Dynamic triggering of high-frequency bursts by strong motions during the 2004 Parkfield earthquake sequence

abstract Aftershocks of the Dasht-e Bayāz earthquake were recorded in the epicentral area with high-gain, high-frequency equipment. This study shows the general characteristics of the aftershock series. The foci are clustered near the ends of the 80 km surface faulting, at 25 km depth. In this earthquake sequence, the secondary series are not distinct in space or mechanism from the primary series, and microevents have the same strain release characteristics as the larger aftershocks.

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Multi-Array Multi-Phase Back-Projection: Improving the imaging of earthquake rupture complexities

10.5194/egusphere-egu21-5436 ◽

2021 ◽

Author(s):

Felipe Vera ◽

Frederik Tilmann ◽

Joachim Saul

Keyword(s):

High Frequency ◽

Solomon Islands ◽

P Wave ◽

Back Projection ◽

Dynamic Triggering ◽

Array Configuration ◽

Megathrust Earthquakes ◽

Rupture Length ◽

Multi Phase ◽

Large Earthquakes

We present a teleseismic earthquake back-projection method parameterized with multiple arrays and combined P and pP waveforms, improving the spatiotemporal resolvability of rupture complexity. The contribution of each array to the rupture image is weighted depending on the multi-array configuration. Depth phases also contribute effectively to earthquakes at 40 km depth or deeper.We examine 31 large earthquakes with moment magnitude greater than 7.5 from 2010-2020, which were back-projected in the 0.5-2.0 Hz band, giving access to the high-frequency rupture propagation. An algorithm estimates rupture length, directivity, and speed based on the back-projection results.Thrust and normal earthquakes showed similar magnitude-dependent lengths and consistent subshear ruptures, while strike-slip earthquakes presented longer ruptures (relative to their magnitude) and frequently reached supershear speeds. The back-projected lengths provided scaling relations to derive high-frequency rupture lengths from moment magnitudes. The results revealed complex rupture behavior, for example, bilateral ruptures (e.g., the 2017 Mw 7.8 Komandorsky Islands earthquake), evidence of dynamic triggering by a P wave (e.g., the 2016 Mw 7.9 Solomon Islands earthquake), and encircling asperity ruptures (e.g., the 2010 Mw 7.8 Mentawai and 2015 Mw 8.4 Illapel earthquakes). The latter is particularly prevalent in subduction megathrust earthquakes, with down-dip, up-dip, double encircling, and segmented patterns. The automated choice of array weighting and the extraction of basic rupture parameters makes the approach well suited for near-real-time earthquake monitoring.

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The Parkfield prediction fallacy

Bulletin of the Seismological Society of America ◽

10.1785/bssa0830010001 ◽

1993 ◽

Vol 83 (1) ◽

pp. 1-6

Author(s):

J. C. Savage

Keyword(s):

Confidence Interval ◽

Earthquake Prediction ◽

Time Limit ◽

The Other ◽

Earthquake Sequence ◽

Moderate Earthquake ◽

Parkfield Earthquake ◽

Near Future

Abstract The Parkfield earthquake prediction is generally stated as a 95% probability that the next moderate earthquake there should occur before January 1993. That time limit is based on a two-sided 95% confidence interval. Because at the time of the prediction (1985) it was already clear that the earthquake had not occurred prior to 1985, a one-sided 95% confidence interval would have been more appropriate. That confidence interval ended in October 1991. The Parkfield prediction was based on an extrapolation of five of the six events in the 1857 to 1966 earthquake sequence; the 1934 event was omitted because it did not fit the regularity exhibited by the other data. The fallacy in the prediction is that it did not take account of other less-contrived explanations of the Parkfield seismicity (e.g., not excluding the 1934 event). Even if the Parkfield earthquake should occur in the near future, it would be better explained by less-contrived hypotheses.

