A quantitative X-ray powder diffraction analysis of the Li2O–SiO2glass–ceramic system

1993 ◽  
Vol 8 (1) ◽  
pp. 29-35 ◽  
Author(s):  
D. W. Tomlin ◽  
D. B. Sullenger ◽  
J. S. Cantrell
Keyword(s):  
Quantitative Analysis ◽  
Diffraction Analysis ◽  
Powder Diffraction ◽  
Intensity Ratio ◽  
Glass Ceramics ◽  
Ceramic System ◽  
Crystalline Phases ◽  
X Ray ◽  
Content Ratio ◽  
External Standard

An X-ray powder diffraction quantitative analysis has been developed to determine the relative amounts of the principal crystalline phases (α-Li2SiO3,α-Li2Si2O5and theα-cristobalite form of SiO2) contained in selected Li2O–SiO2glass-ceramics. The analysis was extended to estimate the amorphous-to-crystalline content ratio of individual samples. The method utilized is an external-standard intensity ratio technique that employs cristobalite, a component common to each sample, for a standard.

scholarly journals Use of Full Diffraction Spectra, Both Experimental and Calculated, in Quantitative Powder Diffraction Analysis

1988 ◽  
Vol 41 (2) ◽  
pp. 311 ◽  
Author(s):  
Deane K Smith ◽  
Gerald G Johnson Jr ◽  
Andrew M Wims
Keyword(s):  
Phase Composition ◽  
Quantitative Analysis ◽  
Diffraction Analysis ◽  
Data Base ◽  
Powder Diffraction ◽  
Intensity Ratio ◽  
Ratio Method ◽  
Peak Overlap ◽  
Low Levels ◽  
Best Fit

The use of the full powder diffraction trace over a selected diffraction range for quantitative analysis has advantages over using single peaks in that it compensates for the effects of peak overlap and low levels of preferred orientation. Using a data base composed of experimental and calculated traces, the phase composition of an unknown may be determined by determining the least-squares best-fit sum of the appropriate data base patterns to the pattern of the unknown. Weight fractions are calculated from the pattern weighting factors using the reference-intensity-ratio method.

Experimental and Calculated Standards For Quantitative Analysis by Powder Diffraction

1976 ◽  
Vol 20 ◽  
pp. 27-39 ◽  
Author(s):  
C. R. Hubbard ◽  
D. K. Smith
Keyword(s):  
Quantitative Analysis ◽  
Reference Material ◽  
Powder Diffraction ◽  
Intensity Ratio ◽  
Data Gathering ◽  
Measured Data ◽  
Diffraction Maximum ◽  
X Ray ◽  
Computer Controlled ◽  
Suitable Reference

Quantitative analysis by x-ray powder diffraction methods has become increasingly important in recent years with the availability of computer-controlled automatic powder diffractometers. All data gathering techniques require suitable reference standards to scale the measured data properly. One means of achieving this scaling is through the reference Intensity ratio which is defined as the intensity ratio of the strongest diffraction maximum of a substance to the strongest maximum of a reference material in a 1:1 mixture “by weight. These ratios may he measured or they may he calculated if the crystal structures of the materials are accurately known.

X-RAY POWDER DIFFRACTION ANALYSIS OF SOIL SAMPLES FROM THE NAVESINK FORMATION IN MONMOUTH COUNTY, NEW JERSEY

2020 ◽  
Author(s):  
Miranda Maliszka ◽  
◽  
Sabrina Sobel ◽  
Anthony Johnson ◽  
Dennis Radcliffe
Keyword(s):  
New Jersey ◽  
Diffraction Analysis ◽  
Powder Diffraction ◽  
Soil Samples ◽  
X Ray ◽  
Monmouth County

Two examples of quantitative analysis by simulated X-ray powder diffraction patterns

Clay Minerals ◽  
1982 ◽  
Vol 17 (4) ◽  
pp. 393-399
Author(s):  
C. E. Corbato ◽  
R. T. Tettenhorst
Keyword(s):  
Quantitative Analysis ◽  
Pattern Matching ◽  
Powder Diffraction ◽  
X Ray ◽  
Quantitative Estimates ◽  
Powder Diffractometer ◽  
Alternative Method ◽  
Two Samples ◽  
Natural Mixture ◽  
Diffraction Patterns

AbstractQuantitative estimates were made by visually matching computer-simulated with experimental X-ray powder diffractometer patterns for two samples. One was a natural mixture of dickite and nacrite in about equal proportions. The second sample contained mostly quartz with corundum and mullite in small (0.5–1%) amounts. Percentages deduced from pattern matching agreed to within ±10% of the weight fractions of the components determined by an alternative method of analysis.

Synthesis and X-ray powder diffraction analysis of high-Tcsuperconducting Bi1.6Pb0.4SrxCa2Cu3Odeltasystems with x=1 and 2

1993 ◽  
Vol 6 (11) ◽  
pp. 803-806 ◽  
Author(s):  
A A Qidwai ◽  
M Humayun ◽  
M W Akhtar ◽  
D Ahmad ◽  
A Saghir
Keyword(s):  
Diffraction Analysis ◽  
Powder Diffraction ◽  
X Ray
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