Plasma-Enhanced Atomic Layer Deposition of p-Type Copper Oxide Semiconductors with Tunable Phase, Oxidation State, and Morphology

Author(s):  
Julia D. Lenef ◽  
Jaesung Jo ◽  
Orlando Trejo ◽  
David J. Mandia ◽  
Rebecca L. Peterson ◽  
...  
2018 ◽  
Vol 30 (24) ◽  
pp. 8983-8984 ◽  
Author(s):  
Dustin Z. Austin ◽  
Melanie A. Jenkins ◽  
Derryl Allman ◽  
Sallie Hose ◽  
David Price ◽  
...  

2020 ◽  
Vol 3 (10) ◽  
pp. 10200-10208
Author(s):  
Vincent Vandalon ◽  
Marcel A. Verheijen ◽  
Wilhelmus M. M. Kessels ◽  
Ageeth A. Bol

2014 ◽  
Vol 26 (21) ◽  
pp. 6088-6091 ◽  
Author(s):  
Jeong Hwan Han ◽  
Yoon Jang Chung ◽  
Bo Keun Park ◽  
Seong Keun Kim ◽  
Hyo-Suk Kim ◽  
...  

2018 ◽  
Vol 451 ◽  
pp. 121-127 ◽  
Author(s):  
Tsung-Cheng Chen ◽  
Tsuo-Chuan Yang ◽  
Hsyi-En Cheng ◽  
Ing-Song Yu ◽  
Zu-Po Yang

2019 ◽  
Vol 257 (2) ◽  
pp. 1900472 ◽  
Author(s):  
Elzbieta Guziewicz ◽  
Tomasz Aleksander Krajewski ◽  
Ewa Przezdziecka ◽  
Krzysztof P. Korona ◽  
Nikodem Czechowski ◽  
...  

2005 ◽  
Vol 483-485 ◽  
pp. 701-704 ◽  
Author(s):  
Maciej Wolborski ◽  
Mietek Bakowski ◽  
Viljami Pore ◽  
Mikko Ritala ◽  
Markku Leskelä ◽  
...  

Aluminium oxide and titanium oxide films were deposited using the Atomic Layer Deposition method on n-type 4H SiC and p-type Si {001} substrates, with doping 6×1015cm-3 and 2×1016cm-3, respectively, and on 1.2 kV PiN 4H SiC diodes for passivation studies. The Al2O3 and SiC interface was characterised for the existence of an effective negative charge with a density of 1×1012-2×1012 cm-2. The dielectric constant of Al2O3 as determined from capacitance-voltage data was about 8.3. The maximum electric field supported by the Al2O3 film was up to 7.5 MV/cm and 8.4 MV/cm on SiC and Si, respectively.


2013 ◽  
Vol 107 ◽  
pp. 223-228 ◽  
Author(s):  
Marcel Melzer ◽  
Thomas Waechtler ◽  
Steve Müller ◽  
Holger Fiedler ◽  
Sascha Hermann ◽  
...  

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