Auger Electron Spectroscopy, Electron Energy Loss Spectroscopy, UV Photoelectron Spectroscopy, and Photoluminescence Characterization of In2O3Associated to the Theoretical Calculations Based on the Generalized Gradient Approximation and Modified Becke Johnson

Electron Spectroscopy ◽

Auger Electron ◽

Theoretical Calculations ◽

Generalized Gradient ◽

Generalized Gradient Approximation ◽

Electron Energy Loss ◽

Uv Photoelectron Spectroscopy

Auger electron spectroscopy, x‐ray photoelectron spectroscopy, and electron energy‐loss spectroscopy studies of MoSi2

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.577917 ◽

1992 ◽

Vol 10 (4) ◽

pp. 2822-2825 ◽

Cited By ~ 11

Author(s):

R. S. Rastogi ◽

V. D. Vankar ◽

K. L. Chopra

Keyword(s):

Energy Loss ◽

Electron Energy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray ◽

Spectroscopy Studies ◽

Journal of the Chemical Society Faraday Transactions 1 Physical Chemistry in Condensed Phases ◽

State of sulphur on the palladium surface studied by auger electron spectroscopy, electron energy loss spectroscopy, ultraviolet photoelectron spectroscopy and X-ray photoelectron spectroscopy

10.1039/f19807601122 ◽

1980 ◽

Vol 76 (0) ◽

pp. 1122 ◽

Cited By ~ 19

Author(s):

Yoshio Matsumoto ◽

Mitsuyuki Soma ◽

Takaharu Onishi ◽

Kenzi Tamaru

Keyword(s):

Energy Loss ◽

Electron Spectroscopy ◽

Auger Electron ◽

Ultraviolet Photoelectron Spectroscopy ◽

X Ray ◽

Palladium Surface ◽

Characterization of plasma‐deposited silicon nitride films by Auger electron spectroscopy and electron energy loss spectroscopy

Journal of Applied Physics ◽

10.1063/1.331630 ◽

1982 ◽

Vol 53 (3) ◽

pp. 1671-1674 ◽

Cited By ~ 20

Author(s):

R. Hezel ◽

N. Lieske

Keyword(s):

Silicon Nitride ◽

Energy Loss ◽

Electron Energy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Silicon Nitride Films ◽

Chemical shifts of silicon and titanium in titanium silicide studied by Auger electron spectroscopy, slow electron energy‐loss spectroscopy, and internal x‐ray photoelectron spectroscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.575485 ◽

1988 ◽

Vol 6 (6) ◽

pp. 3120-3124 ◽

Cited By ~ 15

Author(s):

J. K. N. Sharma ◽

B. R. Chakraborty ◽

S. M. Shivaprasad

Keyword(s):

Energy Loss ◽

Electron Spectroscopy ◽

Auger Electron ◽

Chemical Shifts ◽

Titanium Silicide ◽

Slow Electron ◽

X Ray ◽

Structure of GaAs-In0.2Ga0.8As heterojunction interface studied by electron spectroscopies: X-ray photoelectron spectroscopy, tunable electron energy loss spectroscopy and Auger electron spectroscopy

Thin Solid Films ◽

10.1016/0040-6090(87)90436-6 ◽

1987 ◽

Vol 146 (3) ◽

pp. 291-297 ◽

Cited By ~ 3

Author(s):

M. Iwami ◽

Y. Watanabe ◽

H. Kato ◽

M. Nakayama ◽

N. Sano

Keyword(s):

Energy Loss ◽

Electron Energy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray ◽

Chemical characterization of surfaces and interfaces of industrial materials by X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary ion mass spectrometry

Thin Solid Films ◽

10.1016/0040-6090(80)90552-0 ◽

1980 ◽

Vol 72 (1) ◽

pp. 3-8 ◽

Cited By ~ 2

Author(s):

C.R. Brundle

Keyword(s):

Electron Spectroscopy ◽

Auger Electron ◽

Secondary Ion Mass Spectrometry ◽

Chemical Characterization ◽

X Ray ◽

Surfaces And Interfaces ◽

Industrial Materials ◽

Secondary Ion

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

Oxidation study by Auger electron spectroscopy and electron energy-loss spectroscopy of GaSb(001) surfaces grown by molecular-beam epitaxy

10.1116/1.584830 ◽

1990 ◽

Vol 8 (1) ◽

pp. 68 ◽

Cited By ~ 8

Author(s):

C. Raisin

Keyword(s):

Molecular Beam Epitaxy ◽

Energy Loss ◽

Electron Energy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Molecular Beam ◽

Oxidation Study ◽

Springer Series in Surface Sciences - Auger Spectroscopy and Electronic Structure ◽

A Technique for Performing Angle-Resolved Auger Electron Spectroscopy (ARAES) and Angle-Resolved Electron Energy Loss Spectroscopy (ARELS)

10.1007/978-3-642-75066-3_31 ◽

1989 ◽

pp. 251-256

Author(s):

G. B. Hoflund

Keyword(s):

Energy Loss ◽

Electron Energy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Summary Abstract: Low‐energy electron diffraction, Auger electron spectroscopy, and electron energy‐loss spectroscopy studies of (511) and (711) GaAs surfaces

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.574664 ◽

1987 ◽

Vol 5 (4) ◽

pp. 654-655 ◽

Cited By ~ 2

Author(s):

K. Young ◽

A. Kahn

Keyword(s):

Electron Diffraction ◽

Energy Loss ◽

Electron Spectroscopy ◽

Auger Electron ◽

Low Energy ◽

Low Energy Electron Diffraction ◽

Low Energy Electron ◽

Spectroscopy Studies ◽

An Auger electron spectroscopy/electron energy‐loss spectroscopy study on the oxidation of WSi2 thin film

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.574620 ◽

1987 ◽

Vol 5 (4) ◽

pp. 1456-1458 ◽

Cited By ~ 2

Author(s):

Jian‐Wei He ◽

Preben J. Mo/ller ◽

Jiann‐Ruey Chen

Keyword(s):

Thin Film ◽

Energy Loss ◽

Electron Energy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Spectroscopy Study ◽