Atomic resolution composition analysis by scanning transmission electron microscopy high-angle annular dark-field imaging

2003 ◽  
Vol 83 (4) ◽  
pp. 662-664 ◽  
Author(s):  
E. Carlino ◽  
S. Modesti ◽  
D. Furlanetto ◽  
M. Piccin ◽  
S. Rubini ◽  
...  
Keyword(s):  
Scanning Transmission Electron Microscopy ◽  
Dark Field ◽  
Atomic Resolution ◽  
Composition Analysis ◽  
High Angle ◽  
Dark Field Imaging ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Annular Dark Field ◽  
Field Imaging

scholarly journals Atomic Resolution Mapping Using Quantitative High-angle Annular Dark Field Scanning Transmission Electron Microscopy

2009 ◽  
Vol 15 (S2) ◽  
pp. 464-465 ◽  
Author(s):  
S Van Aert ◽  
J Verbeeck ◽  
S Bals ◽  
R Erni ◽  
D Van Dyck ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Dark Field ◽  
Atomic Resolution ◽  
High Angle ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Annular Dark Field ◽  
Resolution Mapping

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Influence of spatial and temporal coherences on atomic resolution high angle annular dark field imaging

2016 ◽  
Vol 169 ◽  
pp. 1-10 ◽  
Author(s):  
Andreas Beyer ◽  
Jürgen Belz ◽  
Nikolai Knaub ◽  
Kakhaber Jandieri ◽  
Kerstin Volz
Keyword(s):  
Dark Field ◽  
Atomic Resolution ◽  
High Angle ◽  
Dark Field Imaging ◽  
Annular Dark Field ◽  
Field Imaging
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