
T. Dane ◽  
M. S. Rodrigues ◽  
M. Rosenthal ◽  
...  

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.


Molecules ◽  
2003 ◽  
Vol 8 (1) ◽  
pp. 86-91 ◽  
Author(s):  
Jiye Cai ◽  
Yao Chen ◽  
Qingcai Xu ◽  
Yong Chen ◽  
Tao Zhao ◽  
...  

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