Effect of Au on the Performance of Porous Silicon/V2O5 Nanorods Heterojunctions to NO2 Gas

NANO ◽  
2016 ◽  
Vol 11 (07) ◽  
pp. 1650079 ◽  
Author(s):  
Wenjun Yan ◽  
Ming Hu ◽  
Jiran Liang ◽  
Dengfeng Wang ◽  
Yulong Wei ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Porous Silicon ◽  
Room Temperature ◽  
Au Nanoparticles ◽  
Analytical Techniques ◽  
Heating Process ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Electron

A novel composite of Au-functionalized porous silicon (PS)/V2O5 nanorods (PS/V2O5:Au) was prepared to detect NO2 gas. PS/V2O5 nanorods were synthesized by a heating process of pure vanadium film on PS, and then the obtained PS/V2O5 nanorods were functionalized with dispersed Au nanoparticles. Various analytical techniques, such as field emission scanning electron microscopy (FESEM), transmission electron microscopy (TEM), X-ray diffraction (XRD), have been employed to investigate the properties of PS/V2O5:Au. Herein, the PS/V2O5:Au sample exhibited improved NO2-sensing performances in response, stability and selectivity at room temperature (25[Formula: see text]C), compared with the pure PS/V2O5 nanorods. These phenomena were closely related to not only the dispersed Au nanoparticles acting as a catalyst but also the p-n heterojunctions between PS and V2O5 nanorods. Whereas, more Au nanoparticles suppressed the improvement of response to NO2 gas.

scholarly journals Fabrication and magnetic properties of hierarchical nickel microwires with nanothorns

2010 ◽  
Vol 8 (2) ◽  
pp. 434-439 ◽  
Author(s):  
Junhao Zhang ◽  
Ling Yang ◽  
Xiaofang Cheng ◽  
Jinmeng Zhang ◽  
Fucai Li
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Magnetic Properties ◽  
Room Temperature ◽  
Cooperative Effect ◽  
Magnetic Interactions ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Electron

AbstractHierarchical nickel microwires with nanothorns were fabricated through a reduction of nickelous salt with hydrazine in diethanolamine. The product was characterized by X-ray diffraction (XRD), field-emission scanning electron microscopy (FESEM), transmission electron microscopy (TEM), and energy-dispersive X-ray spectroscopy (EDS). The growth mechanism of the nickel microwires with nanothorns is proposed, based on the evolution of the structures and morphologies, which could be ascribed to the cooperative effect of the complexant of diethanolamine and inherent magnetic interactions. Magnetic properties of the product were measured at room temperature and compared with other shaped counterparts.

scholarly journals Microstructures of Three In-Situ Reinforcements and the Effect on the Tensile Strengths of an Al-Si-Cu-Mg-Ni Alloy

2018 ◽  
Vol 8 (9) ◽  
pp. 1523 ◽  
Author(s):  
Lusha Tian ◽  
Yongchun Guo ◽  
Jianping Li ◽  
Feng Xia ◽  
Minxian Liang ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Room Temperature ◽  
X Ray Diffraction ◽  
Simultaneous Formation ◽  
X Ray ◽  
Transmission Electron ◽  
Ni Alloy ◽  
Al3ti Phase ◽  
Scanning Electron

In the present paper, the microstructures of three kinds of in-situ reinforcements Al-Ti-C, Al-Ti-B, and Al-Ti-B-C-Ce were deeply investigated using a combination of scanning electron microscopy, X-ray diffraction spectroscopy, and transmission electron microscopy. The effect of in-situ reinforcements on the room temperature and elevated temperature (350 °C) tensile strengths of Al-13Si-4Cu-1Mg-2Ni alloy were analyzed. It is found that doping with trace amounts of B and Ce, the size of the Al3Ti phase in the in-situ reinforced alloy changed from 80 µm (un-reinforced) to about 10 µm, with the simultaneous formation of the AlTiCe phase. The Al-Ti-B-C-Ce reinforcement which is rapid solidified, was more effective and superior to enhance the tensile strengths of the Al-13Si-4Cu-1Mg-2Ni alloy, both at room and high temperatures than those of addition other reinforcements. The room temperature (RT) strength increased by 19.0%, and the 350 °C-strength increased by 18.4%.

