scholarly journals Nondestructive, High-Resolution Materials Characterization with the Confocal Raman-AFM

2005 ◽  
Vol 13 (3) ◽  
pp. 30-35 ◽  
Author(s):  
U. Schmidt ◽  
A. Jauss ◽  
W. Ibach ◽  
K. Weishaupt ◽  
O. Hollricher
Keyword(s):  
High Resolution ◽  
Semiconductor Manufacturing ◽  
Analytical Techniques ◽  
Materials Characterization ◽  
Surface Markers ◽  
Detailed Characterization ◽  
Topographic Information ◽  
Materials Research ◽  
High Resolution Microscopy

Materials research, biomedical research, and semiconductor manufacturing can all benefit from nondestructive, high-resolution methods of analysis. As most materials are heterogeneous, it is important to not only acquire high resolution topographic information, but also to identify the chemical composition of samples. A combination of high resolution microscopy with chemically sensitive spectroscopy combined in one instrument allows the detailed characterization of samples with different analytical techniques. When individual instruments are used, returning to a previously surveyed sample area can be very time consuming if not impossible without surface markers.

High Resolution Electron Microscopic Study of the Growth of Denser Phases on Zeolite Y and Zeolite L.

1987 ◽  
Vol 111 ◽  
Author(s):  
H. W. Zandbergen
Keyword(s):  
High Resolution ◽  
Local Structure ◽  
Zeolite Y ◽  
High Resolution Electron Microscopy ◽  
Electron Microscopic ◽  
Detailed Characterization ◽  
Zeolite L ◽  
Resolution Electron ◽  
Materials Research

AbstractHigh resolution electron microscopy (HREM) is a powerful tool in materials research. This is especially true in the study of zeolites because most of the questions concerning the properties of zeolites require a detailed characterization of the local structure [1]. The potential of HREM is illustrated with studies on the growth of denser phases on Zeolite Y and Zeolite L.

scholarly journals The ISHTAR Mission: Probing the Internal Structure of NEOs

2005 ◽  
Vol 13 ◽  
pp. 738-742 ◽  
Author(s):  
M. Antonietta Barucci ◽  
Paolo D’Arrigo ◽  
P. Ball ◽  
Alain Doressoundiram ◽  
Elisabetta Dotto ◽  
...  
Keyword(s):  
High Resolution ◽  
Internal Structure ◽  
Field Measurement ◽  
Detailed Characterization ◽  
Spacecraft Design ◽  
Radio Science ◽  
Origin And Evolution ◽  
Small Asteroid ◽  
General Studies

AbstractISHTAR (Internal Structure High-resolution Tomography by Asteroid Rendezvous) is a mission developed through ESA General Studies programme. The study, led by Astrium in cooperation with several scientific institutes throughout Europe, has produced a spacecraft design capable of performing multiple asteroid rendezvous and to characterize them with a focussed set of instruments. The ISHTAR concept is centred around a Radar Tomography paylod able to probe the internal structure of a small asteroid to depths of few hundred meters, combined with a small camera for investigation of the surface properties and a radio science experiment for gravity field measurement. This combination will allow the first detailed characterization of a NEO and will give valuable insights into the origin and evolution processes that govern the NEO population. In particular, ISHTAR will be able to visit at least 2 NEOs belonging to two different spectral classes, thereby allowing us to probe the diversity of the NEO population.

Spectroscopy of metastable species in a free-jet expansion: the β ← A transition in IBr

1994 ◽  
Vol 72 (11-12) ◽  
pp. 1294-1306 ◽  
Author(s):  
Jason O. Clevenger ◽  
Quentin P. Ray ◽  
Joel Tellinghuisen ◽  
Xiaonan Zheng ◽  
Michael C. Heaven
Keyword(s):  
High Resolution ◽  
Laser Irradiation ◽  
Laser Excitation ◽  
Excitation Spectra ◽  
Detailed Characterization ◽  
Free Jet ◽  
X State ◽  
Π State ◽  
Existing Data

The A 1(3Π) state of IBr is observed in a free-jet expansion of IBr in Ar, following photolysis with ArF laser irradiation. Laser excitation spectra are obtained for the β 1(3P2) ← A transition in medium (0.5 cm−1) and high (0.08 cm−1) resolution. Sixteen ν′–ν″ bands recorded in high resolution are rotationally analyzed, providing the first detailed characterization of the lowest three νlevels in the A state. An additional ~50 bandheads in the ν″ = 0 and 1 progressions are recorded for both I79Br and I81Br. The new data, which sample ν′ levels in the range 31–71, are combined with existing information for low ν in the β state to provide improved constants for the β state. These results are merged with least-squares parameters from a detailed reanalysis of existing data for the A and X(1Σ+) states to yield spectroscopic parameters valid for ν = 0–20 in the X state and ν = 0–26 in the A state. Among these results are the first precise estimates of the equilibrium parameters in the A state: Te = 12 369.68 (14) cm−1, ωe = 134.22 (13) cm−1, Be = 0.042 40 (5) cm−1, Re = 2.8583 (16) Å.

scholarly journals Characterization of the thickness of the tear film lipid layer using high resolution microscopy

2019 ◽  
Vol 17 (2) ◽  
pp. 356-359
Author(s):  
Yuqiang Bai ◽  
William Ngo ◽  
Jason J. Nichols
Keyword(s):  
High Resolution ◽  
Tear Film ◽  
Lipid Layer ◽  
High Resolution Microscopy

scholarly journals Highly Coherent Femtosecond Electron Pulses for Ultrafast Transmission Electron Microscopy

2019 ◽  
Vol 205 ◽  
pp. 08014
Author(s):  
Nora Bach ◽  
Armin Feist ◽  
Till Domrose ◽  
Thomas Danz ◽  
Marcel Möller ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
High Resolution ◽  
Detailed Characterization ◽  
Transmission Electron ◽  
Electron Imaging ◽  
Femtosecond Electron Pulses ◽  
Electron Pulses

We describe the implementation and detailed characterization of a laser-triggered field-emitter electron source integrated into a modified transmission electron microscope. Highly coherent electron pulses enable high resolution ultrafast electron imaging and diffraction.

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