Near-field plasmon-resonance scanning microscopy
In the past few years the field of near-field scanning optical microscopy (NSOM) has developed rapidly with applications spanning all the physical sciences. A key goal of this form of microscopy is to obtain resolution at levels well beyond those possible with the usual far-field optics. In contrast to far-field optics, which is bounded by the well known limits imposed by diffraction, near-field optics has no "in principle" fundamental lower limit in lateral size, at least down to atomic dimensions, although in practice, signal-to-noise considerations may restrict the application of NSOM to a few nanometers.The simplest form of NSOM to visualize is based on the principle of a sub-wavelength aperture (with D/λ < < 1) in an opaque plane. Light impinging on this aperture may only be transmitted through the diameter D, and, indeed, were it observed in the far-field, would be spread out over the entire half space due to diffraction. However, if the sample to be studied is placed in the near-field of the aperture, say within a distance D away, the region illuminated will also be restricted to a lateral dimension very close to D.