scholarly journals Time-Spectral based Polarization-Encoding for Spatial-Temporal Super-Resolved NSOM Readout

2019 ◽  
Vol 9 (1) ◽  
Author(s):  
Matityahu Karelits ◽  
Yaakov Mandelbaum ◽  
Zeev Zalevsky ◽  
Avi Karsenty
Keyword(s):  
Finite Elements ◽  
Schottky Diode ◽  
Near Field ◽  
Evanescent Waves ◽  
The Past ◽  
Enhanced Resolution ◽  
Polarization Encoding ◽  
Scanning Optical Microscopy ◽  
New Generation ◽  
Near Field Scanning

Abstract Detection of evanescent waves through Near-field Scanning Optical Microscopy (NSOM) has been simulated in the past, using Finite Elements Method (FEM) and 2D advanced simulations of a silicon Schottky diode, shaped as a truncated trapezoid photodetector, and sharing a subwavelength pin hole aperture. Towards enhanced resolution and next applications, the study of polarization’s influence was added to the scanning. The detector has been horizontally shifted across a vertically oriented Gaussian beam while several E-field modes, are projected on the top of the device. Both electrical and electro-optical simulations have been conducted. These results are promising towards the fabrication of a new generation of photodetector devices which can serve for Time-Spectral based Polarization-Encoding for Spatial-Temporal Super-Resolved NSOM Readout, as developed in the study.

scholarly journals Near-Field Plasmon-Resonance Scanning Microscopy

1995 ◽  
Vol 3 (8) ◽  
pp. 3-4
Author(s):  
Sheldon Schultz
Keyword(s):  
Plasmon Resonance ◽  
Near Field ◽  
Far Field ◽  
Lateral Size ◽  
Physical Sciences ◽  
Signal To Noise ◽  
Near Field Optics ◽  
The Past ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

In the past few years the field of near-field scanning optical microscopy (NSOM) has developed rapidly with applications spanning all the physical sciences. A key goal of this form of microscopy is to obtain resolution at levels well beyond those possible with the usual far-field optics. In contrast to far-field optics, which is bounded by the well known limits imposed by diffraction, near-field optics has no “in principle” fundamental lower limit in lateral size, at least down to atomic dimensions, although in practice, signal-to-noise considerations may restrict the application of NSOM to a few nanometers.

Near-field scanning optical microscopy

1986 ◽  
Vol 44 ◽  
pp. 642-643
Author(s):  
E. Betzig ◽  
A. Harootunian ◽  
M. Isaacson ◽  
A. Lewis
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Visible Radiation ◽  
Field Methods ◽  
Optical Elements ◽  
Optical Region ◽  
Order Of Magnitude ◽  
Nondestructive Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.

Raman imaging with near‐field scanning optical microscopy

1995 ◽  
Vol 67 (17) ◽  
pp. 2483-2485 ◽  
Author(s):  
C. L. Jahncke ◽  
M. A. Paesler ◽  
H. D. Hallen
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Raman Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Investigations of liquid crystals and liquid ambients using near-field scanning optical microscopy

1995 ◽  
Vol 61 (1-4) ◽  
pp. 291-294 ◽  
Author(s):  
Patrick J. Moyer ◽  
Stefan Kämmer ◽  
Karsten Walzer ◽  
Michael Hietschold
Keyword(s):  
Liquid Crystals ◽  
Optical Microscopy ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Near-Field Magneto-Photoluminescence of Singe Self-Organized Quantum Dots.

2003 ◽  
Vol 794 ◽  
Author(s):  
A. M. Mintairov ◽  
A. S. Vlasov ◽  
J. L. Merz
Keyword(s):  
Quantum Dots ◽  
Near Field ◽  
Energy Shift ◽  
Zeeman Splitting ◽  
Negative Energy ◽  
Zero Magnetic Field ◽  
Bimodal Size Distribution ◽  
Self Organized ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

ABSTRACTWe present results obtained using low temperature near-field scanning optical microscopy for the measurements of Zeeman splitting and the diamagnetic shift of single self-organized InAs/AlAs, InAs/GaAs and InP/GaInP quantum dots. The measurements allow us to relate the bimodal size distribution of InAs dots with variations in In content. For single InP QDs we observed a strong circular polarization at zero magnetic field accompanied with a negative energy shift, suggesting that strong internal magnetic fields exist in these QDs.

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