Heteroe-Pitaxial Growth and Optical Properties of SnO2 Nanowires on ZnS Nanobelts

2012 ◽  
Vol 535-537 ◽  
pp. 481-485 ◽  
Author(s):  
Mang Jiang ◽  
Jun Hong Duan ◽  
Zhiang Liu
Keyword(s):  
Electron Microscopy ◽  
Optical Properties ◽  
Room Temperature ◽  
Thermal Evaporation ◽  
Structural Information ◽  
X Ray Diffraction ◽  
Thermal Evaporation Method ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Electron

The authors present the results of hetero-epitaxial growth of ultrafine SnO2nanowires on ZnS nanobelt substrates by a simple thermal evaporation method. ZnS/SnO2hetero-nanostructures were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), energy-dispersive x-ray spectroscopy (EDS), transmission electron microscopy (TEM) to obtain the morphology and structural information. Comparing with ZnS nanobelts and SnO2nanowires respectively, the optical properties of ZnS/SnO2hetero-nanostructures are studied by Raman scattering and photoluminescence (PL) spectroscopy at room temperature.

Thermoelectric Properties of BixSbyTezSew Nanocomposite Materials

2008 ◽  
Vol 55-57 ◽  
pp. 809-812 ◽  
Author(s):  
V. Kosalathip ◽  
T. Kumpeerapun ◽  
S. Migot ◽  
B. Lenoir ◽  
A. Dauscher
Keyword(s):  
Electron Microscopy ◽  
Room Temperature ◽  
Nanocomposite Materials ◽  
Nano Particle ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
P Type ◽  
Cold Pressed ◽  
Scanning Electron

Nanopowders of n-type (Bi0.95Sb0.05)2(Te0.95Se0.05)3 and p-type (Bi0.2Sb0.8)2Te3 have been synthesized by laser fracture of micron-sized powders in water. These alloys are the best conventional thermoelectric materials for use in room temperature applications. The nanopowders have been characterized by x-ray diffraction, scanning electron microscopy, and transmission electron microscopy. The nanopowders have been mechanically mixed in different ratios with the micron sized powders. These mixtures have then been cold pressed in order to perform thermoelectric characterization and to see the influence of nano-particle inclusions on the transport properties.

Cosio2 Formation on Strained GexSi1−x Layers BY Co/GexSi1−x Thermal Reaction

1993 ◽  
Vol 311 ◽  
Author(s):  
M.M. Ridgway ◽  
R.R. Elliman ◽  
R. Pascual ◽  
J.J. Whitton ◽  
J.-M. Baribeau
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Raman Spectroscopy ◽  
Analytical Techniques ◽  
Thermal Reaction ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Electron

ABSTRACTThe formation of CoSi2 on Ge.17Si.83 layers by Co/Ge.17Si.83 thermal reaction nas been studied with a variety of analytical techniques. Co films deposited on strained Ge.17Si.83 layers were annealed at 600°C for 0–240 min. Following 240 rain annealing, the reacted surface layer was composed of CoSi, CoSi2 and GexSi1-x precipitates (the latter probably rich in Ge) as identified with transmission electron microscopy, x-ray diffraction and/or Raman spectroscopy. Lateral phase non-uniformity was evident with both transmission and scanning electron microscopy. For samples annealed with and without an evaporated Co film, enhanced relaxation of the underlying Ge.17Si.83 layer was apparent in the former.

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

Identification of calcium oxalate crystals in dried or fixed tobacco leaf

1984 ◽  
Vol 42 ◽  
pp. 288-289
Author(s):  
Vicki L. Baliga ◽  
Mary Ellen Counts
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Calcium Oxalate ◽  
Growth And Development ◽  
Polarized Light ◽  
Calcium Oxalate Crystals ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Electron

Calcium is an important element in the growth and development of plants and one form of calcium is calcium oxalate. Calcium oxalate has been found in leaf seed, stem material plant tissue culture, fungi and lichen using one or more of the following methods—polarized light microscopy (PLM), scanning electron microscopy (SEM), transmission electron microscopy (TEM) and x-ray diffraction.Two methods are presented here for qualitatively estimating calcium oxalate in dried or fixed tobacco (Nicotiana) leaf from different stalk positions using PLM. SEM, coupled with energy dispersive x-ray spectrometry (EDS), and powder x-ray diffraction were used to verify that the crystals observed in the dried leaf with PLM were calcium oxalate.

