Introduction to a Special Issue on Electron Backscatter Diffraction

Arguably one of the most significant microscopy techniques of the past decade, electron backscatter diffraction (EBSD) has provided scientists and engineers with tremendous insight into the structure of crystalline materials. What started with basic observations of electron diffraction in the middle of the 20th century has grown into a mature technology that bridges the gap between the macro and micro length scales. EBSD has found a home in both the materials science and geological communities characterizing crystallographic texture and preferred orientations, residual strain, grain boundary character and networks, and identifying constituent phases. Advancements in computational power, camera technology, indexing algorithms, sample preparation, and dynamical simulations have made this possible.

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Electron Backscatter Diffraction in Materials Science

10.1007/978-1-4757-3205-4 ◽

2000 ◽

Cited By ~ 239

Keyword(s):

Materials Science ◽

Electron Backscatter Diffraction ◽

Electron Backscatter ◽

Backscatter Diffraction

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Crystallographic correlation between 5M and 7M martensite in an Ni–Mn–Ga alloy

Journal of Applied Crystallography ◽

10.1107/s1600576716002223 ◽

2016 ◽

Vol 49 (2) ◽

pp. 507-512

Author(s):

Zongbin Li ◽

Zhenzhuang Li ◽

Bo Yang ◽

Yudong Zhang ◽

Claude Esling ◽

...

Keyword(s):

Lattice Distortion ◽

Electron Backscatter Diffraction ◽

Deep Insight ◽

Ferromagnetic Shape Memory Alloys ◽

Electron Backscatter ◽

Ferromagnetic Shape Memory ◽

Backscatter Diffraction ◽

Orientation Determination ◽

Specific Orientation ◽

Insight Into

In Ni–Mn–Ga ferromagnetic shape memory alloys, a structural transformation from one type of martensite to another is frequently observed upon cooling or heating. In this work, the microstructural features associated with the transformation from 5M to 7M martensite in an Ni50Mn26Ga22Cu2 alloy were studied. On the basis of the crystallographic orientation determination and an examination of the microstructure by means of the electron backscatter diffraction technique, the 5M to 7M transformation was found to be accompanied by the thickening of martensite plates. The two kinds of martensite (5M and 7M) possess a specific orientation relationship with (001)5M//(001)7M and [100]5M//[100]7M. Through further lattice distortion, four types of 5M variant can evolve into four 7M martensite variants in one variant colony. The present study is expected to provide a deep insight into the crystallographic correlation between 5M and 7M martensite in Ni–Mn–Ga alloys.

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Dark-field imaging based on post-processed electron backscatter diffraction patterns of bulk crystalline materials in a scanning electron microscope

Ultramicroscopy ◽

10.1016/j.ultramic.2014.09.005 ◽

2015 ◽

Vol 148 ◽

pp. 123-131 ◽

Cited By ~ 13

Author(s):

Nicolas Brodusch ◽

Hendrix Demers ◽

Raynald Gauvin

Keyword(s):

Electron Microscope ◽

Electron Backscatter Diffraction ◽

Dark Field ◽

Crystalline Materials ◽

Dark Field Imaging ◽

Electron Backscatter ◽

Diffraction Patterns ◽

Backscatter Diffraction ◽

Field Imaging ◽

Scanning Electron

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A Review of Strain Analysis Using Electron Backscatter Diffraction

Microscopy and Microanalysis ◽

10.1017/s1431927611000055 ◽

2011 ◽

Vol 17 (3) ◽

pp. 316-329 ◽

Cited By ~ 543

Author(s):

Stuart I. Wright ◽

Matthew M. Nowell ◽

David P. Field

Keyword(s):

Plastic Strain ◽

Materials Science ◽

Electron Backscatter Diffraction ◽

Strain Analysis ◽

Current State ◽

Mapping Parameters ◽

Submicron Scale ◽

Electron Backscatter ◽

Ebsd Technique ◽

Backscatter Diffraction

AbstractSince the automation of the electron backscatter diffraction (EBSD) technique, EBSD systems have become commonplace in microscopy facilities within materials science and geology research laboratories around the world. The acceptance of the technique is primarily due to the capability of EBSD to aid the research scientist in understanding the crystallographic aspects of microstructure. There has been considerable interest in using EBSD to quantify strain at the submicron scale. To apply EBSD to the characterization of strain, it is important to understand what is practically possible and the underlying assumptions and limitations. This work reviews the current state of technology in terms of strain analysis using EBSD. First, the effects of both elastic and plastic strain on individual EBSD patterns will be considered. Second, the use of EBSD maps for characterizing plastic strain will be explored. Both the potential of the technique and its limitations will be discussed along with the sensitivity of various calculation and mapping parameters.

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Electron Backscatter Diffraction In The Sem: Is Electron Diffraction In The Tem Obsolete?

Microscopy and Microanalysis ◽

10.1017/s1431927600011284 ◽

1997 ◽

Vol 3 (S2) ◽

pp. 879-880

Author(s):

J. R. Michael ◽

M. E. Schlienger ◽

R. P. Goehner

Keyword(s):

Electron Beam ◽

Materials Science ◽

Electron Backscatter Diffraction ◽

Polycrystalline Sample ◽

Interesting Application ◽

Electron Backscatter ◽

Backscatter Diffraction ◽

Over 40 Years ◽

Stationary Electron ◽

Scanning Electron

The technique of electron backscatter diffraction (EBSD) in the scanning electron microscope is currently finding a large number of important applications in materials science. The patterns formed through EBSD were first studied over 40 years ago. It has only been in the last 10 years that the technique has really begun to have an impact on the study of materials. The introduction of automatic pattern indexing software has enabled the technique to be used for mapping the orientation of a polycrystalline sample. The more exciting and universally interesting application of the technique has been the identification of micron and sub-micron sized crystalline phases based on their chemistry and crystallography determined by EBSD.EBSD is obtained by illuminating a highly tilted sample (>45° from horizontal) with a stationary electron beam. Electrons backscattered from the sample may satisfy the condition for channeling and will produce images that contain bands of increased and decreased intensity that are equivalent to electron channeling patterns.

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