Characterization of transparent conducting CuI thin films prepared by pulse laser deposition technique

2002 ◽  
Vol 366 (5-6) ◽  
pp. 485-489 ◽  
Author(s):  
P.M Sirimanne ◽  
M Rusop ◽  
T Shirata ◽  
T Soga ◽  
T Jimbo
2021 ◽  
Vol 03 (02) ◽  
pp. 156-164
Author(s):  
Asmaa Natiq Mohammed ALI ◽  
Lamia K ABBAS ◽  
Ihab Abbas TAHER

In this work ,pure and doped(CdO)thin films with different concentration of V2O5x (0.0, 0.05, 0.1 ) wt.% have been prepared on glass substrate at room temperature using Pulse Laser Deposition technique(PLD).The focused Nd:YAG laser beam at 800 mJ with a frequency second radiation at 1064 nm (pulse width 9 ns) repetition frequency (6 Hz), for 500 laser pulses incident on the target surface At first ,The pellets of (CdO)1-x(V2O5)x at different V2O5 contents were sintered to a temperature of 773K for one hours.Then films of (CdO)1-x(V2O5)x have been prepared.The structure of the thin films was examined by using (XRD) analysis..Hall effect has been measured in orded to know the type of conductivity, Finally the solar cell and the efficiency of the CdO:V2O5 cells have been studied.


2015 ◽  
Vol 655 ◽  
pp. 186-190
Author(s):  
Yun Jie Liu ◽  
Lan Zhong Hao ◽  
Jun Zhu ◽  
Wan Li Zhang ◽  
Lian Qing Yu ◽  
...  

(001)-oriented LiNbO3(LN) ferroelectric films were grown on (100)-oriented n-type Si substrates using 15 nm-thick ZnO layers as buffers by pulse laser deposition technique and the LN/ZnO/n-Si heterojunctions were fabricated. Obvious photoswitching characteristics to white light were observed when the reverse voltages were applied on the LN/ZnO/n-Si heterojunction. High performance was exhibited, such as a largeON/OFFratio, short photoresponse time, steadyONorOFFstates, and well reversible. The results were discussed in terms of the band diagrams of the LN/ZnO/Si heterojunctions in this work.


1996 ◽  
Vol 27 (4-5) ◽  
pp. 139-143 ◽  
Author(s):  
Yan-Feng Chen ◽  
Li Sun ◽  
Yi Pan ◽  
Yu Tao ◽  
Zhi-Guo Liu ◽  
...  

2003 ◽  
Vol 784 ◽  
Author(s):  
A. Dixit ◽  
P. Bhattacharaya ◽  
S. B. Majumder ◽  
R. S. Katiyar ◽  
A. S. Bhalla

ABSTRACTFerroelectric thin films of BaZrxTi1-xO3 (BZT) were deposited on platinum (Pt) and platinized silicon (Pt/Si) substrates by sol-gel and pulse laser deposition technique respectively. The structure and preferred orientation of the films were examined by x-ray diffraction measurements. The phase formation of sol-gel derived BZT films were found to be at high temperature (1100°C) compare to the pulse laser deposited BZT films ∼ 700°C. Polycrystalline films were observed by both techniques. Ferroelectric nature of the films was confirmed by hysteresis and capacitance-voltage characteristics using platinum top electrodes. Dielectric constant as well as loss was found to decrease by increasing Zr contents. Surface morphology predicted smooth crack free surface.


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