scholarly journals Passivation of miniature microwave coplanar waveguides using a thin film fluoropolymer electret

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Jaouad Marzouk ◽  
Vanessa Avramovic ◽  
David Guérin ◽  
Steve Arscott

AbstractThe insertion losses of miniature gold/silicon-on-insulator (SOI) coplanar waveguides (CPW) are rendered low, stable, and light insensitive when covered with a thin film (95 nm) fluoropolymer deposited by a trifluoromethane (CHF3) plasma. Microwave characterization (0–50 GHz) of the CPWs indicates that the fluoropolymer stabilizes a hydrogen-passivated silicon surface between the CPW tracks. The hydrophobic nature of the fluoropolymer acts as a humidity barrier, meaning that the underlying intertrack silicon surfaces do not re-oxidize over time—something that is known to increase losses. In addition, the fluoropolymer thin film also renders the CPW insertion losses insensitive to illumination with white light (2400 lx)—something potentially advantageous when using optical microscopy observations during microwave measurements. Capacitance–voltage (CV) measurements of gold/fluoropolymer/silicon metal–insulator-semiconductor (MIS) capacitors indicate that the fluoropolymer is an electret—storing positive charge. The experimental results suggest that the stored positive charge in the fluoropolymer electret and charge trapping influence surface-associated losses in CPW—MIS device modelling supports this. Finally, and on a practical note, the thin fluoropolymer film is easily pierced by commercial microwave probes and does not adhere to them—facilitating the repeatable and reproducible characterization of microwave electronic circuitry passivated by thin fluoropolymer.

2016 ◽  
Vol 120 (24) ◽  
pp. 244501 ◽  
Author(s):  
Alwin Daus ◽  
Christian Vogt ◽  
Niko Münzenrieder ◽  
Luisa Petti ◽  
Stefan Knobelspies ◽  
...  

1998 ◽  
Vol 72 (10) ◽  
pp. 1199-1201 ◽  
Author(s):  
Hank Shin ◽  
Stella Hong ◽  
Tom Wetteroth ◽  
Syd R. Wilson ◽  
Dieter K. Schroder

2011 ◽  
Vol 14 (11) ◽  
pp. H460 ◽  
Author(s):  
Surani Bin Dolmanan ◽  
Siew Lang Teo ◽  
Vivian Kaixin Lin ◽  
Hui Kim Hui ◽  
Armin Dadgar ◽  
...  

2011 ◽  
Vol 47 (38) ◽  
pp. 10593 ◽  
Author(s):  
Girjesh Dubey ◽  
Federico Rosei ◽  
Gregory P. Lopinski

2011 ◽  
Vol 9 ◽  
pp. 19-26
Author(s):  
M. Rohland ◽  
U. Arz ◽  
S. Büttgenbach

Abstract. In this work we compare on-wafer calibration standards fabricated in membrane technology with standards built in conventional thin-film technology. We perform this comparison by investigating the propagation of uncertainties in the geometry and material properties to the broadband electrical properties of the standards. For coplanar waveguides used as line standards the analysis based on Monte Carlo simulations demonstrates an up to tenfold reduction in uncertainty depending on the electromagnetic waveguide property we look at.


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