Formation of Highly Ordered, Unusually Broad Polyethylene Lamellae in Contact with Atomically Flat Solid Surfaces

2003 ◽  
Vol 36 (26) ◽  
pp. 10130-10132 ◽  
Author(s):  
A. Tracz ◽  
I. Kucińska ◽  
J. K. Jeszka
Langmuir ◽  
2017 ◽  
Vol 34 (5) ◽  
pp. 1819-1826 ◽  
Author(s):  
Takakazu Seki ◽  
Christopher R. So ◽  
Tamon R. Page ◽  
David Starkebaum ◽  
Yuhei Hayamizu ◽  
...  

1998 ◽  
Vol 54 (1-3) ◽  
pp. 76-79 ◽  
Author(s):  
Daisuke Takeuchi ◽  
Toshio Seki ◽  
Takaaki Aoki ◽  
Jiro Matsuo ◽  
Isao Yamada

2006 ◽  
Vol 59 (6) ◽  
pp. 394
Author(s):  
Teiji Kato ◽  
Takayuki Nakakawaji

Cryogenic Atomic Force Microscopy (AFM) was used to observe perfluoropolyether (PFPE) lubricant molecules at atomically flat solid surfaces and at a magnetic disk surface to understand the lubricity of ultra-thin (1 nm) lubricant layers at the hard disk surface. Molecular imaging of PFPE lubricant molecules reveals the formation of reversed micelle structures at comparatively non-polar solid surfaces such as gold or the carbon overcoat of magnetic disks.


Author(s):  
J. C. H. Spence ◽  
X. Zhang ◽  
J. M. Zuo ◽  
U. Weierstall ◽  
E. Munro ◽  
...  

The limited penetration of the low-voltage point-projection microscope (PPM) may be avoided by using the reflection geometry to image clean surfaces in ultra-high vacuum. Figure 1 shows the geometry we are using for experimental point-reflection (PRM) imaging. A nanotip field-emitter at about 100 - 1000 volts is placed above a grounded atomically flat crystalline substrate, which acts as a mirror and anode. Since most of the potential is dropped very close to the tip, trajectories are reasonably straight if the sample is in the far-field of the tip. A resolution of 10 nm is sought initially. The specular divergent RHEED beam then defines a virtual source S' below the surface, resulting in an equivalent arrangement to PPM (or defocused CBED). Shadow images of surface asperities are then expected on the distant detector, out of focus by the tip-to-sample distance. These images can be interpreted as in-line electron holograms and so reconstructed (see X. Zhang et al, these proceedings). Optical analog experiments confirm the absence of foreshortening when the detector is parallel to the surface.


Author(s):  
T. S. Kuan

Recent electron diffraction studies have found ordered phases in AlxGa1-xAs, GaAsxSb1-x, and InxGa1-xAs alloy systems, and these ordered phases are likely to be found in many other III-V ternary alloys as well. The presence of ordered phases in these alloys was detected in the diffraction patterns through the appearance of superstructure reflections between the Bragg peaks (Fig. 1). The ordered phase observed in the AlxGa1-xAs and InxGa1-xAs systems is of the CuAu-I type, whereas in GaAsxSb1-x this phase and a chalcopyrite type ordered phase can be present simultaneously. The degree of order in these alloys is strongly dependent on the growth conditions, and during the growth of these alloys, high surface mobility of the depositing species is essential for the onset of ordering. Thus, the growth on atomically flat (110) surfaces usually produces much stronger ordering than the growth on (100) surfaces. The degree of order is also affected by the presence of antiphase boundaries (APBs) in the ordered phase. As shown in Fig. 2(a), a perfectly ordered In0.5Ga0.5As structure grown along the <110> direction consists of alternating InAs and GaAs monolayers, but due to local growth fluctuations, two types of APBs can occur: one involves two consecutive InAs monolayers and the other involves two consecutive GaAs monolayers.


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