Quantitative Characterization of Nanoparticles in Blood by Transmission Electron Microscopy with a Window-Type Microchip Nanopipet

Quantitative characterization of clay dispersion in polypropylene-clay nanocomposites by combined transmission electron microscopy and optical microscopy

Materials Letters ◽

10.1016/j.matlet.2009.10.042 ◽

2010 ◽

Vol 64 (2) ◽

pp. 185-188 ◽

Cited By ~ 23

Author(s):

Shaobo Xie ◽

Eileen Harkin-Jones ◽

Yucai Shen ◽

Peter Hornsby ◽

Marion McAfee ◽

...

Keyword(s):

Electron Microscopy ◽

Optical Microscopy ◽

Clay Nanocomposites ◽

Clay Dispersion ◽

Quantitative characterization of the mesothelioma-inducing erionite series minerals by transmission electron microscopy and energy dispersive spectroscopy

Scanning ◽

10.1002/sca.20276 ◽

2011 ◽

Vol 34 (1) ◽

pp. 37-42 ◽

Cited By ~ 7

Author(s):

Meral Dogan

Keyword(s):

Electron Microscopy ◽

Energy Dispersive Spectroscopy ◽

Energy Dispersive ◽

Quantitative characterization of electron detectors for transmission electron microscopy

Journal of Structural Biology ◽

10.1016/j.jsb.2013.10.016 ◽

2013 ◽

Vol 184 (3) ◽

pp. 385-393 ◽

Cited By ~ 123

Author(s):

Rachel S. Ruskin ◽

Zhiheng Yu ◽

Nikolaus Grigorieff

Keyword(s):

Electron Microscopy ◽

Quantitative characterization of AlAs/GaAs interfaces by high-resolution transmission electron microscopy along the ?100? and the ?110? projection

Applied Physics A Solids and Surface ◽

10.1007/bf00331777 ◽

1993 ◽

Vol 57 (5) ◽

pp. 393-400 ◽

Cited By ~ 16

Author(s):

T. Walther ◽

D. Gerthsen

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Quantitative Characterization of Roughness at SiO2/Si Interfaces by Using Cross-sectional High-resolution Transmission Electron Microscopy

Japanese Journal of Applied Physics ◽

10.1143/jjap.39.1278 ◽

2000 ◽

Vol 39 (Part 1, No. 3A) ◽

pp. 1278-1285 ◽

Cited By ~ 10

Author(s):

Nobuyuki Ikarashi ◽

Koji Watanabe

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Cross Sectional ◽

Nanoscale quantitative characterization of 22nm CMOS transistor using Scanning Transmission Electron Microscopy (STEM)

European Microscopy Congress 2016: Proceedings ◽

10.1002/9783527808465.emc2016.5389 ◽

2016 ◽

pp. 584-585

Author(s):

Weihao Weng ◽

Claude Ortolland

Keyword(s):

Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Cmos Transistor

Quantitative characterization of aggregated and agglomerated titanium dioxide nanomaterials by transmission electron microscopy

Powder Technology ◽

10.1016/j.powtec.2014.03.010 ◽

2014 ◽

Vol 258 ◽

pp. 180-188 ◽

Cited By ~ 15

Author(s):

E. Verleysen ◽

P.-J. De Temmerman ◽

E. Van Doren ◽

M. Abi Daoud Francisco ◽

J. Mast

Keyword(s):

Electron Microscopy ◽

Titanium Dioxide ◽

Quantitative characterization of agglomerates and aggregates of pyrogenic and precipitated amorphous silica nanomaterials by transmission electron microscopy

Journal of Nanobiotechnology ◽

10.1186/1477-3155-10-24 ◽

2012 ◽

Vol 10 (1) ◽

pp. 24 ◽

Cited By ~ 47

Author(s):

Pieter-Jan De Temmerman ◽

Elke Van Doren ◽

Eveline Verleysen ◽

Yves Van der Stede ◽

Michel Abi Francisco ◽

...

Keyword(s):

Electron Microscopy ◽

Amorphous Silica ◽

Silica Nanomaterials ◽

Quantitative characterization of virus-like particles by asymmetrical flow field flow fractionation, electrospray differential mobility analysis, and transmission electron microscopy

Biotechnology and Bioengineering ◽

10.1002/bit.22085 ◽

2009 ◽

Vol 102 (3) ◽

pp. 845-855 ◽

Cited By ~ 86

Author(s):

Leonard F. Pease ◽

Daniel I. Lipin ◽

De-Hao Tsai ◽

Michael R. Zachariah ◽

Linda H.L. Lua ◽

...

Keyword(s):

Electron Microscopy ◽

Flow Field ◽

Field Flow Fractionation ◽

Mobility Analysis ◽

Differential Mobility ◽

Differential Mobility Analysis ◽

Quantitative characterization of GaN quantum-dot structures in AlN by high-resolution transmission electron microscopy

Applied Physics Letters ◽

10.1063/1.123321 ◽

1999 ◽

Vol 74 (22) ◽

pp. 3287-3289 ◽

Cited By ~ 79

Author(s):

M. Arlery ◽

J. L. Rouvière ◽

F. Widmann ◽

B. Daudin ◽

G. Feuillet ◽

...

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Quantum Dot ◽