X-ray Microanalysis of Biological Samples by High-resolution Energy Dispersive Microcalorimeter Spectrometer Using a Low-voltage Scanning Electron Microscope

Literature on electrocution in Italy is limited. The authors have focused their attention on the use of scanning electron microscope/energy-dispersive X-ray analysis in order to evaluate the current mark even on paraffin-embedded samples. A total of 24,104 autopsies were performed at the Section of Legal Medicine of Milan (1993–2017); all cases of death caused by electrocution (low and high voltage) were selected. We assessed a regular histological examination, a toxicological examination and detected metallisation with energy-dispersive X-ray spectroscopy analysis on paraffin-embedded tissues of typical current marks. We collected 27 high-voltage fatalities and five cases of low-voltage suicide electrocution; the technique revealed itself as sensitive. In all cases, microscopic examination highlighted the typical signs of electric current and thermal damage but the histochemical specific stainings for copper and iron gave negative results. Scanning electron microscope/energy-dispersive X-ray analysis, assessed on these same samples, even when paraffin-embedded, however, enabled us to detect these elements and differentiate between the various metal residues involved in the electrocution process. Based on their experience, authors advise the use of scanning electron microscope/energy-dispersive X-ray analysis on electrocution deaths to provide information for forensic diagnosis.

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Microcalorimeter energy-dispersive spectrometry using a low voltage scanning electron microscope

Journal of Microscopy ◽

10.1046/j.1365-2818.2000.00705.x ◽

2000 ◽

Vol 199 (1) ◽

pp. 37-44 ◽

Cited By ~ 22

Author(s):

D. A. Wollman ◽

S. W. Nam ◽

G. C. Hilton ◽

K. D. Irwin ◽

N. F. Bergren ◽

...

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Energy Dispersive Spectrometry ◽

Low Voltage ◽

Energy Dispersive ◽

Voltage Scanning ◽

Scanning Electron

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Electron optical design of a high‐resolution low‐voltage scanning electron microscope with field emission gun

Review of Scientific Instruments ◽

10.1063/1.1144381 ◽

1993 ◽

Vol 64 (10) ◽

pp. 2905-2910 ◽

Cited By ~ 2

Author(s):

Jiye Ximen ◽

P. S. D. Lin ◽

J. B. Pawley ◽

M. Schippert

Keyword(s):

Electron Microscope ◽

High Resolution ◽

Scanning Electron Microscope ◽

Field Emission ◽

Low Voltage ◽

Optical Design ◽

Voltage Scanning ◽

Scanning Electron

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Electron-optical design of a high-resolution objective lens for low-voltage Scanning Electron Microscope of biological applications

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100129383 ◽

1992 ◽

Vol 50 (2) ◽

pp. 950-951

Author(s):

J. Ximen ◽

P. S. D. Lin ◽

J. B. Pawley ◽

M. Schippert

Keyword(s):

Electron Microscope ◽

High Resolution ◽

Scanning Electron Microscope ◽

Surface Characterization ◽

Low Voltage ◽

Optical Design ◽

Objective Lens ◽

Magnetic Lens ◽

Voltage Scanning ◽

Scanning Electron

By providing higher image contrast and reduced charging artifacts, the low voltage scanning electron microscope (LVSEM) is a valuable tool for surface characterization, of particular importance on nonconductive material such as biological specimens. Several SEM designs optimized for use at low voltage have been proposed.Recently, we have designed a new high resolution LVSEM using a field emission gun. The key problem is to decrease both the spherical and chromatic aberration coefficients by using a magnetic lens of small bore diameters(5mm and 10mm) and a narrow gap (7.5mm) (FIG. 1). In our first design, the magnetic lens is built around the side-entry stage of a Philips 300kV TEM and performs as well as that in the present Hitachi SEM H-900 or H-900S. Its simple design has been chosen for reliability and flexibility in farbrication.

