Atomic force microscope imaging of molecular aggregation during self-assembled monolayer growth

2000 ◽  
Vol 174 (1-2) ◽  
pp. 233-243 ◽  
Author(s):  
Ivo Doudevski ◽  
William A Hayes ◽  
John T Woodward ◽  
Daniel K Schwartz
Keyword(s):  
Atomic Force Microscope ◽  
Molecular Aggregation ◽  
Self Assembled Monolayer ◽  
Atomic Force ◽  
Monolayer Growth ◽  
Microscope Imaging ◽  
Self Assembled

scholarly journals Atomic Force Microscope Imaging of the Aggregation of Mouse Immunoglobulin G Molecules

Molecules ◽  
2003 ◽  
Vol 8 (1) ◽  
pp. 86-91 ◽  
Author(s):  
Jiye Cai ◽  
Yao Chen ◽  
Qingcai Xu ◽  
Yong Chen ◽  
Tao Zhao ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Immunoglobulin G ◽  
Atomic Force ◽  
Mouse Immunoglobulin ◽  
Microscope Imaging

Comparative Study of Field Emission-Scanning Electron Microscopy and Atomic Force Microscopy to Assess Self-assembled Monolayer Coverage on Any Type of Substrate

1999 ◽  
Vol 5 (6) ◽  
pp. 413-419 ◽  
Author(s):  
Bernardo R.A. Neves ◽  
Michael E. Salmon ◽  
Phillip E. Russell ◽  
E. Barry Troughton
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Comparative Study ◽  
Field Emission ◽  
Self Assembled Monolayer ◽  
Force Microscopy ◽  
Atomic Force ◽  
Self Assembled ◽  
Scanning Electron

Abstract: In this work, we show how field emission–scanning electron microscopy (FE-SEM) can be a useful tool for the study of self-assembled monolayer systems. We have carried out a comparative study using FE-SEM and atomic force microscopy (AFM) to assess the morphology and coverage of self-assembled monolayers (SAM) on different substrates. The results show that FE-SEM images present the same qualitative information obtained by AFM images when the SAM is deposited on a smooth substrate (e.g., mica). Further experiments with rough substrates (e.g., Al grains on glass) show that FE-SEM is capable of unambiguously identifying SAMs on any type of substrate, whereas AFM has significant difficulties in identifying SAMs on rough surfaces.

In Situ Atomic Force Microscope Imaging of Supported Lipid Bilayers

2001 ◽  
Vol 2 (2) ◽  
pp. 105-108 ◽  
Author(s):  
Thomas Kaasgaard ◽  
Chad Leidy ◽  
John Hjort Ipsen ◽  
Ole G. Mouritsen ◽  
Kent Jørgensen
Keyword(s):  
Atomic Force Microscope ◽  
Lipid Bilayers ◽  
Supported Lipid Bilayers ◽  
Atomic Force ◽  
Microscope Imaging

Measurements of Single-Molecule Bond-Rupture Forces between Self-Assembled Monolayers of Organosilanes with the Atomic Force Microscope

Langmuir ◽  
1997 ◽  
Vol 13 (14) ◽  
pp. 3761-3768 ◽  
Author(s):  
L. A. Wenzler ◽  
G. L. Moyes ◽  
G. N. Raikar ◽  
R. L. Hansen ◽  
J. M. Harris ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Single Molecule ◽  
Self Assembled Monolayers ◽  
Bond Rupture ◽  
Atomic Force ◽  
Assembled Monolayers ◽  
Self Assembled
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