Study of Anion Adsorption at the Gold-Aqueous Solution Interface by Atomic Force Microscopy

Journal of the American Chemical Society ◽

10.1021/ja00099a033 ◽

1994 ◽

Vol 116 (20) ◽

pp. 9150-9157 ◽

Author(s):

S. Biggs ◽

P. Mulvaney ◽

C. F. Zukoski ◽

F. Grieser

Keyword(s):

Aqueous Solution ◽

Atomic Force Microscopy ◽

Anion Adsorption ◽

Force Microscopy ◽

Solution Interface ◽

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Heterogeneous Growth and Self-Repairing Processes of Two-Dimensional Molecular Aggregates of Adsorbed Octadecyltrimethylammonium Bromide at Cleaved Mica/Aqueous Solution Interface as Observed by in Situ Atomic Force Microscopy†

Langmuir ◽

10.1021/la980278t ◽

1999 ◽

Vol 15 (10) ◽

pp. 3689-3692 ◽

Author(s):

Masatoshi Fujii ◽

Bangyin Li ◽

Kazuhiro Fukada ◽

Tadashi Kato ◽

Tsutomu Seimiya

Keyword(s):

Aqueous Solution ◽

Atomic Force Microscopy ◽

Two Dimensional ◽

Molecular Aggregates ◽

Force Microscopy ◽

Solution Interface ◽

Atomic Force ◽

Octadecyltrimethylammonium Bromide

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Dissolution Kinetics, Step and Surface Morphology of Magnesite (104) Surfaces in Acidic Aqueous Solution at 60 °C by Atomic Force Microscopy under Defined Hydrodynamic Conditions

The Journal of Physical Chemistry B ◽

10.1021/jp014045d ◽

2002 ◽

Vol 106 (26) ◽

pp. 6696-6705 ◽

Author(s):

Steven R. Higgins ◽

Lawrence H. Boram ◽

Carrick M. Eggleston ◽

Barry A. Coles ◽

Richard G. Compton ◽

...

Keyword(s):

Aqueous Solution ◽

Atomic Force Microscopy ◽

Surface Morphology ◽

Dissolution Kinetics ◽

Hydrodynamic Conditions ◽

Acidic Aqueous Solution ◽

Force Microscopy ◽

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Molecular-scale surface structures of oligo(ethylene glycol)-terminated self-assembled monolayers investigated by frequency modulation atomic force microscopy in aqueous solution

Nanotechnology ◽

10.1088/0957-4484/25/30/305602 ◽

2014 ◽

Vol 25 (30) ◽

pp. 305602 ◽

Author(s):

N Inada ◽

H Asakawa ◽

Y Matsumoto ◽

T Fukuma

Keyword(s):

Aqueous Solution ◽

Atomic Force Microscopy ◽

Ethylene Glycol ◽

Surface Structures ◽

Self Assembled Monolayers ◽

Force Microscopy ◽

Atomic Force ◽

Molecular Scale ◽

Assembled Monolayers ◽

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Aqueous Solution Structure over α-Al2O3(011̅2) Probed by Frequency-Modulation Atomic Force Microscopy

The Journal of Physical Chemistry C ◽

10.1021/jp1057447 ◽

2010 ◽

Vol 114 (49) ◽

pp. 21423-21426 ◽

Author(s):

Takumi Hiasa ◽

Kenjiro Kimura ◽

Hiroshi Onishi ◽

Masahiro Ohta ◽

Kazuyuki Watanabe ◽

...

Keyword(s):

Aqueous Solution ◽

Atomic Force Microscopy ◽

Frequency Modulation ◽

Solution Structure ◽

Force Microscopy ◽

Atomic Force ◽

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Potential-dependent hydration structures at aqueous solution/graphite interfaces by electrochemical frequency modulation atomic force microscopy

Chemical Communications ◽

10.1039/c4cc07093c ◽

2014 ◽

Vol 50 (98) ◽

pp. 15537-15540 ◽

Author(s):

Toru Utsunomiya ◽

Yasuyuki Yokota ◽

Toshiaki Enoki ◽

Ken-ichi Fukui

Keyword(s):

Aqueous Solution ◽

Atomic Force Microscopy ◽

Frequency Modulation ◽

Force Microscopy ◽

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In situ observations of tetraamineplatinum(II) hydroxide adsorption from its aqueous solution on heulandite (0 1 0) surface by atomic force microscopy

Applied Surface Science ◽

10.1016/j.apsusc.2004.06.114 ◽

2004 ◽

Vol 237 (1-4) ◽

pp. 504-509 ◽

Author(s):

Masaharu Komiyama ◽

Yan-Jun Li ◽

Ning Gu

Keyword(s):

Aqueous Solution ◽

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

In Situ Observations

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Reactivity at the film/solution interface of ex situ prepared bismuth film electrodes: A scanning electrochemical microscopy (SECM) and atomic force microscopy (AFM) investigation

Electrochimica Acta ◽

10.1016/j.electacta.2007.07.035 ◽

2007 ◽

Vol 53 (2) ◽

pp. 555-560 ◽

Author(s):

Samo B. Hočevar ◽

Salvatore Daniele ◽

Carlo Bragato ◽

Božidar Ogorevc

Keyword(s):

Atomic Force Microscopy ◽

Scanning Electrochemical Microscopy ◽

Ex Situ ◽

Bismuth Film ◽

Force Microscopy ◽

Solution Interface ◽

Atomic Force ◽

Bismuth Film Electrodes ◽

Electrochemical Microscopy

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Mechanism of solid|liquid interfacial reactions. The reactive dissolution of p-chloranil in aqueous solution as studied by the channel flow cell with electrochemical detection and atomic force microscopy

Journal of Electroanalytical Chemistry ◽

10.1016/s0022-0728(97)00050-8 ◽

1997 ◽

Vol 440 (1-2) ◽

pp. 83-93 ◽

Author(s):

J Booth

Keyword(s):

Aqueous Solution ◽

Atomic Force Microscopy ◽

Electrochemical Detection ◽

Channel Flow ◽

Flow Cell ◽

Interfacial Reactions ◽

Force Microscopy ◽

Atomic Force ◽

Reactive Dissolution ◽

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Denaturation of metaphase chromatin plates observed by transmission electron microscopy and atomic force microscopy in aqueous solution

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85228-5_183 ◽

2008 ◽

pp. 365-366

Author(s):

I. Gállego ◽

X. Sisquella ◽

X. Fernàndez-Busquets ◽

J.R. Daban

Keyword(s):

Electron Microscopy ◽

Aqueous Solution ◽

Transmission Electron Microscopy ◽

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Transmission Electron

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Direct measurement of the etching rates on Si (111) and silicon dioxide surfaces in 40% ammonium fluoride aqueous solution via atomic force microscopy

Journal of Applied Physics ◽

10.1063/1.1559001 ◽

2003 ◽

Vol 93 (7) ◽

pp. 4315-4320 ◽

Author(s):

Jian Hua Ouyang ◽

Xin Sheng Zhao ◽

Ting Li ◽

Da Cheng Zhang

Keyword(s):

Aqueous Solution ◽

Atomic Force Microscopy ◽

Silicon Dioxide ◽

Direct Measurement ◽

Ammonium Fluoride ◽

Force Microscopy ◽

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