scholarly journals High Resolution Imaging of Dislocations Using Weak Beam Dark Field STEM

2020 ◽  
Vol 26 (S2) ◽  
pp. 1220-1222
Author(s):  
Jiashi Miao
Author(s):  
J. E. Angelo ◽  
M. J. Mills

In order to measure the spacing of closely spaced dislocations, a method with sufficient spatial resolution must be used. High resolution imaging provides one method of determining the spacing of paired dislocations, but care must be taken since these authors have shown that thin film effects can give rise to structures not present in bulk materials. To date, the most widely used method of determining the spacing of paired dislocations is the weak-beam dark field method. This method has proved extremely useful in the study of many systems, see Cockayne3 for a review. One of the difficulties of the weak-beam method is that the observed peak positions do not generally correspond to the actual position of the partial dislocation cores. Correlation of the peak positions with the true position depends on the deviation parameter, foil thickness, and position of the dislocations within the foil.


Minerals ◽  
2019 ◽  
Vol 9 (7) ◽  
pp. 388 ◽  
Author(s):  
Max R. Verdugo-Ihl ◽  
Cristiana L. Ciobanu ◽  
Ashley Slattery ◽  
Nigel J. Cook ◽  
Kathy Ehrig ◽  
...  

Metal nanoparticles (NP) in minerals are an emerging field of research. Development of advanced analytical techniques such as Z-contrast imaging and mapping using high-angle annular dark field scanning transmission electron microscopy (HAADF STEM) allows unparalleled insights at the nanoscale. Moreover, the technique provides a link between micron-scale textures and chemical patterns if the sample is extracted in situ from a location of petrogenetic interest. Here we use HAADF STEM imaging and energy-dispersive X-ray spectrometry (EDX) mapping/spot analysis on focused ion beam prepared foils to characterise atypical Cu-As-zoned and weave-twinned hematite from the Olympic Dam deposit, South Australia. We aim to determine the role of solid-solution versus the presence of discrete included NPs in the observed zoning and to understand Cu-As-enrichment processes. Relative to the grain surface, the Cu-As bands extend in depth as (sub)vertical trails of opposite orientation, with Si-bearing hematite NP inclusions on one side and coarser cavities (up to hundreds of nm) on the other. The latter host Cu and Cu-As NPs, contain mappable K, Cl, and C, and display internal voids with rounded morphologies. Aside from STEM-EDX mapping, the agglomeration of native copper NPs was also assessed by high-resolution imaging. Collectively, such characteristics, corroborated with the geometrical outlines and negative crystal shapes of the cavities, infer that these are opened fluid inclusions with NPs attached to inclusion walls. Hematite along the trails features distinct nanoscale domains with lattice defects (twins, 2-fold superstructuring) relative to hematite outside the trails, indicating this is a nanoprecipitate formed during replacement processes, i.e., coupled dissolution and reprecipitation reactions (CDRR). Transient porosity intrinsically developed during CDRR can trap fluids and metals. Needle-shaped and platelet Cu-As NPs are also observed along (sub)horizontal bands along which Si, Al and K is traceable along the margins. The same signature is depicted along nm-wide planes crosscutting at 60° and offsetting (012)-twins in weave-twinned hematite. High-resolution imaging shows linear and planar defects, kink deformation along the twin planes, misorientation and lattice dilation around duplexes of Si-Al-K-planes. Such defects are evidence of strain, induced during fluid percolation along channels that become wider and host sericite platelets, as well as Cl-K-bearing inclusions, comparable with those from the Cu-As-zoned hematite, although without metal NPs. The Cu-As-bands mapped in hematite correspond to discrete NPs formed during interaction with fluids that changed in composition from alkali-silicic to Cl- and metal-bearing brines, and to fluid rates that evolved from slow infiltration to erratic inflow controlled by fault-valve mechanism pumping. This explains the presence of Cu-As NPs hosted either along Si-Al-K-planes (fluid supersaturation), or in fluid inclusions (phase separation during depressurisation) as well as the common signatures observed in hematite with variable degrees of fluid-mineral interaction. The invoked fluids are typical of hydrolytic alteration and the fluid pumping mechanism is feasible via fault (re)activation. Using a nanoscale approach, we show that fluid-mineral interaction can be fingerprinted at the (atomic) scale at which element exchange occurs.


2016 ◽  
Vol 6 (1) ◽  
Author(s):  
Akihiro Suzuki ◽  
Kei Shimomura ◽  
Makoto Hirose ◽  
Nicolas Burdet ◽  
Yukio Takahashi

Author(s):  
L. J. Chen ◽  
K. Seshan

The weak beam dark field and high order bright field imaging(2) methods are powerful means for improving the resolution of images detected by diffraction contrast. However, at high voltages, many beam interactions become important as more interband transitions occur between different Bloch waves. At the exact Bragg condition, for any order reflection, usually more than two interband transitions are important for both weak beam and bright field images, and complicated images result.