The Effect of the Microstructure of Diffusion Barriers on the Palladium Activation for Electroless Copper Deposition

2002 ◽  
Vol 716 ◽  
Author(s):  
Seok Woo Hong ◽  
Yong Sun Lee ◽  
Ki-Chul Park ◽  
Jong-Wan Park
Keyword(s):  
Electron Microscopy ◽  
Diffusion Barriers ◽  
Copper Deposition ◽  
X Ray Diffraction ◽  
Plan View ◽  
X Ray ◽  
Transmission Electron ◽  
Electroless Copper ◽  
Sheet Resistance Measurement ◽  
Scanning Electron

AbstractThe effect of microstructure of dc magnetron sputtered TiN and TaN diffusion barriers on the palladium activation for autocatalytic electroless copper deposition has been investigated by using X-ray diffraction, sheet resistance measurement, field emission scanning electron microscopy (FE-SEM) and plan view transmission electron microscopy (TEM). The density of palladium nuclei on TaN diffusion barrier increases as the grain size of TaN films decreases, which was caused by increasing nitrogen content in TaN films. Plan view TEM results of TiN and TaN diffusiton barriers showed that palladium nuclei formed mainly on the grain boundaries of the diffusion barriers.

scholarly journals Analytical study of Buddha sculptures in Jingyin temple of Taiyuan, China

2021 ◽  
Vol 9 (1) ◽  
Author(s):  
Xiaojian Bai ◽  
Chen Jia ◽  
Zhigen Chen ◽  
Yuxuan Gong ◽  
Huwei Cheng ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Analytical Study ◽  
Energy Dispersive Spectrometry ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Ancient China ◽  
X Ray ◽  
Unique Style ◽  
Scanning Electron

AbstractWith exquisite design and unique style, the painted sculptures of Tutang Buddha and two attendants Buddha in Jingyin Temple are precious cultural heritages of China. The sculpture of Tutang Buddha, which was carved from a mound and painted by ancient craftsmen, was rarely found in ancient China. However, due to natural and human factors, the sculptures were severely damaged. Obviously, they require urgent and appropriate protection and restoration. In this study, samples taken from the sculptures were analysed through multiple analytical techniques, including scanning electron microscopy with energy dispersive spectrometry (SEM–EDS), Raman spectroscopy, X-ray diffraction (XRD), optical microscopy (OM) and granulometry. The analysis results enable us to infer the techniques used by the craftsmen in making the sculptures and provide a reliable evidence for the conservation and future protection of these and similar sculptures.

ROOM TEMPERATURE PHOTOLUMINESCENCE OF POLYCRYSTALLINE SIC PREPARED FROM CARBON-SATURATED SI MELT

2002 ◽  
Vol 16 (06n07) ◽  
pp. 1047-1051
Author(s):  
JIANPING MA ◽  
ZHIMING CHEN ◽  
GANG LU ◽  
MINGBIN YU ◽  
LIANMAO HANG ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Photoelectron Spectroscopy ◽  
Room Temperature ◽  
Uv Light ◽  
X Ray Diffraction ◽  
X Ray ◽  
Room Temperature Photoluminescence ◽  
Composition And Structure ◽  
Light Excitation ◽  
Scanning Electron

Intense photoluminescence (PL) has been observed at room temperature from the polycrystalline SiC samples prepared from carbon-saturated Si melt at a temperature ranging from 1500 to 1650°C. Composition and structure of the samples have been confirmed by means of X-ray photoelectron spectroscopy, X-ray diffraction and scanning electron microscopy. PL measurements with 325 nm UV light excitation revealed that the room temperature PL spectrum of the samples consists of 3 luminescent bands, the peak energies of which are 2.38 eV, 2.77 eV and 3.06 eV, respectively. The 2.38 eV band is much stronger than the others. It is suggested that some extrinsic PL mechanisms associated with defect or interface states would be responsible to the intensive PL observed at room temperature.

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