Combined Analytical Techniques for the ELMISKOP 101 and 102

1974 ◽  
Vol 32 ◽  
pp. 418-419
Author(s):  
H.M. Thieringer ◽  
C. Weichan
Keyword(s):  
Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
High Performance ◽  
Analytical Techniques ◽  
Secondary Electrons ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Electron Microscopes ◽  
Scanning Electron

The high performance transmission electron microscopes ELMISKOP 101 and 102 are increasingly used in the analytical field. This is especially favoured by the fact that five different analysis and imaging modes can be adopted by optional accessories: for wavelength dispersive X-ray microanalysis, energy dispersive X-ray microanalysis, scanning transmission electron microscopy (STEM), scanning electron microscopy (SEM) by secondary electrons, and image current measurement.

On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope

2018 ◽  
Vol 24 (2) ◽  
pp. 99-106 ◽  
Author(s):  
Cheng Sun ◽  
Erich Müller ◽  
Matthias Meffert ◽  
Dagmar Gerthsen
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Crystal Defects ◽  
Low Energy ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Electron Microscopes ◽  
Scanning Electron

AbstractTransmission electron microscopy (TEM) with low-energy electrons has been recognized as an important addition to the family of electron microscopies as it may avoid knock-on damage and increase the contrast of weakly scattering objects. Scanning electron microscopes (SEMs) are well suited for low-energy electron microscopy with maximum electron energies of 30 keV, but they are mainly used for topography imaging of bulk samples. Implementation of a scanning transmission electron microscopy (STEM) detector and a charge-coupled-device camera for the acquisition of on-axis transmission electron diffraction (TED) patterns, in combination with recent resolution improvements, make SEMs highly interesting for structure analysis of some electron-transparent specimens which are traditionally investigated by TEM. A new aspect is correlative SEM, STEM, and TED imaging from the same specimen region in a SEM which leads to a wealth of information. Simultaneous image acquisition gives information on surface topography, inner structure including crystal defects and qualitative material contrast. Lattice-fringe resolution is obtained in bright-field STEM imaging. The benefits of correlative SEM/STEM/TED imaging in a SEM are exemplified by structure analyses from representative sample classes such as nanoparticulates and bulk materials.

Effect of Au on the Performance of Porous Silicon/V2O5 Nanorods Heterojunctions to NO2 Gas

NANO ◽  
2016 ◽  
Vol 11 (07) ◽  
pp. 1650079 ◽  
Author(s):  
Wenjun Yan ◽  
Ming Hu ◽  
Jiran Liang ◽  
Dengfeng Wang ◽  
Yulong Wei ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Porous Silicon ◽  
Room Temperature ◽  
Au Nanoparticles ◽  
Analytical Techniques ◽  
Heating Process ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Electron

A novel composite of Au-functionalized porous silicon (PS)/V2O5 nanorods (PS/V2O5:Au) was prepared to detect NO2 gas. PS/V2O5 nanorods were synthesized by a heating process of pure vanadium film on PS, and then the obtained PS/V2O5 nanorods were functionalized with dispersed Au nanoparticles. Various analytical techniques, such as field emission scanning electron microscopy (FESEM), transmission electron microscopy (TEM), X-ray diffraction (XRD), have been employed to investigate the properties of PS/V2O5:Au. Herein, the PS/V2O5:Au sample exhibited improved NO2-sensing performances in response, stability and selectivity at room temperature (25[Formula: see text]C), compared with the pure PS/V2O5 nanorods. These phenomena were closely related to not only the dispersed Au nanoparticles acting as a catalyst but also the p-n heterojunctions between PS and V2O5 nanorods. Whereas, more Au nanoparticles suppressed the improvement of response to NO2 gas.

An Inexpensive Approach for Bright-Field and Dark-Field Imaging by Scanning Transmission Electron Microscopy in Scanning Electron Microscopy

2014 ◽  
Vol 20 (1) ◽  
pp. 124-132 ◽  
Author(s):  
Binay Patel ◽  
Masashi Watanabe
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Lattice Spacing ◽  
Dark Field ◽  
Bright Field ◽  
Specimen Holder ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Scanning Electron

AbstractScanning transmission electron microscopy in scanning electron microscopy (STEM-in-SEM) is a convenient technique for soft materials characterization. Various specimen-holder geometries and detector arrangements have been used for bright-field (BF) STEM-in-SEM imaging. In this study, to further the characterization potential of STEM-IN-SEM, a new specimen holder has been developed to facilitate direct detection of BF signals and indirect detection of dark-field (DF) signals without the need for substantial instrument modification. DF imaging is conducted with the use of a gold (Au)-coated copper (Cu) plate attached to the specimen holder which directs highly scattered transmitted electrons to an off-axis yttrium-aluminum-garnet (YAG) detector. A hole in the copper plate allows for BF imaging with a transmission electron (TE) detector. The inclusion of an Au-coated Cu plate enhanced DF signal intensity. Experiments validating the acquisition of true DF signals revealed that atomic number (Z) contrast may be achieved for materials with large lattice spacing. However, materials with small lattice spacing still exhibit diffraction contrast effects in this approach. The calculated theoretical fine probe size is 1.8 nm. At 30 kV, in this indirect approach, DF spatial resolution is limited to 3.2 nm as confirmed experimentally.

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