scholarly journals Efficient few-shot machine learning for classification of EBSD patterns

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Kevin Kaufmann ◽  
Hobson Lane ◽  
Xiao Liu ◽  
Kenneth S. Vecchio
Keyword(s):  
Neural Networks ◽  
Deep Learning ◽  
Transfer Learning ◽  
Performance Metrics ◽  
Materials Science ◽  
Electron Backscatter Diffraction ◽  
Point Group ◽  
Phase Identification ◽  
Classification Problems

AbstractDeep learning is quickly becoming a standard approach to solving a range of materials science objectives, particularly in the field of computer vision. However, labeled datasets large enough to train neural networks from scratch can be challenging to collect. One approach to accelerating the training of deep learning models such as convolutional neural networks is the transfer of weights from models trained on unrelated image classification problems, commonly referred to as transfer learning. The powerful feature extractors learned previously can potentially be fine-tuned for a new classification problem without hindering performance. Transfer learning can also improve the results of training a model using a small amount of data, known as few-shot learning. Herein, we test the effectiveness of a few-shot transfer learning approach for the classification of electron backscatter diffraction (EBSD) pattern images to six space groups within the $$\left( {4/m \overline {3} 2/m} \right)$$ 4 / m 3 ¯ 2 / m point group. Training history and performance metrics are compared with a model of the same architecture trained from scratch. In an effort to make this approach more explainable, visualization of filters, activation maps, and Shapley values are utilized to provide insight into the model’s operations. The applicability to real-world phase identification and differentiation is demonstrated using dual phase materials that are challenging to analyze with traditional methods.

scholarly journals Utilizing Information Bottleneck to Evaluate the Capability of Deep Neural Networks for Image Classification

Entropy ◽  
2019 ◽  
Vol 21 (5) ◽  
pp. 456 ◽  
Author(s):  
Hao Cheng ◽  
Dongze Lian ◽  
Shenghua Gao ◽  
Yanlin Geng
Keyword(s):  
Neural Networks ◽  
Deep Learning ◽  
Model Selection ◽  
Image Classification ◽  
Transfer Learning ◽  
Deep Neural Networks ◽  
Classification Problem ◽  
Distribution Model ◽  
Classification Problems ◽  
Information Bottleneck

Inspired by the pioneering work of the information bottleneck (IB) principle for Deep Neural Networks’ (DNNs) analysis, we thoroughly study the relationship among the model accuracy, I ( X ; T ) and I ( T ; Y ) , where I ( X ; T ) and I ( T ; Y ) are the mutual information of DNN’s output T with input X and label Y. Then, we design an information plane-based framework to evaluate the capability of DNNs (including CNNs) for image classification. Instead of each hidden layer’s output, our framework focuses on the model output T. We successfully apply our framework to many application scenarios arising in deep learning and image classification problems, such as image classification with unbalanced data distribution, model selection, and transfer learning. The experimental results verify the effectiveness of the information plane-based framework: Our framework may facilitate a quick model selection and determine the number of samples needed for each class in the unbalanced classification problem. Furthermore, the framework explains the efficiency of transfer learning in the deep learning area.

scholarly journals Enabling deeper learning on big data for materials informatics applications

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Dipendra Jha ◽  
Vishu Gupta ◽  
Logan Ward ◽  
Zijiang Yang ◽  
Christopher Wolverton ◽  
...  
Keyword(s):  
Neural Networks ◽  
Big Data ◽  
Deep Learning ◽  
Deep Neural Networks ◽  
Materials Science ◽  
Prediction Models ◽  
Model Performance ◽  
Materials Informatics ◽  
Learning Framework ◽  
Significant Attention

AbstractThe application of machine learning (ML) techniques in materials science has attracted significant attention in recent years, due to their impressive ability to efficiently extract data-driven linkages from various input materials representations to their output properties. While the application of traditional ML techniques has become quite ubiquitous, there have been limited applications of more advanced deep learning (DL) techniques, primarily because big materials datasets are relatively rare. Given the demonstrated potential and advantages of DL and the increasing availability of big materials datasets, it is attractive to go for deeper neural networks in a bid to boost model performance, but in reality, it leads to performance degradation due to the vanishing gradient problem. In this paper, we address the question of how to enable deeper learning for cases where big materials data is available. Here, we present a general deep learning framework based on Individual Residual learning (IRNet) composed of very deep neural networks that can work with any vector-based materials representation as input to build accurate property prediction models. We find that the proposed IRNet models can not only successfully alleviate the vanishing gradient problem and enable deeper learning, but also lead to significantly (up to 47%) better model accuracy as compared to plain deep neural networks and traditional ML techniques for a given input materials representation in the presence of big data.

