scholarly journals Role of Postdeposition Thermal Annealing on Intracrystallite and Intercrystallite Structuring and Charge Transport in Poly(3-hexylthiophene)

Author(s):  
Kaichen Gu ◽  
Yucheng Wang ◽  
Ruipeng Li ◽  
Esther Tsai ◽  
Jonathan W. Onorato ◽  
...  
Langmuir ◽  
2008 ◽  
Vol 24 (5) ◽  
pp. 2219-2223 ◽  
Author(s):  
Yabing Qi ◽  
Imma Ratera ◽  
Jeong Y. Park ◽  
Paul D. Ashby ◽  
Su Ying Quek ◽  
...  

2012 ◽  
Vol 101 (24) ◽  
pp. 243302 ◽  
Author(s):  
Yasuhiro Mashiko ◽  
Dai Taguchi ◽  
Martin Weis ◽  
Takaaki Manaka ◽  
Mitsumasa Iwamoto

2014 ◽  
Vol 53 (11) ◽  
pp. 117103
Author(s):  
Jitendra Kumar ◽  
Om Prakash ◽  
Ramakant Mahakud ◽  
Sachin Kumar Agrawal ◽  
Sudhir K. Dixit ◽  
...  

2021 ◽  
Author(s):  
Yuze Zhang ◽  
Alina Chen ◽  
Min-Woo Kim ◽  
Aida Alaei ◽  
Stephanie S. Lee

This tutorial review highlights the role of nanoconfinement in selecting for orientations and polymorphs of organic semiconductor crystals that are optimized for optoelectronic processes, including charge transport and light emission.


Author(s):  
Tewfik Souier

In this chapter, the main scanning probe microscopy-based methods to measure the transport properties in advanced polymer-Carbon Nanotubes (CNT) nanocomposites are presented. The two major approaches to investigate the electrical and charge transport (i.e., Electrostatic Force Microscopy [EFM] and Current-Sensing Atomic Force Microscopy [CS-AFM]) are illustrated, starting from their basic principles. First, the authors show how the EFM-related techniques can be used to provide, at high spatial resolution, a three-dimensional representation CNT networks underneath the surface. This allows the studying of the role of nanoscopic features such as CNTs, CNT-CNT direct contact, and polymer-CNT junctions in determining the overall composite properties. Complementary, CS-AFM can bring insight into the transport mechanism by imaging the spatial distribution of currents percolation paths within the nanocomposite. Finally, the authors show how the CS-AFM can be used to quantify the surface/bulk percolation probability and the nanoscopic electrical conductivity, which allows one to predict the macroscopic percolation model.


2020 ◽  
Vol 77 ◽  
pp. 105499 ◽  
Author(s):  
Srinivasa Rao Pathipati ◽  
Egon Pavlica ◽  
Emanuele Treossi ◽  
Vincenzo Palermo ◽  
Gvido Bratina

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