ScienceGate
Advanced Search
Author Search
Journal Finder
Blog
Sign in / Sign up
ScienceGate
Search
Author Search
Journal Finder
Blog
Sign in / Sign up
Characterization of high-k gate dielectric films using SIMS
Applied Surface Science
◽
10.1016/s0169-4332(02)00725-0
◽
2003
◽
Vol 203-204
◽
pp. 516-519
◽
Cited By ~ 7
Author(s):
T. Yamamoto
◽
N. Morita
◽
N. Sugiyama
◽
A. Karen
◽
K. Okuno
Keyword(s):
Gate Dielectric
◽
Dielectric Films
◽
High K
◽
High K Gate Dielectric
Download Full-text
Related Documents
Cited By
References
Growth and characterization of HfO2 high-k gate dielectric films by laser molecular beam epitaxy (LMBE)
Journal of Materials Science Materials in Electronics
◽
10.1007/s10854-006-0014-3
◽
2006
◽
Vol 17
(9)
◽
pp. 685-688
◽
Cited By ~ 2
Author(s):
Y. K. Lu
◽
X. F. Chen
◽
W. Zhu
◽
R. Gopalkrishnan
Keyword(s):
Molecular Beam Epitaxy
◽
Molecular Beam
◽
Gate Dielectric
◽
Dielectric Films
◽
Laser Molecular Beam Epitaxy
◽
High K
◽
High K Gate Dielectric
Download Full-text
Characterization of high-k gate dielectric/silicon interfaces
Applied Surface Science
◽
10.1016/s0169-4332(01)00841-8
◽
2002
◽
Vol 190
(1-4)
◽
pp. 66-74
◽
Cited By ~ 107
Author(s):
Seiichi Miyazaki
Keyword(s):
Gate Dielectric
◽
High K
◽
High K Gate Dielectric
Download Full-text
Fabrication and properties of the Y-doped Al2O3 high-k gate dielectric films
Acta Physica Sinica
◽
10.7498/aps.54.5901
◽
2005
◽
Vol 54
(12)
◽
pp. 5901
Author(s):
Guo De-Feng
◽
Geng Wei-Gang
◽
Lan Wei
◽
Huang Chun-Ming
◽
Wang Yin-Yue
Keyword(s):
Gate Dielectric
◽
Dielectric Films
◽
High K
◽
High K Gate Dielectric
Download Full-text
High-k Gate Dielectric Films Studied by Extremely Asymmetric X-ray Diffraction and X-ray Photoelectron Spectroscopy
Journal of Physics Conference Series
◽
10.1088/1742-6596/83/1/012011
◽
2007
◽
Vol 83
◽
pp. 012011
◽
Cited By ~ 1
Author(s):
Yuki Ito
◽
Koichi Akimoto
◽
Hironori Yoshida
◽
Takashi Emoto
◽
Daisuke Kobayashi
◽
...
Keyword(s):
Photoelectron Spectroscopy
◽
Gate Dielectric
◽
Dielectric Films
◽
X Ray Diffraction
◽
X Ray
◽
High K
◽
High K Gate Dielectric
Download Full-text
Observation and characterization of defects in HfO2 high-K gate dielectric layers
Microelectronics Reliability
◽
10.1016/j.microrel.2004.11.045
◽
2005
◽
Vol 45
(5-6)
◽
pp. 798-801
◽
Cited By ~ 4
Author(s):
Vidya Kaushik
◽
Martine Claes
◽
Annelies Delabie
◽
Sven Van Elshocht
◽
Olivier Richard
◽
...
Keyword(s):
Gate Dielectric
◽
Dielectric Layers
◽
High K
◽
High K Gate Dielectric
Download Full-text
Physical characterization of high-k gate dielectric film systems processed by RTA and spike anneal
10th IEEE International Conference of Advanced Thermal Processing of Semiconductors
◽
10.1109/rtp.2002.1039445
◽
2003
◽
Author(s):
P.S. Lyaaght
◽
B. Foran
◽
G. Bersuker
◽
R. Tichy
◽
L. Larson
◽
...
Keyword(s):
Gate Dielectric
◽
Dielectric Film
◽
Physical Characterization
◽
High K
◽
Spike Anneal
◽
High K Gate Dielectric
Download Full-text
Ultrathin High-k Gate Dielectric Films on Strained-Si/SiGe Heterolayers
IETE Journal of Research
◽
10.1080/03772063.2007.10876138
◽
2007
◽
Vol 53
(3)
◽
pp. 237-251
Author(s):
M K Bera
◽
C Mahata
◽
C K Maiti
Keyword(s):
Gate Dielectric
◽
Dielectric Films
◽
Strained Si
◽
High K
◽
High K Gate Dielectric
Download Full-text
Characterization of ALD Beryllium Oxide as a Potential High-k Gate Dielectric for Low-Leakage AlGaN/GaN MOSHEMTs
Journal of Electronic Materials
◽
10.1007/s11664-013-2754-1
◽
2013
◽
Vol 43
(1)
◽
pp. 151-154
◽
Cited By ~ 11
Author(s):
Derek W. Johnson
◽
Jung Hwan Yum
◽
Todd W. Hudnall
◽
Ryan M. Mushinski
◽
Christopher W. Bielawski
◽
...
Keyword(s):
Gate Dielectric
◽
Beryllium Oxide
◽
Low Leakage
◽
High K
◽
High K Gate Dielectric
Download Full-text
Mixed Oxides as High-k Gate Dielectric Films
ECS Transactions
◽
10.1149/1.2193869
◽
2019
◽
Vol 2
(1)
◽
pp. 13-22
◽
Cited By ~ 3
Author(s):
Rosa María Luna-Sánchez
◽
Ignacio González-Martínez
Keyword(s):
Gate Dielectric
◽
Mixed Oxides
◽
Dielectric Films
◽
High K
◽
High K Gate Dielectric
Download Full-text
Effect of barrier layer on the electrical and reliability characteristics of high-k gate dielectric films
International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217)
◽
10.1109/iedm.1998.746476
◽
2002
◽
Cited By ~ 1
Author(s):
Yongjoo Jeon
◽
Byoung Hun Lee
◽
K. Zawadzki
◽
Wen-Jie Qi
◽
A. Lucas
◽
...
Keyword(s):
Barrier Layer
◽
Gate Dielectric
◽
Dielectric Films
◽
Reliability Characteristics
◽
High K
◽
High K Gate Dielectric
Download Full-text
Sign in / Sign up
Close
Export Citation Format
Close
Share Document
Close