A comparative study on the properties of TiN films prepared by chemical vapor deposition enhanced by r.f. plasma and by electron cyclotron resonance plasma

1997 ◽  
Vol 292 (1-2) ◽  
pp. 124-129 ◽  
Author(s):  
Jong-Seok Kim ◽  
Byung-Hyuk Jun ◽  
Eung-Jik Lee ◽  
Chan-Yong Hwang ◽  
Won-Jong Lee
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