Prospects for compositional imaging with the atom probe microscope

1992 ◽  
Vol 50 (2) ◽  
pp. 1616-1617
Author(s):  
T. F. Kelly ◽  
P. P. Camus ◽  
J. J. McCarthy ◽  
D. J. Larson ◽  
L. M. Holzman ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Compositional Analysis ◽  
Atom Probe ◽  
Atomic Scale ◽  
Probe Field ◽  
Acquisition Rate ◽  
3D Data ◽  
Probe Microscope ◽  
Position Sensitive ◽  
Field Ion Microscope

For the purposes of analytical characterization on the atomic scale, the ultimate instrument would identify every atom in a sample and determine its position with atomic-scale resolution. The recently developed positionsensitive atom probe (POSAP) comes as close as yet possible to this goal. This is the only experimental technique which can analyze the three-dimensional (3D) composition of a sample on a sub-nanometer scale.By adding a position-sensitive detector (PSD) to a conventional atom probe/field ion microscope, a 3D data structure with position-correlated compositional analysis is acquired. The 3D data are stored on a computer and may be examined for structural and compositional information at an atomic level. Note that, because it uses time-of-flight mass spectroscopy, all elements and their isotopes are detected in this way with equal proficiency. Usually, the evaporation rate is mediated by pulsing the field on the specimen. This approach, however, severely limits the data acquisition rate (about 1 atom per second) and mass resolution (about 1 part in 30).

Atom Probe Microscopy and its Future

1994 ◽  
Vol 332 ◽  
Author(s):  
T. F. Kelly ◽  
P. P. Camus ◽  
D. J. Larson ◽  
L. M. Holzman
Keyword(s):  
Materials Science ◽  
Three Dimensional ◽  
Atom Probe ◽  
Atomic Level ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Probe Field ◽  
Transmission Electron ◽  
Indispensable Tool ◽  
3D Information

ABSTRACTMuch of the current activity and excitement in materials science involves processing and understanding materials at the atomic scale. Accordingly, it is necessary for materials scientists to control and characterize materials at the atomic level. There are only a few microscopies that are capable of providing information about the structure of materials at the atomic level: the atom probe field ion microscope, the high resolution transmission electron microscope, and the scanning tunneling microscope. The three-dimensional atom probe (3DAP) determines the 3D location and elemental identity of each atom in a sample. It is the only technique that provides 3D information at the atomic scale.The origin and underlying concepts behind the 3DAP are described. Several examples of actual images from existing 3DAPs are shown with emphasis on nanometer-scale analysis. Current limitations of the technique and expected future developments in this form of microscopy are described. It is our opinion that 3D atomic-scale imaging will be an indispensable tool in materials science in the coming decades.

On the Physics of Anomalies of Boron Nanosegregation at Dislocations in FeAl

2019 ◽  
Vol 391 ◽  
pp. 246-250
Author(s):  
Yuriy S. Nechaev ◽  
Andreas Öchsner
Keyword(s):  
Mechanical Properties ◽  
Critical Analysis ◽  
Diffusion Processes ◽  
Three Dimensional ◽  
Atom Probe ◽  
Atomic Scale ◽  
Metallic Materials ◽  
Probe Field ◽  
Ion Microscopy ◽  
And Diffusion

We present results of the constructive critical analysis and interpretation of some recent studies (Blavette, Sauvage, Wilde and others) at the atomic scale (using three-dimensional atom-probe field-ion microscopy) of impurity nanosegregation at dislocations, including “Cottrell atmospheres”, and grain boundaries in deformed intermetallics and metallic materials, and their relevance to mechanical properties and diffusion processes.

Three-dimensional reconstruction of atomic-scale composition with the position-sensitive atom probe

1992 ◽  
Vol 50 (2) ◽  
pp. 1478-1479
Author(s):  
G.D.W. Smith ◽  
A. Cerezo ◽  
C.R.M. Grovenor ◽  
T.J. Godfrey ◽  
R.P. Setna
Keyword(s):  
Mass Spectrometer ◽  
Three Dimensional ◽  
Atom Probe ◽  
Atomic Scale ◽  
Single Atom ◽  
Small Aperture ◽  
Dimensional Reconstruction ◽  
Position Sensitive ◽  
Atom Level ◽  
Scale Composition

The combination of a field ion microscope with a time-of-flight mass spectrometer provides the capability for chemical microanalysis at the single atom level. Such an instrument is termed an Atom Probe. Conventionally, the connection between the microscope and the mass spectrometer is made via a small aperture hole in the imaging screen. This defines a region on the specimen, typically about 2nm across, from which the analysis is obtained. The disadvantage of this arrangement is that other regions of the specimen cannot be examined, as ions from all but the selected area strike the image screen and therefore do not pass into the mass spectrometer. In order to overcome this problem, we have developed a version of the Atom Probe which incorporates a wide-angle position sensitive detector system. This instrument, which we have termed the POSAP, is shown schematically in figure 1. Typically, the field of view in this instrument is about 20nm across. The number of ions collected per atom layer removed from the specimen surface is therefore approximately 5,000.

Mechanisms and Energetics of Surface Atomic Processes, an Atom-Probe Field Ion Microscope Study

1992 ◽  
Vol 295 ◽  
Author(s):  
Tien T. Tsong
Keyword(s):  
Dynamical Behavior ◽  
Atom Probe ◽  
Solid Surfaces ◽  
Atomic Scale ◽  
High Tech ◽  
Composition Analysis ◽  
Atomic Processes ◽  
Probe Field ◽  
Atomic Image ◽  
Field Ion Microscope

AbstractAtom-probe field ion microscopy is capable of imaging solid surfaces with atomic resolution, and at the same time chemically analyzing atoms selected by the observer from the atomic image. The samples are restricted to those having a tip shape, but in many cases this is no longer a drawback since structures in high-tech materials are reducing in size to that comparable to or smaller than the field ion emitter tip. This technique is finding many applications in different areas. Our recent applications of this technique to the study of the dynamical behavior of surfaces and surface atoms and their mechanisms and energetics, and the atomic scale chemical and composition analysis will be briefly described.

