Influence of oxygen partial pressure on properties of N-doped ZnO films deposited by magnetron sputtering

2010 ◽  
Vol 20 (12) ◽  
pp. 2326-2330 ◽  
Author(s):  
Jin-zhong WANG ◽  
E. ElANGOVAN ◽  
N. FRANCO ◽  
A. ALVESE ◽  
A. REGO ◽  
...  
2011 ◽  
Vol 60 (3) ◽  
pp. 036804
Author(s):  
Bao Shan-Yong ◽  
Dong Wu-Jun ◽  
Xu Xing ◽  
Luan Tian-Bao ◽  
Li Jie ◽  
...  

2008 ◽  
Vol 84 (2) ◽  
pp. 27005 ◽  
Author(s):  
X. Zhang ◽  
W. H. Wang ◽  
L. Y. Li ◽  
Y. H. Cheng ◽  
X. G. Luo ◽  
...  

2011 ◽  
Vol 18 (03n04) ◽  
pp. 91-95
Author(s):  
L. G. WANG ◽  
H. W. ZHANG ◽  
X. L. TANG ◽  
Y. X. LI ◽  
Z. Y. ZHONG

High quality Co -doped ZnO films with good reproducibility have been prepared under different oxygen partial pressure by radio-frequency magnetron sputtering. These films were characterized using numerous characterization techniques including X-ray diffraction, electrical transport, and magnetization measurements. The effect of oxygen partial pressure on the structural, magnetic, and electrical properties of Co -doped ZnO films has been systematically studied. It was found that the structural, magnetic, and electrical properties of Co -doped ZnO films are dependent on oxygen partial pressure. The saturated magnetization of Co -doped ZnO films rapidly increases with decreasing oxygen partial pressure, whereas the resistivity decreases with decreasing oxygen partial pressure. Our findings indicate that the magnetic and electrical properties of Co -doped ZnO films can be tuned by careful control of oxygen partial pressure. In addition, it was further demonstrated that the oxygen vacancy defect is absolutely necessary to induce ferromagnetic couplings in Co -doped ZnO films.


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