Author(s):  
J.M. Cowley

By extrapolation of past experience, it would seem that the future of ultra-high resolution electron microscopy rests with the advances of electron optical engineering that are improving the instrumental stability of high voltage microscopes to achieve the theoretical resolutions of 1Å or better at 1MeV or higher energies. While these high voltage instruments will undoubtedly produce valuable results on chosen specimens, their general applicability has been questioned on the basis of the excessive radiation damage effects which may significantly modify the detailed structures of crystal defects within even the most radiation resistant materials in a period of a few seconds. Other considerations such as those of cost and convenience of use add to the inducement to consider seriously the possibilities for alternative approaches to the achievement of comparable resolutions.


Author(s):  
Max T. Otten ◽  
Wim M.J. Coene

High-resolution imaging with a LaB6 instrument is limited by the spatial and temporal coherence, with little contrast remaining beyond the point resolution. A Field Emission Gun (FEG) reduces the incidence angle by a factor 5 to 10 and the energy spread by 2 to 3. Since the incidence angle is the dominant limitation for LaB6 the FEG provides a major improvement in contrast transfer, reducing the information limit to roughly one half of the point resolution. The strong improvement, predicted from high-resolution theory, can be seen readily in diffractograms (Fig. 1) and high-resolution images (Fig. 2). Even if the information in the image is limited deliberately to the point resolution by using an objective aperture, the improved contrast transfer close to the point resolution (Fig. 1) is already worthwhile.


Author(s):  
Xiao Zhang

Electron holography has recently been available to modern electron microscopy labs with the development of field emission electron microscopes. The unique advantage of recording both amplitude and phase of the object wave makes electron holography a effective tool to study electron optical phase objects. The visibility of the phase shifts of the object wave makes it possible to directly image the distributions of an electric or a magnetic field at high resolution. This work presents preliminary results of first high resolution imaging of ferroelectric domain walls by electron holography in BaTiO3 and quantitative measurements of electrostatic field distribution across domain walls.


Author(s):  
George C. Ruben

Single molecule resolution in electron beam sensitive, uncoated, noncrystalline materials has been impossible except in thin Pt-C replicas ≤ 150Å) which are resistant to the electron beam destruction. Previously the granularity of metal film replicas limited their resolution to ≥ 20Å. This paper demonstrates that Pt-C film granularity and resolution are a function of the method of replication and other controllable factors. Low angle 20° rotary , 45° unidirectional and vertical 9.7±1 Å Pt-C films deposited on mica under the same conditions were compared in Fig. 1. Vertical replication had a 5A granularity (Fig. 1c), the highest resolution (table), and coated the whole surface. 45° replication had a 9Å granulartiy (Fig. 1b), a slightly poorer resolution (table) and did not coat the whole surface. 20° rotary replication was unsuitable for high resolution imaging with 20-25Å granularity (Fig. 1a) and resolution 2-3 times poorer (table). Resolution is defined here as the greatest distance for which the metal coat on two opposing faces just grow together, that is, two times the apparent film thickness on a single vertical surface.


Author(s):  
Bertholdand Senftinger ◽  
Helmut Liebl

During the last few years the investigation of clean and adsorbate-covered solid surfaces as well as thin-film growth and molecular dynamics have given rise to a constant demand for high-resolution imaging microscopy with reflected and diffracted low energy electrons as well as photo-electrons. A recent successful implementation of a UHV low-energy electron microscope by Bauer and Telieps encouraged us to construct such a low energy electron microscope (LEEM) for high-resolution imaging incorporating several novel design features, which is described more detailed elsewhere.The constraint of high field strength at the surface required to keep the aberrations caused by the accelerating field small and high UV photon intensity to get an improved signal-to-noise ratio for photoemission led to the design of a tetrode emission lens system capable of also focusing the UV light at the surface through an integrated Schwarzschild-type objective. Fig. 1 shows an axial section of the emission lens in the LEEM with sample (28) and part of the sample holder (29). The integrated mirror objective (50a, 50b) is used for visual in situ microscopic observation of the sample as well as for UV illumination. The electron optical components and the sample with accelerating field followed by an einzel lens form a tetrode system. In order to keep the field strength high, the sample is separated from the first element of the einzel lens by only 1.6 mm. With a numerical aperture of 0.5 for the Schwarzschild objective the orifice in the first element of the einzel lens has to be about 3.0 mm in diameter. Considering the much smaller distance to the sample one can expect intense distortions of the accelerating field in front of the sample. Because the achievable lateral resolution depends mainly on the quality of the first imaging step, careful investigation of the aberrations caused by the emission lens system had to be done in order to avoid sacrificing high lateral resolution for larger numerical aperture.


2003 ◽  
Vol 104 ◽  
pp. 381-384 ◽  
Author(s):  
P. Philippot ◽  
J. Foriel ◽  
J. Susini ◽  
H. Khodja ◽  
N. Grassineau ◽  
...  

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