Precision determination of pion mass using X-ray CCD spectroscopy

2002 ◽  
Vol 477 (1-3) ◽  
pp. 461-468 ◽  
Author(s):  
N Nelms ◽  
D.F Anagnostopoulos ◽  
M Augsburger ◽  
G Borchert ◽  
D Chatellard ◽  
...  
Keyword(s):  
Pion Mass ◽  
X Ray ◽  
Precision Determination

Precision determination of pion mass using x-ray CCD spectroscopy

1998 ◽  
Author(s):  
D. F. Anagnostopoulos ◽  
M. Augsburger ◽  
Gunther L. Borchert ◽  
D. Chatellard ◽  
Michael M. Daum ◽  
...  
Keyword(s):  
Pion Mass ◽  
X Ray ◽  
Precision Determination

Absolute Präzisionsbestimmung von Gitterkonstanten an Germanium- und Aluminium-Einkristallen mit Elektroneninterferenzen

1967 ◽  
Vol 22 (1) ◽  
pp. 92-95 ◽  
Author(s):  
W. Witt
Keyword(s):  
Electron Diffraction ◽  
Lattice Constant ◽  
Bulk Material ◽  
X Ray Diffraction ◽  
Full Agreement ◽  
X Ray ◽  
Lattice Constants ◽  
Precision Determination ◽  
Subsequent Chemical

An absolute precision determination of lattice constants by electron diffraction is made with thin monocrystalline films of germanium and aluminium, having a thickness between 1000 and 5000 A. The films are prepared from the bulk material by mechanical polishing and subsequent chemical polishing or etching. The obtained values for the lattice constant α of both materials are within the accuracy Δα/α= ±3·10-5 of measurement in full agreement with the corresponding values obtained by X-ray diffraction (Smakula and Kalnajs).

scholarly journals Mass determination of the charged pion, using high precision X-ray spectroscopy

2020 ◽  
Vol 9 ◽  
pp. 308
Author(s):  
D. F. Anagnostopoulos, et al.
Keyword(s):  
Electronic Transition ◽  
Transition Energy ◽  
Charged Pion ◽  
Pion Mass ◽  
Mass Determination ◽  
Crystal Spectrometer ◽  
X Ray ◽  
Line Shapes ◽  
A Value

X-ray transitions in pionic nitrogen were measured using a curved crystal spectrometer. From the transition energy, calibrated with the help of the copper Ka1,2 electronic transition, a value for the charged pion mass of (139.57071± 0.00053) MeV/c2 was deduced. In order to reduce the uncertainty of the charged pion mass in the level of 1 ppm, we propose the determination of pionic transition energy based on the more precisely known energies and line shapes of muonic transitions.

scholarly journals Structure diagnostics of heterostructures and multi-layered systems by X-ray multiple diffraction

2017 ◽  
Vol 50 (3) ◽  
pp. 722-726 ◽  
Author(s):  
Mariana Borcha ◽  
Igor Fodchuk ◽  
Mykola Solodkyi ◽  
Marina Baidakova
Keyword(s):  
Layered System ◽  
X Ray Diffraction ◽  
Layered Systems ◽  
Multiple Diffraction ◽  
Strain Anisotropy ◽  
X Ray ◽  
Calculation Technique ◽  
Precision Determination ◽  
High Precision Determination

This article presents the results of research on multi-layered heterostructures by a modified calculation technique of multiple X-ray diffraction. The AlxIn1−xSb heterostructure and a Zn(Mn)Se/GaAs(001) multi-layered system were used as models to specify conditions for cases of coincidental coplanar three-beam or coincidental noncoplanar four-beam X-ray diffraction. These conditions provide the means for a high-precision determination of lattice parameters and strain anisotropy in layers.

Rapid precision determination of composition of continuous solid solutions by x-ray techniques

1968 ◽  
Vol 40 (3) ◽  
pp. 611-613 ◽  
Author(s):  
Paul. Cherin ◽  
Edward Arthur. Davis ◽  
C. Bielan
Keyword(s):  
Solid Solutions ◽  
X Ray ◽  
Precision Determination

Lateral resolution of the electron microbeam analysis

1978 ◽  
Vol 36 (1) ◽  
pp. 542-543
Author(s):  
H.J. Dudek
Keyword(s):  
Quantitative Analysis ◽  
Depth Resolution ◽  
Lateral Resolution ◽  
Cylindrical Particle ◽  
Correction Procedure ◽  
X Ray ◽  
Element Concentrations ◽  
Microbeam Analysis ◽  
The Matrix

The chemical inhomogenities in modern materials such as fibers, phases and inclusions, often have diameters in the region of one micrometer. Using electron microbeam analysis for the determination of the element concentrations one has to know the smallest possible diameter of such regions for a given accuracy of the quantitative analysis.In th is paper the correction procedure for the quantitative electron microbeam analysis is extended to a spacial problem to determine the smallest possible measurements of a cylindrical particle P of high D (depth resolution) and diameter L (lateral resolution) embeded in a matrix M and which has to be analysed quantitative with the accuracy q. The mathematical accounts lead to the following form of the characteristic x-ray intens ity of the element i of a particle P embeded in the matrix M in relation to the intensity of a standard S

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