Fluorination of carbon blacks: an X-ray photoelectron spectroscopy study

Carbon ◽

10.1016/s0008-6223(99)00066-4 ◽

1999 ◽

Vol 37 (12) ◽

pp. 1891-1900 ◽

Author(s):

T Shirasaki ◽

F Moguet ◽

L Lozano ◽

A Tressaud ◽

G Nanse ◽

...

Keyword(s):

Photoelectron Spectroscopy ◽

Spectroscopy Study ◽

X Ray ◽

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Fluorination of carbon blacks: An X-ray photoelectron spectroscopy study: III. Fluorination of different carbon blacks with gaseous fluorine at temperatures below 100 °C influence of the morphology, structure and physico-chemical characteristics of the carbon black on the fluorine fixation

Carbon ◽

10.1016/s0008-6223(97)00003-1 ◽

1997 ◽

Vol 35 (4) ◽

pp. 515-528 ◽

Author(s):

G. Nansé ◽

E. Papirer ◽

P. Fioux ◽

F. Moguet ◽

A. Tressaud

Keyword(s):

Carbon Black ◽

Photoelectron Spectroscopy ◽

Chemical Characteristics ◽

Spectroscopy Study ◽

X Ray ◽

Carbon Blacks ◽

Physico Chemical ◽

Gaseous Fluorine

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Fluorination of carbon blacks: An X-ray photoelectron spectroscopy study: I. A literature review of XPS studies of fluorinated carbons. XPS investigation of some reference compounds

Carbon ◽

10.1016/s0008-6223(96)00095-4 ◽

1997 ◽

Vol 35 (2) ◽

pp. 175-194 ◽

Author(s):

G. Nansé ◽

E. Papirer ◽

P. Fioux ◽

F. Moguet ◽

A. Tressaud

Keyword(s):

Literature Review ◽

Photoelectron Spectroscopy ◽

Spectroscopy Study ◽

X Ray ◽

Carbon Blacks ◽

Fluorinated Carbons

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Fluorination of carbon blacks. An X-ray photoelectron spectroscopy study. Part II. XPS study of a furnace carbon black treated with gaseous fluorine at temperatures below 100 °C. Influence of the reaction parameters and of the activation of the carbon black on the fluorine fixation

Carbon ◽

10.1016/s0008-6223(97)89609-1 ◽

1997 ◽

Vol 35 (3) ◽

pp. 371-388 ◽

Author(s):

G. Nansé ◽

E. Papirer ◽

P. Fioux ◽

F. Moguet ◽

A. Tressaud

Keyword(s):

Carbon Black ◽

Photoelectron Spectroscopy ◽

Spectroscopy Study ◽

Reaction Parameters ◽

X Ray ◽

Carbon Blacks ◽

Xps Study ◽

Gaseous Fluorine

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X-Ray Photoelectron Spectroscopy Study of Si-C Film Growth by Chemical Vapor Deposition of Ethylene on Si(100)

10.21236/ada197437 ◽

1988 ◽

Author(s):

P. A. Taylor ◽

M. Bozack ◽

W. J. Choyke ◽

J. T. Yates ◽

Jr

Keyword(s):

Chemical Vapor Deposition ◽

Vapor Deposition ◽

Photoelectron Spectroscopy ◽

Film Growth ◽

Chemical Vapor ◽

Spectroscopy Study ◽

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Time‐of‐flight secondary ion mass spectrometry and X‐ray photoelectron spectroscopy study of 2‐phenylimidazole on brass

Rapid Communications in Mass Spectrometry ◽

10.1002/rcm.8974 ◽

2020 ◽

Vol 35 (2) ◽

Author(s):

Matjaž Finšgar

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Spectroscopy Study ◽

X Ray ◽

Ion Mass Spectrometry ◽

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A high-resolution X-ray photoelectron spectroscopy study of trifluoroacetic anhydride labelling of hydroxyl groups: demonstration of the β shift due to OC(O)CF3

Polymer ◽

10.1016/0032-3861(93)90418-a ◽

1993 ◽

Vol 34 (9) ◽

pp. 1795-1799 ◽

Author(s):

A.P. Ameen ◽

R.J. Ward ◽

R.D. Short ◽

G. Beamson ◽

D. Briggs

Keyword(s):

High Resolution ◽

Photoelectron Spectroscopy ◽

Trifluoroacetic Anhydride ◽

Hydroxyl Groups ◽

Spectroscopy Study ◽

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An X-ray photoelectron spectroscopy study of the surface layers between diamond crystallites and silicon substrate deposited by microwave-plasma-assisted chemical vapour deposition

Diamond and Related Materials ◽

10.1016/0925-9635(93)90120-q ◽

1993 ◽

Vol 2 (2-4) ◽

pp. 558-561 ◽

Author(s):

S. Haq ◽

C. Somerton ◽

D. Tunnicliffe ◽

J.A. Savage ◽

P. John ◽

...

Keyword(s):

Chemical Vapour Deposition ◽

Silicon Substrate ◽

Photoelectron Spectroscopy ◽

Vapour Deposition ◽

Microwave Plasma ◽

Chemical Vapour ◽

Spectroscopy Study ◽

Surface Layers ◽

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Combined Time-of-Flight Secondary Ion Mass Spectrometry and X-ray Photoelectron Spectroscopy Study of the Surface Segregation of Poly(methyl methacrylate) (PMMA) in Bisphenol A Polycarbonate/PMMA Blends

Macromolecules ◽

10.1021/ma00117a038 ◽

1995 ◽

Vol 28 (13) ◽

pp. 4631-4637 ◽

Author(s):

J.-B. Lhoest ◽

P. Bertrand ◽

L. T. Weng ◽

J.-L. Dewez

Keyword(s):

Mass Spectrometry ◽

Bisphenol A ◽

Photoelectron Spectroscopy ◽

Surface Segregation ◽

Secondary Ion Mass Spectrometry ◽

Spectroscopy Study ◽

Bisphenol A Polycarbonate ◽

X Ray ◽

Secondary Ion ◽

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X-ray photoelectron spectroscopy study of thiols adsorbed on Pt(111) with and without the presence of a copper monolayer

Surface and Interface Analysis ◽

10.1002/1096-9918(200008)30:1<359::aid-sia819>3.0.co;2-j ◽

2000 ◽

Vol 30 (1) ◽

pp. 359-363 ◽

Author(s):

C. Alonso ◽

M. F. L�pez ◽

A. Guti�rrez ◽

M. L. Escudero

Keyword(s):

Photoelectron Spectroscopy ◽

Spectroscopy Study ◽

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Oxidation of Si(100) in nitric oxide at low pressures: An x-ray photoelectron spectroscopy study

Applied Physics Letters ◽

10.1063/1.119307 ◽

1997 ◽

Vol 70 (1) ◽

pp. 63-65 ◽

Author(s):

A. Kamath ◽

D. L. Kwong ◽

Y. M. Sun ◽

P. M. Blass ◽

S. Whaley ◽

...

Keyword(s):

Nitric Oxide ◽

Photoelectron Spectroscopy ◽

Spectroscopy Study ◽

X Ray ◽

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