Tobacco Leaf Grading Based on Deep Convolutional Neural Networks and Machine Vision

2021 ◽  
Vol 65 (1) ◽  
pp. 11-22
Author(s):  
Mengyao Lu ◽  
Shuwen Jiang ◽  
Cong Wang ◽  
Dong Chen ◽  
Tian’en Chen
Keyword(s):  
Neural Networks ◽  
Deep Learning ◽  
Transfer Learning ◽  
Convolutional Neural Networks ◽  
Classification Accuracy ◽  
Classification Model ◽  
List Type ◽  
Tobacco Leaves ◽  
Tobacco Leaf ◽  
Grading Model

HighlightsA classification model for the front and back sides of tobacco leaves was developed for application in industry.A tobacco leaf grading method that combines a CNN with double-branch integration was proposed.The A-ResNet network was proposed and compared with other classic CNN networks.The grading accuracy of eight different grades was 91.30% and the testing time was 82.180 ms, showing a relatively high classification accuracy and efficiency.Abstract. Flue-cured tobacco leaf grading is a key step in the production and processing of Chinese-style cigarette raw materials, directly affecting cigarette blend and quality stability. At present, manual grading of tobacco leaves is dominant in China, resulting in unsatisfactory grading quality and consuming considerable material and financial resources. In this study, for fast, accurate, and non-destructive tobacco leaf grading, 2,791 flue-cured tobacco leaves of eight different grades in south Anhui Province, China, were chosen as the study sample, and a tobacco leaf grading method that combines convolutional neural networks and double-branch integration was proposed. First, a classification model for the front and back sides of tobacco leaves was trained by transfer learning. Second, two processing methods (equal-scaled resizing and cropping) were used to obtain global images and local patches from the front sides of tobacco leaves. A global image-based tobacco leaf grading model was then developed using the proposed A-ResNet-65 network, and a local patch-based tobacco leaf grading model was developed using the ResNet-34 network. These two networks were compared with classic deep learning networks, such as VGGNet, GoogLeNet-V3, and ResNet. Finally, the grading results of the two grading models were integrated to realize tobacco leaf grading. The tobacco leaf classification accuracy of the final model, for eight different grades, was 91.30%, and grading of a single tobacco leaf required 82.180 ms. The proposed method achieved a relatively high grading accuracy and efficiency. It provides a method for industrial implementation of the tobacco leaf grading and offers a new approach for the quality grading of other agricultural products. Keywords: Convolutional neural network, Deep learning, Image classification, Transfer learning, Tobacco leaf grading

scholarly journals Deep Neural Network Enabled Space Group Identification in EBSD

2020 ◽  
Vol 26 (3) ◽  
pp. 447-457 ◽  
Author(s):  
Kevin Kaufmann ◽  
Chaoyi Zhu ◽  
Alexander S. Rosengarten ◽  
Kenneth S. Vecchio
Keyword(s):  
Machine Learning ◽  
Electron Backscatter Diffraction ◽  
Group Identification ◽  
Point Group ◽  
Phase Identification ◽  
Space Group ◽  
Multiple Length Scales ◽  
Analysis Technique ◽  
Diffraction Patterns ◽  
Backscatter Diffraction

AbstractElectron backscatter diffraction (EBSD) is one of the primary tools in materials development and analysis. The technique can perform simultaneous analyses at multiple length scales, providing local sub-micron information mapped globally to centimeter scale. Recently, a series of technological revolutions simultaneously increased diffraction pattern quality and collection rate. After collection, current EBSD pattern indexing techniques (whether Hough-based or dictionary pattern matching based) are capable of reliably differentiating between a “user selected” set of phases, if those phases contain sufficiently different crystal structures. EBSD is currently less well suited for the problem of phase identification where the phases in the sample are unknown. A pattern analysis technique capable of phase identification, utilizing the information-rich diffraction patterns potentially coupled with other data, such as EDS-derived chemistry, would enable EBSD to become a high-throughput technique replacing many slower (X-ray diffraction) or more expensive (neutron diffraction) methods. We utilize a machine learning technique to develop a general methodology for the space group classification of diffraction patterns; this is demonstrated within the $\lpar 4/m\comma \;\bar{3}\comma \;\;2/m\rpar$ point group. We evaluate the machine learning algorithm's performance in real-world situations using materials outside the training set, simultaneously elucidating the role of atomic scattering factors, orientation, and pattern quality on classification accuracy.

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