Atom probes of the future

1994 ◽  
Vol 52 ◽  
pp. 834-835
Author(s):  
T. F. Kelly ◽  
P. P. Camus ◽  
D. J. Larson ◽  
L. M. Holzman
Keyword(s):  
Three Dimensional ◽  
Atom Probe ◽  
Atomic Scale ◽  
3D Images ◽  
New Era ◽  
Atom Probes ◽  
Position Sensitive ◽  
Third Dimension ◽  
Position Sensitive Detectors ◽  
Very High

Atom probe microscopy, which is based on the first ever atomic-scale imaging technique, field ion microscopy (FIM), has entered a new era in its development. Three-dimensional atom probes (3DAP) are now operating which produce 3D images with atomic scale resolution. It appears that the technology will soon be at hand to make 3DAPs do everything that their predecessor, the conventional atom probe, now does and also reach the third dimension. These microscopes will be simpler, smaller, faster, and much more powerful than the conventional atom probe. Several developments are responsible for this suggestion. 1) Rapid pulsing schemes are being developed which will make it possible to achieve on the order of 106 pulses per second. 2) Highspeed position-sensitive detectors (PSDs) have been designed which can detect several ions in a givenpulse with very high precision. 3) New specimen geometries will soon become possible which will revolutionize the atom probe. Let us consider the ramifications of each of these developments in turn.

Recent developments in position-sensitive atom-probe microanalysis

1994 ◽  
Vol 52 ◽  
pp. 828-829
Author(s):  
G. D. W. Smith ◽  
A. Cerezo ◽  
T. J. Godfrey ◽  
R. Setna ◽  
J. M. Hyde ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Atom Probe ◽  
Atomic Scale ◽  
Three Dimensions ◽  
Single Atom ◽  
Position Sensing ◽  
Recent Developments ◽  
Position Sensitive ◽  
New Generation ◽  
Serial Mode

The difficulties associated with the aperture geometry of the conventional atom probe have been overcome by the introduction of a new generation of wide-angle, single-atom sensitivity, positionsensitive detectors. With the aid of such detectors, it is now possible to map the locations and identitiesof atoms over regions of solid surface up to 50 nm in diameter. The nanometer-scale chemistry of successive atomic layers can be investigated during the process of field evaporation. We therefore have the new and exciting ability to investigate the atomic-scale chemistry of solids in three dimensions. The first three-dimensional atom probe is the PoSAP (Position Sensitive Atom Probe), developed at Oxford by Cerezo and Smith. In this instrument, position sensing is carried out by means of a wedge-and-strip anode assembly, located directly behind the double microchannel plate used for primary ion detection and time of flight measurement. The detector readout functions in serial mode. Only one ioncan be successfully detected and identified for each evaporation pulse which is applied to the specimen

Mechanisms and Energetics of Surface Atomic Processes, an Atom-Probe Field ion Microscope Study

1992 ◽  
Vol 280 ◽  
Author(s):  
Tien T. Tsong
Keyword(s):  
Dynamical Behavior ◽  
Atom Probe ◽  
Solid Surfaces ◽  
Atomic Scale ◽  
High Tech ◽  
Composition Analysis ◽  
Atomic Processes ◽  
Probe Field ◽  
Atomic Image ◽  
Field Ion Microscope

ABSTRACTAtom-probe field ion microscopy is capable of imaging solid surfaces with atomic resolution, and at the same time chemically analyzing atoms selected by the observer from the atomic image. The samples are restricted to those having a tip shape, but in many cases this is no longer a drawback since structures in high-tech materials are reducing in size to that comparable to or smaller than the field ion emitter tip. This technique is finding many applications in different areas. Our recent applications of this technique to the study of the dynamical behavior of surfaces and surface atoms and their mechanisms and energetics, and the atomic scale chemical and composition analysis will be briefly described.

Progress in the Atomic-Scale Analysis of Materials with the Three-Dimensional Atom Probe

MRS Bulletin ◽  
2001 ◽  
Vol 26 (2) ◽  
pp. 102-107 ◽  
Author(s):  
A. Cerezo ◽  
D. J. Larson ◽  
G. D. W. Smith
Keyword(s):  
Three Dimensional ◽  
Atom Probe ◽  
Atomic Scale ◽  
Single Atoms ◽  
Flight Mass Spectrometry ◽  
Atom Probes ◽  
Distribution Of Elements ◽  
The Subject ◽  
The Individual ◽  
Field Ion Microscope

Exactly 50 years ago, E.W. Müller became the first person to observe single atoms, with the aid of the field-ion microscope (FIM). In 1967, with John Panitz and S. Brooks McLane, Müller's invention of the atom probe meant that, in his words, “We can now really deal much more intimately with the individual atoms which we encounter, since we know their names.” By combining position-sensitive detection with the time-of-flight mass spectrometry of single atoms in the atom probe, Cerezo and co-workers in the late 1980s built an instrument capable of reconstructing the three-dimensional (3D) atomic distribution of elements present in a material. The instruments that are capable of microanalysis at this level, called generically 3D atom probes (3DAPs), were the subject of two articles published in MRS Bulletin in 1994. In this article, we review some of the progress in the field since that time, in particular, the expansion of the range of materials problems that can be addressed by this powerful technique.

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