scholarly journals Quantitative Annular Dark-Field Imaging at Atomic Resolution

2016 ◽  
Vol 22 (S3) ◽  
pp. 304-305
Author(s):  
Shunsuke Yamashita ◽  
Shogo Koshiya ◽  
Kazuo Ishizuka ◽  
Koji Kimoto
Keyword(s):  
Dark Field ◽  
Atomic Resolution ◽  
Dark Field Imaging ◽  
Annular Dark Field ◽  
Field Imaging

Influence of spatial and temporal coherences on atomic resolution high angle annular dark field imaging

2016 ◽  
Vol 169 ◽  
pp. 1-10 ◽  
Author(s):  
Andreas Beyer ◽  
Jürgen Belz ◽  
Nikolai Knaub ◽  
Kakhaber Jandieri ◽  
Kerstin Volz
Keyword(s):  
Dark Field ◽  
Atomic Resolution ◽  
High Angle ◽  
Dark Field Imaging ◽  
Annular Dark Field ◽  
Field Imaging

scholarly journals Quantitative annular dark-field imaging at atomic resolution

2016 ◽  
pp. 503-504
Author(s):  
Shunsuke Yamashita ◽  
Shogo Koshiya ◽  
Kazuo Ishizuka ◽  
Koji Kimoto
Keyword(s):  
Dark Field ◽  
Atomic Resolution ◽  
Dark Field Imaging ◽  
Annular Dark Field ◽  
Field Imaging

scholarly journals Quantitative annular dark-field imaging of single-layer graphene—II: atomic-resolution image contrast

Microscopy ◽  
2015 ◽  
Vol 64 (6) ◽  
pp. 409-418 ◽  
Author(s):  
Shunsuke Yamashita ◽  
Shogo Koshiya ◽  
Takuro Nagai ◽  
Jun Kikkawa ◽  
Kazuo Ishizuka ◽  
...  
Keyword(s):  
Single Layer ◽  
Dark Field ◽  
Image Contrast ◽  
Atomic Resolution ◽  
Single Layer Graphene ◽  
Resolution Image ◽  
Layer Graphene ◽  
Dark Field Imaging ◽  
Annular Dark Field ◽  
Field Imaging

3d Reconstruction of Sub-Nm Beam Profiles in STEM

2001 ◽  
Vol 7 (S2) ◽  
pp. 344-345
Author(s):  
G. Möbus ◽  
R.E. Dunin-Borkowski ◽  
C.J.D. Hethėrington ◽  
J.L. Hutchison
Keyword(s):  
Electron Beam ◽  
Chemical Analysis ◽  
Energy Loss ◽  
Intensity Distribution ◽  
Dark Field ◽  
Beam Forming ◽  
Dark Field Imaging ◽  
Annular Dark Field ◽  
Electron Energy Loss ◽  
Field Imaging

Introduction:Atomically resolved chemical analysis using techniques such as electron energy loss spectroscopy and annular dark field imaging relies on the ability to form a well-characterised sub-nm electron beam in a FEGTEM/STEM [1-2]. to understand EELS+EDX-signal formation upon propagation of a sub-nm beam through materials we first have to assess precisely the beam intensity distribution in vacuum and find conditions for the best obtainable resolution.Experimental Details:Modern TEM/STEM instruments combine features of both imaging and scanning technology. The beam forming capability approaches closely that for dedicated STEMs, while CCD recording devices allow us to measure the beam profile by direct imaging at magnifications up to 1.5 M. The recording of a “z-section” series through the 3D intensity distribution of the cross-over can therefore be realised by recording of a “condenser focal series”.

scholarly journals Annular Dark Field Imaging of Catalyst Nanoparticles in Single Shot Dynamic Transmission Electron Microscopy

2009 ◽  
Vol 15 (S2) ◽  
pp. 1082-1083
Author(s):  
D Masiel ◽  
B Reed ◽  
T LaGrange ◽  
ND Browning
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Dark Field ◽  
Single Shot ◽  
Catalyst Nanoparticles ◽  
Dark Field Imaging ◽  
Transmission Electron ◽  
Annular Dark Field ◽  
Field Imaging

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

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