Validation of Minimum Electron Beam Dosage on Characterization of Carbon-Depletion in ULK Dielectric Materials by EELS Quantifications

In a recent study of the superplastic forming (SPF) behavior of certain Al-Li-X alloys, the relative misorientation between adjacent (sub)grains proved to be an important parameter. It is well established that the most accurate way to determine misorientation across boundaries is by Kikuchi line analysis. However, the SPF study required the characterization of a large number of (sub)grains in each sample to be statistically meaningful, a very time-consuming task even for comparatively rapid Kikuchi analytical techniques.In order to circumvent this problem, an alternate, even more rapid in-situ Kikuchi technique was devised, eliminating the need for the developing of negatives and any subsequent measurements on photographic plates. All that is required is a double tilt low backlash goniometer capable of tilting ± 45° in one axis and ± 30° in the other axis. The procedure is as follows. While viewing the microscope screen, one merely tilts the specimen until a standard recognizable reference Kikuchi pattern is centered, making sure, at the same time, that the focused electron beam remains on the (sub)grain in question.

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Characterization of AA7075/AA5356 gradient transition zone in an electron beam wire-feed additive manufactured sample

Materials Characterization ◽

10.1016/j.matchar.2020.110867 ◽

2021 ◽

Vol 172 ◽

pp. 110867

Author(s):

V. Utyaganova ◽

A. Filippov ◽

S. Tarasov ◽

N. Shamarin ◽

D. Gurianov ◽

...

Keyword(s):

Electron Beam ◽

Transition Zone ◽

Feed Additive ◽

Wire Feed

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Characterization of Dielectric Materials by Sparse Signal Processing With Iterative Dictionary Updates

IEEE Sensors Letters ◽

10.1109/lsens.2020.3019924 ◽

2020 ◽

Vol 4 (9) ◽

pp. 1-4

Author(s):

Udaya S. K. P. Miriya Thanthrige ◽

Jan Barowski ◽

Ilona Rolfes ◽

Daniel Erni ◽

Thomas Kaiser ◽

...

Keyword(s):

Signal Processing ◽

Dielectric Materials ◽

Sparse Signal ◽

Sparse Signal Processing

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Dielectric Characterization of Polyceram Films

MRS Proceedings ◽

10.1557/proc-180-407 ◽

1990 ◽

Vol 180 ◽

Cited By ~ 3

Author(s):

G. Teowee ◽

J.M. Boulton ◽

H.H. Fox ◽

A. Koussa ◽

T. Gudgel ◽

...

Keyword(s):

Dielectric Constant ◽

Polyethylene Oxide ◽

Dielectric Materials ◽

Inorganic Materials ◽

Functionalized Polymers ◽

Multifunctional Materials ◽

Dielectric Characterization ◽

Silicon Alkoxides ◽

Tan Δ

ABSTRACTPolycerams are an emergent class of hybrid, multifunctional materials which combine the properties of organic and inorganic materials. Films have been prepared from silicon alkoxides and reactive, functionalized polymers such as triethoxysilyl modified polybutadiene (MPBD), (N-triethoxysilylpropyl)O polyethylene oxide urethane (MPEOU) and trimethoxysilylpropyl substituted polyethyleneimine (MPEI). Characterization of dielectric constant and tan δ of the films has been carried out over a range of frequency from 500 Hz to 100 kHz; and the results are used to consider the potential of Polycerams as dielectric materials.

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