STEM of order and dynamics in novel magnetic materials

1993 ◽  
Vol 51 ◽  
pp. 1026-1027
Author(s):  
Marian Mankos ◽  
J.M. Cowley ◽  
R.V. Chamberlin ◽  
M. Scheinfein ◽  
J.D. Ayers
Keyword(s):  
Magnetic Field ◽  
Magnetic Structure ◽  
Phase Contrast ◽  
Domain Walls ◽  
Detection System ◽  
Magnetic Ordering ◽  
Dark Field ◽  
Objective Lens ◽  
Lorentz Microscopy ◽  
Differential Phase Contrast

The new detection system of the HB5 STEM enables the operation of the microscope in a variety of modes. If the specimen is placed inside the objective lens, high resolution bright and dark field images revealing the microstructure can be obtained. Since the specimen is located in a high magnetic field, magnetic ordering phenomena are disturbed and no magnetic structure contrast is observed. In the out-of-field position, magnetic structure may be revealed in the Fresnel and Differential Phase Contrast modes of Lorentz Microscopy. Fresnel images are obtained with a static beam, i.e. the scanning coils are not excited. In the Fresnel mode the objective lens focus is changed slightly and domain walls appear in the shadow image as dark and bright lines, switching contrast when the objective lens is changed between overfocussing and underfocussing. Electrons, passing through the sample, are deflected by the Lorentz force and appear to converge towards or diverge from the domain walls.

User Access to Lorentz Microscopy at the NCEM, LBNL, Berkeley.

1998 ◽  
Vol 4 (S2) ◽  
pp. 472-473
Author(s):  
K. Verbist ◽  
C. Nelson ◽  
K. Krishnan
Keyword(s):  
Electron Microscope ◽  
Phase Contrast ◽  
Limited Range ◽  
Objective Lens ◽  
Image Filter ◽  
Lorentz Microscopy ◽  
Differential Phase ◽  
Free Sample ◽  
User Access ◽  
Differential Phase Contrast

A standard Philips CM200FEG electron microscope, without the special Lorentz lens, has been optimized for Lorentz imaging. The necessary field-free sample region is obtained by switching off the objective lens in the free lens mode. The limited range of magnification is compensated for by a post-column Gatan image filter (GIF) which magnifies by a factor of _ 20. Fresnel imaging is performed by defocusing with the diffraction lens. The use of low angle diffraction, in combination with the apertures located at the selected area aperture plane, allow Foucault imaging. The TEM analog of differential phase contrast (DPC) imaging has been implemented. This method makes it possible to obtain quantitave induction maps of the in-plane magnetization. TEM DPC is based on a series of Foucault images, recorded with different incremental beam tilts, which are processed to yield images equivalent to the quadrant signals obtained by the STEM DPC technique.

Temperature Dependence of Magnetic Domains and Wall Structures

1972 ◽  
Vol 30 ◽  
pp. 496-497
Author(s):  
Sonoko Tsukahara ◽  
Tadami Taoka ◽  
Hisao Nishizawa
Keyword(s):  
Temperature Dependence ◽  
Domain Walls ◽  
Magnetic Domain ◽  
Iron Film ◽  
Objective Lens ◽  
Lorentz Microscopy ◽  
Domain Structures ◽  
Wall Structures ◽  
Crystal Films ◽  
Metallurgical Structure

The high voltage Lorentz microscopy was successfully used to observe changes with temperature; of domain structures and metallurgical structures in an iron film set on the hot stage combined with a goniometer. The microscope used was the JEM-1000 EM which was operated with the objective lens current cut off to eliminate the magnetic field in the specimen position. Single crystal films with an (001) plane were prepared by the epitaxial growth of evaporated iron on a cleaved (001) plane of a rocksalt substrate. They had a uniform thickness from 1000 to 7000 Å.The figure shows the temperature dependence of magnetic domain structure with its corresponding deflection pattern and metallurgical structure observed in a 4500 Å iron film. In general, with increase of temperature, the straight domain walls decrease in their width (at 400°C), curve in an iregular shape (600°C) and then vanish (790°C). The ripple structures with cross-tie walls are observed below the Curie temperature.

