scholarly journals Nanoscopic live electrooptic imaging

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Masahiro Tsuchiya ◽  
Shigeru Takata ◽  
Kazuhiro Ohsone ◽  
Shinji Fukui ◽  
Muneo Yorinaga

AbstractA door to the nanoscopic domain is opened regarding real-time visualization of electric field distributions and dynamics. Through the use of a live electrooptic imaging system with an oil-immersion objective lens and a highly thinned electrooptic sensor film, a minimum linewidth of 330 nm and a minimum peak splitting of 650 nm in real-time electric field video images have been successfully demonstrated. In addition, room to improve the resolution is noted, while a few problems that need to be solved are discussed, including an effect caused by optical interference.

2001 ◽  
Vol 125 (4) ◽  
pp. 1743-1753 ◽  
Author(s):  
Shoichiro Kiyomiya ◽  
Hiromi Nakanishi ◽  
Hiroshi Uchida ◽  
Atsunori Tsuji ◽  
Shingo Nishiyama ◽  
...  

2020 ◽  
Vol 7 (2) ◽  
pp. 133
Author(s):  
Thomas M. Lanigan ◽  
Stephanie M. Rasmussen ◽  
Daniel P. Weber ◽  
Kalana S. Athukorala ◽  
Phillip L. Campbell ◽  
...  

The Prostate ◽  
2015 ◽  
Vol 76 (3) ◽  
pp. 307-315 ◽  
Author(s):  
Akio Horiguchi ◽  
Kazuhiro Tsujita ◽  
Kaku Irisawa ◽  
Tadashi Kasamatsu ◽  
Kazuhiro Hirota ◽  
...  

2021 ◽  
Vol 9 ◽  
Author(s):  
Sha An ◽  
Tong Peng ◽  
Shaohui Yan ◽  
Baoli Yao ◽  
Peng Zhang

Optical manipulation of micro-particles with nondiffracting and self-accelerating beams has been successfully applied in many research fields such as chemicophysics, material sciences and biomedicine. Such operation mainly focuses on the particle transport and control in the beam propagation direction. However, the conventional optical microscopy is specifically designed for obtaining the sample information located in the lateral plane, which is perpendicular to the optical axis of the detecting objective lens, making the real-time observation of particle dynamics in axial plane a challenge. In this work, we propose and demonstrate a technique which integrates a special beam optical tweezer with a direct axial plane imaging system. Here, particles are transported in aqueous solution along a parabolic trajectory by a designed nonparaxial Weber self-accelerating beam, and the particle motion dynamics both in lateral and axial plane are monitored in real-time by the axial plane imaging technique.


2014 ◽  
Vol 2014 ◽  
pp. 1-10 ◽  
Author(s):  
Yujie Li ◽  
Huimin Lu ◽  
Lifeng Zhang ◽  
Jianru Li ◽  
Seiichi Serikawa

Remote robotic exploration holds vast potential for gaining knowledge about extreme environments, which is difficult to be accessed by humans. In the last two decades, various underwater devices were developed for detecting the mines and mine-like objects in the deep-sea environment. However, there are some problems in recent equipment, like poor accuracy of mineral objects detection, without real-time processing, and low resolution of underwater video frames. Consequently, the underwater objects recognition is a difficult task, because the physical properties of the medium, the captured video frames, are distorted seriously. In this paper, we are considering use of the modern image processing methods to determine the mineral location and to recognize the mineral actually within a little computation complex. We firstly analyze the recent underwater imaging models and propose a novel underwater optical imaging model, which is much closer to the light propagation model in the underwater environment. In our imaging system, we remove the electrical noise by dual-tree complex wavelet transform. And then we solve the nonuniform illumination of artificial lights by fast guided trilateral bilateral filter and recover the image color through automatic color equalization. Finally, a shape-based mineral recognition algorithm is proposed for underwater objects detection. These methods are designed for real-time execution on limited-memory platforms. This pipeline is suitable for detecting underwater objects in practice by our experiences. The initial results are presented and experiments demonstrate the effectiveness of the proposed real-time visualization system.


Author(s):  
Willem H.J. Andersen

Electron microscope design, and particularly the design of the imaging system, has reached a high degree of perfection. Present objective lenses perform up to their theoretical limit, while the whole imaging system, consisting of three or four lenses, provides very wide ranges of magnification and diffraction camera length with virtually no distortion of the image. Evolution of the electron microscope in to a routine research tool in which objects of steadily increasing thickness are investigated, has made it necessary for the designer to pay special attention to the chromatic aberrations of the magnification system (as distinct from the chromatic aberration of the objective lens). These chromatic aberrations cause edge un-sharpness of the image due to electrons which have suffered energy losses in the object.There exist two kinds of chromatic aberration of the magnification system; the chromatic change of magnification, characterized by the coefficient Cm, and the chromatic change of rotation given by Cp.


Author(s):  
Hannes Lichte

Generally, the electron object wave o(r) is modulated both in amplitude and phase. In the image plane of an ideal imaging system we would expect to find an image wave b(r) that is modulated in exactly the same way, i. e. b(r) =o(r). If, however, there are aberrations, the image wave instead reads as b(r) =o(r) * FT(WTF) i. e. the convolution of the object wave with the Fourier transform of the wave transfer function WTF . Taking into account chromatic aberration, illumination divergence and the wave aberration of the objective lens, one finds WTF(R) = Echrom(R)Ediv(R).exp(iX(R)) . The envelope functions Echrom(R) and Ediv(R) damp the image wave, whereas the effect of the wave aberration X(R) is to disorder amplitude and phase according to real and imaginary part of exp(iX(R)) , as is schematically sketched in fig. 1.Since in ordinary electron microscopy only the amplitude of the image wave can be recorded by the intensity of the image, the wave aberration has to be chosen such that the object component of interest (phase or amplitude) is directed into the image amplitude. Using an aberration free objective lens, for X=0 one sees the object amplitude, for X= π/2 (“Zernike phase contrast”) the object phase. For a real objective lens, however, the wave aberration is given by X(R) = 2π (.25 Csλ3R4 + 0.5ΔzλR2), Cs meaning the coefficient of spherical aberration and Δz defocusing. Consequently, the transfer functions sin X(R) and cos(X(R)) strongly depend on R such that amplitude and phase of the image wave represent only fragments of the object which, fortunately, supplement each other. However, recording only the amplitude gives rise to the fundamental problems, restricting resolution and interpretability of ordinary electron images:


2001 ◽  
Vol 7 (S2) ◽  
pp. 148-149
Author(s):  
C.D. Poweleit ◽  
J Menéndez

Oil immersion lenses have been used in optical microscopy for a long time. The light’s wavelength is decreased by the oil’s index of refraction n and this reduces the minimum spot size. Additionally, the oil medium allows a larger collection angle, thereby increasing the numerical aperture. The SIL is based on the same principle, but offers more flexibility because the higher index material is solid. in particular, SILs can be deployed in cryogenic environments. Using a hemispherical glass the spatial resolution is improved by a factor n with respect to the resolution obtained with the microscope’s objective lens alone. The improvement factor is equal to n2 for truncated spheres.As shown in Fig. 1, the hemisphere SIL is in contact with the sample and does not affect the position of the focal plane. The focused rays from the objective strike the lens at normal incidence, so that no refraction takes place.


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