Monochromated Low-Dose Aberration-Corrected Transmission Electron Microscopy of Diamondoid Carbon Nanothreads

Low Dose ◽

Transmission Electron ◽

Atomic imaging in aberration-corrected high-resolution transmission electron microscopy

Ultramicroscopy ◽

10.1016/j.ultramic.2003.08.003 ◽

2004 ◽

Vol 98 (2-4) ◽

pp. 81-97 ◽

Cited By ~ 41

Author(s):

J.H Chen ◽

H.W Zandbergen ◽

D.Van Dyck

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Transmission Electron ◽

Atomic Resolution Characterization of Semiconductor Materials by Aberration-Corrected Transmission Electron Microscopy ☆

Reference Module in Materials Science and Materials Engineering ◽

10.1016/b978-0-12-803581-8.10405-9 ◽

2017 ◽

Author(s):

Klaus van Benthem ◽

Stephen John Pennycook ◽

Abu Zayed Mohammad Saliqur Rahman

Keyword(s):

Electron Microscopy ◽

Atomic Resolution ◽

Semiconductor Materials ◽

Transmission Electron ◽

Low-Dose Imaging Techniques for Transmission Electron Microscopy

The Transmission Electron Microscope ◽

10.5772/36614 ◽

2012 ◽

Cited By ~ 3

Author(s):

David B. ◽

James E.

Keyword(s):

Electron Microscopy ◽

Low Dose ◽

Imaging Techniques ◽

Transmission Electron ◽

Dose Imaging

Electrochemical Degradation of Pt–Ni Nanocatalysts: An Identical Location Aberration-Corrected Scanning Transmission Electron Microscopy Study

Nano Letters ◽

10.1021/acs.nanolett.8b03022 ◽

2018 ◽

Vol 19 (1) ◽

pp. 46-53 ◽

Cited By ~ 6

Author(s):

Somaye Rasouli ◽

Deborah Myers ◽

Nancy Kariuki ◽

Kenji Higashida ◽

Naotoshi Nakashima ◽

...

Keyword(s):

Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Electrochemical Degradation ◽

Transmission Electron Microscopy Study ◽

Transmission Electron ◽

Scanning Transmission ◽

Wavelet image analysis in aberration-corrected scanning transmission electron microscopy

Electron Microscopy and Analysis 2003 ◽

10.1201/9781482269130-84 ◽

2004 ◽

pp. 355-358

Keyword(s):

Electron Microscopy ◽

Image Analysis ◽

Transmission Electron ◽

Scanning Transmission ◽

Wavelet Image ◽

The Impact of Aberration-Corrected Transmission Electron Microscopy on Catalysis Investigations

Microscopy and Microanalysis ◽

10.1017/s1431927610053705 ◽

2010 ◽

Vol 16 (S2) ◽

pp. 122-123

Author(s):

P Specht ◽

R Gulotty ◽

D Barton ◽

R Cieslinski ◽

S Rozeveld ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron ◽

The Impact ◽

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Analysis of Point Defects in Graphene Using Low Dose Scanning Transmission Electron Microscopy Imaging and Maximum Likelihood Reconstruction (Phys. Status Solidi B 11/2017)

physica status solidi (b) ◽

10.1002/pssb.201770257 ◽

2017 ◽

Vol 254 (11) ◽

pp. 1770257

Author(s):

Christian Kramberger ◽

Andreas Mittelberger ◽

Christoph Hofer ◽

Jannik C. Meyer

Keyword(s):

Electron Microscopy ◽

Maximum Likelihood ◽

Point Defects ◽

Low Dose ◽

Microscopy Imaging ◽

Transmission Electron ◽

Scanning Transmission

Characterisation of InAs/GaAs short period superlattices using column ratio mapping in aberration-corrected scanning transmission electron microscopy

Micron ◽

10.1016/j.micron.2012.04.018 ◽

2012 ◽

Vol 43 (10) ◽

pp. 1068-1072 ◽

Cited By ~ 1

Author(s):

Paul D. Robb ◽

Michael Finnie ◽

Alan J. Craven

Keyword(s):

Electron Microscopy ◽

Transmission Electron ◽

Short Period ◽

Scanning Transmission ◽

Short Period Superlattices ◽

Advances in Imaging and Electron Physics - Advances in IMAGING AND ELECTRON PHYSICS - Aberration–Corrected Electron Microscopy ◽

Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy

10.1016/s1076-5670(08)01008-2 ◽

2008 ◽

pp. 283-325 ◽

Cited By ~ 3

Author(s):

Angus I. Kirkland ◽

Peter D. Nellist ◽

Lan-Yun Chang ◽

Sarah J. Haigh

Keyword(s):

Electron Microscopy ◽

Conventional Transmission Electron Microscopy ◽

Transmission Electron ◽

Scanning Transmission ◽

Quantification of point defects in high performance n-type and p-type CoSb3 thermoelectric alloys using aberration-corrected transmission electron microscopy

10.22443/rms.emc2020.800 ◽

2021 ◽

Author(s):

Lei Jin ◽

Keyword(s):

Electron Microscopy ◽

Point Defects ◽

High Performance ◽

Transmission Electron ◽

P Type ◽