Laser ablation and static secondary ion mass spectrometry capabilities in the characterization of inorganic materials

Inorganic Materials ◽

Ion Mass Spectrometry ◽

Characterization of the surface organization of nanostructured hybrid organic-inorganic materials by time-of-flight secondary ion mass spectrometry

Rapid Communications in Mass Spectrometry ◽

10.1002/(sici)1097-0231(19991115)13:21<2183::aid-rcm773>3.0.co;2-g ◽

1999 ◽

Vol 13 (21) ◽

pp. 2183-2190 ◽

Cited By ~ 6

Author(s):

Geneviève Cerveau ◽

Robert J. P. Corriu ◽

Josiane Dabosi ◽

Cédric Fischmeister-Lepeytre ◽

Robert Combarieu

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Inorganic Materials ◽

Ion Mass Spectrometry ◽

Detection of Au+ Ions During Fluorine Gas-Assisted Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for the Complete Elemental Characterization of Microbatteries

ACS Applied Materials & Interfaces ◽

10.1021/acsami.1c10352 ◽

2021 ◽

Vol 13 (34) ◽

pp. 41262-41274

Author(s):

Agnieszka Priebe ◽

Jordi Sastre ◽

Moritz H. Futscher ◽

Jakub Jurczyk ◽

Marcos V. Puydinger dos Santos ◽

...

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Elemental Characterization

Preparation of Cyclodextrin-Iron Species in Water by Laser Ablation: Secondary Ion Mass Spectrometry

ChemPhysChem ◽

10.1002/cphc.201500215 ◽

2015 ◽

Vol 16 (10) ◽

pp. 2110-2113 ◽

Cited By ~ 2

Author(s):

Sona Halaszova ◽

Monika Jerigova ◽

Dusan Lorenc ◽

Dusan Velic

Keyword(s):

Mass Spectrometry ◽

Laser Ablation ◽

Iron Species ◽

Ion Mass Spectrometry ◽

Forensic Characterization of Lipsticks Using Time-of-Flight Secondary Ion Mass Spectrometry

Journal of Analytical Chemistry ◽

10.1134/s1061934821070091 ◽

2021 ◽

Vol 76 (7) ◽

pp. 854-867

Author(s):

Jihye Lee ◽

Yeonhee Lee

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Ion Mass Spectrometry ◽

Secondary ion mass spectrometry (SIMS) applications on characterization of RF NPN bipolar polysilicon emitter process

10.1063/1.52570 ◽

1997 ◽

Cited By ~ 2

Author(s):

S. Lu

Keyword(s):

Mass Spectrometry ◽

Ion Mass Spectrometry ◽

Polysilicon Emitter ◽

Characterization of sequentially grafted polysaccharide coatings using time-of-flight secondary ion mass spectrometry (ToF-SIMS) and principal component analysis (PCA)

Surface and Interface Analysis ◽

10.1002/sia.1446 ◽

2002 ◽

Vol 33 (12) ◽

pp. 924-931 ◽

Cited By ~ 13

Author(s):

Sally L. McArthur ◽

Matthew S. Wagner ◽

Patrick G. Hartley ◽

Keith M. McLean ◽

Hans J. Griesser ◽

...

Keyword(s):

Mass Spectrometry ◽

Principal Component Analysis ◽

Time Of Flight ◽

Principal Component ◽

Component Analysis ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Characterization of S-glass/polysulfone adhesive failure using ion scattering spectroscopy and secondary ion mass spectrometry

Journal of Colloid and Interface Science ◽

10.1016/0021-9797(80)90178-2 ◽

1980 ◽

Vol 74 (1) ◽

pp. 150-162 ◽

Cited By ~ 26

Author(s):

Anthony T Dibenedetto ◽

Daniel A Scola

Keyword(s):

Mass Spectrometry ◽

Adhesive Failure ◽

Ion Scattering ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

Characterization of the superlattice region of a quantum cascade laser by secondary ion mass spectrometry

Nanoscale ◽

10.1039/c7nr06401b ◽

2017 ◽

Vol 9 (44) ◽

pp. 17571-17575 ◽

Cited By ~ 8

Author(s):

Paweł Piotr Michałowski ◽

Piotr Gutowski ◽

Dorota Pierścińska ◽

Kamil Pierściński ◽

Maciej Bugajski ◽

...

Keyword(s):

Mass Spectrometry ◽

Quantum Cascade Laser ◽

Quantum Cascade ◽

Oxygen Contamination ◽

Ion Mass Spectrometry ◽

Non-uniform oxygen contamination in the superlattice region of a quantum cascade laser measured by secondary ion mass spectrometry.

Purification of Cu by hydrogen plasma-arc zone melting and characterization of trace impurities by secondary ion mass spectrometry

Materials Characterization ◽

10.1016/j.matchar.2008.05.004 ◽

2009 ◽

Vol 60 (1) ◽

pp. 60-64 ◽

Cited By ~ 5

Author(s):

G.M. Lalev ◽

J.-W. Lim ◽

N.R. Munirathnam ◽

G.-S. Choi ◽

M. Uchikoshi ◽

...

Keyword(s):

Mass Spectrometry ◽

Hydrogen Plasma ◽

Zone Melting ◽

Plasma Arc ◽

Trace Impurities ◽

Ion Mass Spectrometry ◽

Imaging and 3D Elemental Characterization of Intact Bacterial Spores by High-Resolution Secondary Ion Mass Spectrometry

Analytical Chemistry ◽

10.1021/ac8006279 ◽

2008 ◽

Vol 80 (15) ◽

pp. 5986-5992 ◽

Cited By ~ 63

Author(s):

Sutapa Ghosal ◽

Stewart J. Fallon ◽

Terrance J. Leighton ◽

Katherine E. Wheeler ◽

Michael J. Kristo ◽

...

Keyword(s):

Mass Spectrometry ◽

High Resolution ◽

Bacterial Spores ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Elemental Characterization