scholarly journals In Situ Electron Diffraction Tomography Using a Liquid-Electrochemical Transmission Electron Microscopy Cell for Crystal Structure Determination of Cathode Materials for Li-Ion batteries

Nano Letters ◽  
2018 ◽  
Vol 18 (10) ◽  
pp. 6286-6291 ◽  
Author(s):  
Olesia M. Karakulina ◽  
Arnaud Demortière ◽  
Walid Dachraoui ◽  
Artem M. Abakumov ◽  
Joke Hadermann
Nano Letters ◽  
2014 ◽  
Vol 14 (3) ◽  
pp. 1293-1299 ◽  
Author(s):  
Patricia Abellan ◽  
B. Layla Mehdi ◽  
Lucas R. Parent ◽  
Meng Gu ◽  
Chiwoo Park ◽  
...  

2019 ◽  
Vol 114 (11) ◽  
pp. 113901 ◽  
Author(s):  
Shaobo Han ◽  
Yuanmin Zhu ◽  
Chao Cai ◽  
Jiakun Zhu ◽  
Wenbin Han ◽  
...  

Author(s):  
D. Loretto ◽  
J. M. Gibson ◽  
S. M. Yalisove

The silicides CoSi2 and NiSi2 are both metallic with the fee flourite structure and lattice constants which are close to silicon (1.2% and 0.6% smaller at room temperature respectively) Consequently epitaxial cobalt and nickel disilicide can be grown on silicon. If these layers are formed by ultra high vacuum (UHV) deposition (also known as molecular beam epitaxy or MBE) their thickness can be controlled to within a few monolayers. Such ultrathin metal/silicon systems have many potential applications: for example electronic devices based on ballistic transport. They also provide a model system to study the properties of heterointerfaces. In this work we will discuss results obtained using in situ and ex situ transmission electron microscopy (TEM).In situ TEM is suited to the study of MBE growth for several reasons. It offers high spatial resolution and the ability to penetrate many monolayers of material. This is in contrast to the techniques which are usually employed for in situ measurements in MBE, for example low energy electron diffraction (LEED) and reflection high energy electron diffraction (RHEED), which are both sensitive to only a few monolayers at the surface.


Nanoscale ◽  
2014 ◽  
Vol 6 (22) ◽  
pp. 13803-13808 ◽  
Author(s):  
Arnaud Mayence ◽  
Dong Wang ◽  
German Salazar-Alvarez ◽  
Peter Oleynikov ◽  
Lennart Bergström

Planar defects in Pd nanoparticle superlattices were revealed by a combination of real and reciprocal space transmission electron microscopy techniques. 3D electron diffraction tomography was extended to characterize mesoscale imperfections.


Inorganics ◽  
2021 ◽  
Vol 9 (11) ◽  
pp. 85
Author(s):  
Maryam Golozar ◽  
Raynald Gauvin ◽  
Karim Zaghib

This work summarizes the most commonly used in situ techniques for the study of Li-ion batteries from the micro to the atomic level. In situ analysis has attracted a great deal of interest owing to its ability to provide a wide range of information about the cycling behavior of batteries from the beginning until the end of cycling. The in situ techniques that are covered are: X-ray diffraction (XRD), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), and Scanning Transmission Electron Microscopy (STEM). An optimized setup is required to be able to use any of these in situ techniques in battery applications. Depending on the type of data required, the available setup, and the type of battery, more than one of these techniques might be needed. This study organizes these techniques from the micro to the atomic level, and shows the types of data that can be obtained using these techniques, their advantages and their challenges, and possible strategies for overcoming these challenges.


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