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Quantitative X-Ray Microanalysis with a Low Voltage Scanning Electron Microscope

Microscopy and Microanalysis ◽

10.1017/s1431927602104004 ◽

2002 ◽

Vol 8 (S02) ◽

pp. 1474-1475

Author(s):

Paula Horny ◽

Raynald Gauvin ◽

Eric Lifshin ◽

Di Wu

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Low Voltage ◽

X Ray ◽

Voltage Scanning ◽

Scanning Electron

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PHAX-SCAN: Functional integration of a Scanning Electron Microscope and an energy-dispersive x-ray analyser

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100152252 ◽

1989 ◽

Vol 47 ◽

pp. 56-57

Author(s):

Marc H. Peeters ◽

Max T. Otten

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

High Speed ◽

High Performance ◽

Functional Integration ◽

Energy Dispersive ◽

X Rays ◽

X Ray ◽

High Speed Analysis ◽

Scanning Electron

Over the past decades, the combination of energy-dispersive analysis of X-rays and scanning electron microscopy has proved to be a powerful tool for fast and reliable elemental characterization of a large variety of specimens. The technique has evolved rapidly from a purely qualitative characterization method to a reliable quantitative way of analysis. In the last 5 years, an increasing need for automation is observed, whereby energy-dispersive analysers control the beam and stage movement of the scanning electron microscope in order to collect digital X-ray images and perform unattended point analysis over multiple locations.The Philips High-speed Analysis of X-rays system (PHAX-Scan) makes use of the high performance dual-processor structure of the EDAX PV9900 analyser and the databus structure of the Philips series 500 scanning electron microscope to provide a highly automated, user-friendly and extremely fast microanalysis system. The software that runs on the hardware described above was specifically designed to provide the ultimate attainable speed on the system.

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Characterizing Severely Plastically Deformed Materials Using Transmission Kikuchi Diffraction and Energy Dispersive X-ray Spectroscopy in the Scanning Electron Microscope

Microscopy and Microanalysis ◽

10.1017/s143192761300545x ◽

2013 ◽

Vol 19 (S2) ◽

pp. 692-693

Author(s):

P. Trimby

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Energy Dispersive ◽

X Ray ◽

Scanning Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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Karakteristik Hasil Proses Nitridisasi Besi Tuang Nodular Temperatur 5500C pada Waktu Penahanan 2 Jam, 4 Jam, 6 Jam

JURNAL FLYWHEEL ◽

10.36040/flywheel.v12i1.3354 ◽

2021 ◽

Vol 12 (1) ◽

pp. 13-18

Author(s):

Wayan Sujana

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Energy Dispersive ◽

Fluidised Bed ◽

X Ray ◽

Scanning Electron

Nitridisasi merupakan suatu proses perlakuan panas termokimia yang dimana nitrogen dan amonia didifusikan kepermukaan material (ferro and non-ferro) pada temperatur 500-6000C sehingga membentuk pengerasan kulit akibat terbentuknya lapisan nitrida paduan pada permukaan. Namun pengerasan permukaan ditentukan oleh paduan dari material yang dilakukan proses nitridisasi.Tujuan Nitridisasi adalah untuk memperbaiki ketahanan aus, meningkatkan ketahanan lelah, dan memperbaiki ketahanan tehadap korosi. Proses nitidisasi ini juga dapat mengganti jenis perlakuan panas lain yang menekankan performance yang baik. Pada penelitian ini akan memanfaatkan besi cor nodular yanga akan diproses nitridisasi menggunakan fluidised bed furnace. Pada penelitian ini menggunakan pengujian distribusi kekerasan (metode vickers) untuk mengamati sejauh mana nitrogen berdifusi pada permukaan spesimen, dan pengamatan struktur mikro dengan scanning electron microscope, energy dispersive X-Ray spectroscopy (SEM-EDS).Penelitian ini akan memberikan informasi fenonema proses nitridisasi pada besi cor nodular sehingga mendapatkan suatu analisis yang sesuai dengan metode sehingga menghasilkan kualitas kekerasan permukaan yang baik.

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