Towards 1-Ångstrom-resolution STEM

1993 ◽  
Vol 51 ◽  
pp. 996-997
Author(s):  
H.S. von Harrach ◽  
D.E. Jesson ◽  
S.J. Pennycook
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
Phase Contrast ◽  
Spherical Aberration ◽  
A Priori ◽  
Dark Field ◽  
Image Resolution ◽  
Objective Lens ◽  
Annular Dark Field ◽  
First Results

Phase contrast TEM has been the leading technique for high resolution imaging of materials for many years, whilst STEM has been the principal method for high-resolution microanalysis. However, it was demonstrated many years ago that low angle dark-field STEM imaging is a priori capable of almost 50% higher point resolution than coherent bright-field imaging (i.e. phase contrast TEM or STEM). This advantage was not exploited until Pennycook developed the high-angle annular dark-field (ADF) technique which can provide an incoherent image showing both high image resolution and atomic number contrast.This paper describes the design and first results of a 300kV field-emission STEM (VG Microscopes HB603U) which has improved ADF STEM image resolution towards the 1 angstrom target. The instrument uses a cold field-emission gun, generating a 300 kV beam of up to 1 μA from an 11-stage accelerator. The beam is focussed on to the specimen by two condensers and a condenser-objective lens with a spherical aberration coefficient of 1.0 mm.

Interaction of Tops of Domains in Metal Nano of the Film

2019 ◽  
Vol 945 ◽  
pp. 771-775 ◽  
Author(s):  
V.P. Panaetov ◽  
Denis B. Solovev
Keyword(s):  
Magnetic Field ◽  
Experimental Data ◽  
Film Thickness ◽  
Magnetic Structure ◽  
Domain Walls ◽  
Magnetic Moments ◽  
Ferromagnetic Film ◽  
Easy Magnetization ◽  
Electron Transmission ◽  
Transmission Microscope

Ferromagnetic film can be a matrix for recording information with the help of magnetic moments of electrons. The study of the processes of changing the magnetic structure in an electron-transmission microscope makes it possible to investigate micro magnetic phenomena. In this paper, we investigate the interaction between the vertices of neighboring regions. It is shown how the magnetic structure of the vertices of the domains changes as they approach each other with the help of an increasing constant magnetic field applied along the axis of easy magnetization. The distance was measured between the vertices of the domains. The schemes of distribution of the magnetization vectors between interacting vertices are shown. These schemes are made from experimental images of the magnetic structure. The distances between domain vertices and domain walls were compared on the basis of experimental data. The film thickness is 50 nm; the structure is Ni0.83-Fe0.17. The films were obtained by the method proposed by us. From the experimental results it follows that the interaction of the domain walls is observed at a distance of 20 microns and the interaction of the domain vertices is manifested at a distance of 100 μm.

Calculations of Z-Contrast for organic and biological specimens

1983 ◽  
Vol 41 ◽  
pp. 284-285
Author(s):  
R.F. Egerton ◽  
M. Misra
Keyword(s):  
Atomic Number ◽  
Cross Sections ◽  
Phase Contrast ◽  
Detection System ◽  
Dark Field ◽  
Single Atom ◽  
Bright Field ◽  
Annular Dark Field ◽  
Z Contrast ◽  
Increasing Function

So-called "atomic-number contrast" is obtained in STEM by displaying a ratio signal formed by dividing the annular-dark-field signal Iad by the inelastic component Ii of the bright-field intensity (isolated by means of an electron spectrometer; see Fig. 1). Originally used for single-atom imaging, the technique has more recently been applied to polymer samples and biological tissue.We report here estimates of the ratio signal from organic specimens, based on the following assumptions:(1) That the specimen is amorphous and that phase contrast may be neglected for the electron-optical conditions and specimen features being considered; (2) That atomic cross sections may be used to estimate the amount of elastic and inelastic scattering. Modern calculations differ from simple Lenz theory in predicting that the cross section is not a smoothly-increasing function of atomic number (see Fig. 2), particularly for the 1ighter elements. (3) We assume a slightly idealized detection system in which all elastically scattered electrons contribute to Iad, while all electrons which have been inelastically (but not elastically) scattered contribute to Ii.

Observation of Ferrimagnetic Domain Walls in CoFe2O4 With A High Voltage T.E.M.

1973 ◽  
Vol 31 ◽  
pp. 26-27
Author(s):  
L. C. De Jonghe
Keyword(s):  
Domain Wall ◽  
Ceramic Material ◽  
High Voltage ◽  
Domain Walls ◽  
Magnetic Ordering ◽  
Objective Lens ◽  
Spinel Type ◽  
Equal Energy ◽  
Cobalt Ferrites ◽  
Regular Position

Cobalt ferrites are ferrimagnetic oxides of the spinel type, exhibiting magnetic ordering along <100>. Ferrimagnetic domain walls have been observed in this ceramic material with the specimens in the regular position. Even though the field of the objective lens is quite high ∼7 k gauss) domain walls may be observed if the specimens are symmetrically oriented with respect to the field direction of the objective lens, so that adjacent domains have approximately equal energy. Ill are such orientations for cobalt ferrites. Under these conditions, only ╥/2 domain walls are expected. Such ╥/2 ferrimagnetic domain walls are shown in Fig. 1. Since magnetostriction accompanies magnetic ordering, the domain wall boundaries are also coherent twin boundaries which can be imaged with the specimen in focus.

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