Contrast Effects in High Resolution, Low Voltage SEM
1974 ◽
Vol 32
◽
pp. 452-453
Keyword(s):
A scanning electron microscope using a field emission electron source and a single electromagnetic lens can produce a resolution of less than 180Å using an accelerating voltage of only 900v. High resolution, low voltage (0.1-2kV) scanning microscopy offers a number of advantages over the use of higher accelerating voltages. Specimen damage may be reduced because the power (P≃IV) which must be absorbed by the specimen for operation at a given probe current (I) is decreased in proportion to the reduction in accelerating voltage (V).
1973 ◽
Vol 31
◽
pp. 302-303
1993 ◽
Vol 64
(10)
◽
pp. 2905-2910
◽
1989 ◽
Vol 47
◽
pp. 74-75
2006 ◽
Vol 92
(1-3)
◽
pp. 165-172
◽
Keyword(s):
2000 ◽
Vol 199
(2)
◽
pp. 115-123
◽
1972 ◽
Vol 30
◽
pp. 420-421
1987 ◽
Vol 6
(1)
◽
pp. 15-30
◽