Applications of atom-probe field-ion microscopy to the study of interfaces

1993 ◽  
Vol 51 ◽  
pp. 862-863
Author(s):  
M.G. Burke ◽  
M.K. Miller
Keyword(s):  
Analytical Electron Microscopy ◽  
Atom Probe ◽  
Pressure Vessels ◽  
Low Alloy Steels ◽  
Probe Field ◽  
Microchemical Analysis ◽  
Elemental Sensitivity ◽  
Alloy Steels ◽  
Field Ion Microscope ◽  
Microstructural Studies

The near-atomic resolution and elemental sensitivity of the atom probe field-ion microscope (APFIM) permit the detailed microstructural and microchemical analysis of phases and interfaces in a variety of materials. To overcome the limitation of this technique in terms of volume of material sampled, it is frequently necessary to perform complementary microstructural studies by other techniques such as analytical electron microscopy (AEM) or auger electron spectroscopy (AES). With such complementary data, the microstructural significance of the APFIM data can be exploited. In addition to specifically evaluating segregation at interfaces, the high spatial resolution of the APFIM technique can be used to determine microcompositional fluctuations in the vicinity of interfaces. In this overview, some selected examples illustrating the application of the APFIM technique to the evaluation of segregation to interfaces are presented.Considerable research has been performed on low alloy steels, particularly those such as A533B which are used in the pressure vessels of nuclear reactors.

A combined AEM/APFIM characterization of alloy X-750

1992 ◽  
Vol 50 (1) ◽  
pp. 174-175
Author(s):  
M.G. Burke ◽  
M.K. Miller
Keyword(s):  
Mechanical Properties ◽  
Analytical Electron Microscopy ◽  
Atom Probe ◽  
Alloy Development ◽  
Probe Field ◽  
Surrounding Matrix ◽  
The Matrix ◽  
Size And Morphology ◽  
Field Ion Microscope

In the development of advanced alloys for power system applications, the primary emphasis is placed on attaining specific mechanical properties with resistance to environmental attack. An important part of alloy development is the detailed characterization of the microstructure, because it is the composition, size and morphology of the microstructural features that define the mechanical properties of the material. The good mechanical properties of Ni-base superalloys are a result of the formation of fine coherent precipitates. In addition, other coarser phases may form which can degrade the properties of the alloys. Analytical electron microscopy (AEM) provides important information concerning the type and distribution of the phases in the alloys, but quantitative microchemical analysis of the ultra-fine precipitates is not readily obtainable with conventional AEM techniques. The high spatial resolution of the atom probe field-ion microscope (APFIM) makes this technique ideally suited to the analysis of the ultra-fine precipitates and surrounding matrix. The analysis of the matrix is particularly important in predicting the subsequent ageing response of the alloy, as previously shown in a detailed AEM/APFIM examination of Alloy 718. In this paper, a combined AEM/APFIM study of precipitation in Alloy X-750 is presented.

Fabrication and characterization - by High Resolution Electron Microscopy and atom probe microanalysis - of Co-based metallic multilayer films

1990 ◽  
Vol 48 (4) ◽  
pp. 772-773
Author(s):  
Amanda K. Petford-Long ◽  
A. Cerezo ◽  
M.G. Hetherington
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
High Resolution Electron Microscopy ◽  
Atom Probe ◽  
Multilayer Films ◽  
Interface Roughness ◽  
Probe Field ◽  
Resolution Electron ◽  
Potential Applications ◽  
Field Ion Microscope

The fabrication of multilayer films (MLF) with layer thicknesses down to one monolayer has led to the development of materials with unique properties not found in bulk materials. The properties of interest depend critically on the structure and composition of the films, with the interfacial regions between the layers being of particular importance. There are a number of magnetic MLF systems based on Co, several of which have potential applications as perpendicular magnetic (e.g Co/Cr) or magneto-optic (e.g. Co/Pt) recording media. Of particular concern are the effects of parameters such as crystallographic texture and interface roughness, which are determined by the fabrication conditions, on magnetic properties and structure.In this study we have fabricated Co-based MLF by UHV thermal evaporation in the prechamber of an atom probe field-ion microscope (AP). The multilayers were deposited simultaneously onto cobalt field-ion specimens (for AP and position-sensitive atom probe (POSAP) microanalysis without exposure to atmosphere) and onto the flat (001) surface of oxidised silicon wafers (for subsequent study in cross-section using high-resolution electron microscopy (HREM) in a JEOL 4000EX. Deposi-tion was from W filaments loaded with material in the form of wire (Co, Fe, Ni, Pt and Au) or flakes (Cr). The base pressure in the chamber was around 8×10−8 torr during deposition with a typical deposition rate of 0.05 - 0.2nm/s.

scholarly journals Atomic Level Characterization of the Morphology of Phases in Chromindur Magnetic Alloys

1991 ◽  
Vol 232 ◽  
Author(s):  
M. K Miller ◽  
P. P. Camus ◽  
M. G. Hetherington
Keyword(s):  
Atom Probe ◽  
Heat Treatments ◽  
Miscibility Gap ◽  
Probe Field ◽  
Magnet Alloy ◽  
Two Phases ◽  
Isothermal Heat Treatments ◽  
Field Ion Microscope ◽  
Permanent Magnet Alloy

ABSTRACTThe atom probe field ion microscope has been used to characterize the morphology and determine the compositions of the iron-rich a and chromium-enriched α′ phases produced during isothermal and step cooled heat treatments in a Chromindur II ductile permanent magnet alloy. The good magnetic properties of this material are due to a combination of the composition of the two phases and the isolated nature and size of the ferromagnetic a phase. The morphology of the a phase is produced as a result of the shape of the miscibility gap and the step-cooled heat treatment and is distinctly different from that formed during isothermal heat treatments.

Atom probe field ion microscope studies of palladium silicide on silicon

1995 ◽  
Vol 87-88 ◽  
pp. 279-283
Author(s):  
R.A. King ◽  
R.A.D. Mackenzie ◽  
G.D.W. Smith ◽  
N.A. Cade
Keyword(s):  
Atom Probe ◽  
Probe Field ◽  
Palladium Silicide ◽  
Field Ion Microscope
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