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The Microstructure of Steatite (Protoenstatite)

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100118102 ◽

1985 ◽

Vol 43 ◽

pp. 236-237

Author(s):

W. E. Lee ◽

A. H. Heuer

Keyword(s):

High Frequency ◽

Glass Ceramics ◽

Magnesium Silicate ◽

Beam Current ◽

Glassy Matrix ◽

Angle Of Incidence ◽

X Ray ◽

Mechanical And Electrical Properties ◽

Argon Ions ◽

High Temperature Polymorph

IntroductionTraditional steatite ceramics, made by firing (vitrifying) hydrous magnesium silicate, have long been used as insulators for high frequency applications due to their excellent mechanical and electrical properties. Early x-ray and optical analysis of steatites showed that they were composed largely of protoenstatite (MgSiO3) in a glassy matrix. Recent studies of enstatite-containing glass ceramics have revived interest in the polymorphism of enstatite. Three polymorphs exist, two with orthorhombic and one with monoclinic symmetry (ortho, proto and clino enstatite, respectively). Steatite ceramics are of particular interest a they contain the normally unstable high-temperature polymorph, protoenstatite.Experimental3mm diameter discs cut from steatite rods (∼10” long and 0.5” dia.) were ground, polished, dimpled, and ion-thinned to electron transparency using 6KV Argon ions at a beam current of 1 x 10-3 A and a 12° angle of incidence. The discs were coated with carbon prior to TEM examination to minimize charging effects.

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Simulations of high-resolution images of amorphous silicon films

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010014419x ◽

1986 ◽

Vol 44 ◽

pp. 544-545

Author(s):

G. Y. Fan ◽

J. M. Cowley

Keyword(s):

Electron Microscope ◽

High Frequency ◽

Fourier Transformation ◽

Amorphous Materials ◽

Low Frequency ◽

Chromatic Aberration ◽

Structure Information ◽

Frequency Components ◽

High Resolution Images ◽

Spatial Frequency Spectrum

It is well known that the structure information on the specimen is not always faithfully transferred through the electron microscope. Firstly, the spatial frequency spectrum is modulated by the transfer function (TF) at the focal plane. Secondly, the spectrum suffers high frequency cut-off by the aperture (or effectively damping terms such as chromatic aberration). While these do not have essential effect on imaging crystal periodicity as long as the low order Bragg spots are inside the aperture, although the contrast may be reversed, they may change the appearance of images of amorphous materials completely. Because the spectrum of amorphous materials is continuous, modulation of it emphasizes some components while weakening others. Especially the cut-off of high frequency components, which contribute to amorphous image just as strongly as low frequency components can have a fundamental effect. This can be illustrated through computer simulation. Imaging of a whitenoise object with an electron microscope without TF limitation gives Fig. 1a, which is obtained by Fourier transformation of a constant amplitude combined with random phases generated by computer.

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SEM image sharpness analysis

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100163174 ◽

1996 ◽

Vol 54 ◽

pp. 142-143

Author(s):

M. T. Postek ◽

A. E. Vladar

Keyword(s):

High Frequency ◽

Low Frequency ◽

Quantitative Information ◽

Primary Electron ◽

Image Sharpness ◽

Critical Dimensions ◽

Sem Image ◽

Frequency Changes ◽

Electron Microscopes ◽

Scanning Electron

Fully automated or semi-automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. The industry requires that an automated instrument must be routinely capable of 5 nm resolution (or better) at 1.0 kV accelerating voltage for the measurement of nominal 0.25-0.35 micrometer semiconductor critical dimensions. Testing and proving that the instrument is performing at this level on a day-by-day basis is an industry need and concern which has been the object of a study at NIST and the fundamentals and results are discussed in this paper.In scanning electron microscopy, two of the most important instrument parameters are the size and shape of the primary electron beam and any image taken in a scanning electron microscope is the result of the sample and electron probe interaction. The low frequency changes in the video signal, collected from the sample, contains information about the larger features and the high frequency changes carry information of finer details. The sharper the image, the larger the number of high frequency components making up that image. Fast Fourier Transform (FFT) analysis of an SEM image can be employed to provide qualitiative and ultimately quantitative information regarding the SEM image quality.

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