Selected Area Electron Diffraction and its Use in Structure Determination
Keyword(s):
One of the capabilities of electron microscopes is to obtain diffraction patterns, which can be analyzed to give information about the structure of the specimen. This brief review discusses some of the technical considerations in using electron diffraction patterns for structural analysis. The technique of selected-area electron diffraction uses diffraction obtained from a limited region of the specimen.
2005 ◽
Vol 61
(4)
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pp. 387-399
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1990 ◽
Vol 48
(1)
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pp. 48-49
2020 ◽
1966 ◽
Vol 293
(1433)
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pp. 169-180
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2003 ◽
Vol 53
(2)
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pp. 227-236
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2008 ◽
Vol 6
(0)
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pp. 84-86
Keyword(s):
2016 ◽
pp. 643-644