In situ TEM observation of rebonding on fractured silicon carbide

Nanoscale ◽  
2018 ◽  
Vol 10 (14) ◽  
pp. 6261-6269 ◽  
Author(s):  
Zhenyu Zhang ◽  
Junfeng Cui ◽  
Bo Wang ◽  
Haiyue Jiang ◽  
Guoxin Chen ◽  
...  
Keyword(s):  
Silicon Carbide ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Atomic Resolution ◽  
In Situ Tem ◽  
Novel Approach ◽  
Transmission Electron

A novel approach is developed using an eyebrow hair to pick up and transfer nanowires (NWs), in order to obtain in situ transmission electron microscope (TEM) images of the rebonding and self-matching of SFs at atomic resolution.

Insights into the growth of bismuth nanoparticles on 2D structured BiOCl photocatalysts: an in situ TEM investigation

2015 ◽  
Vol 44 (36) ◽  
pp. 15888-15896 ◽  
Author(s):  
Xiaofeng Chang ◽  
Shuangbao Wang ◽  
Qi Qi ◽  
Mohammed A. Gondal ◽  
Siddique G. Rashid ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
In Situ Tem ◽  
Bismuth Nanoparticles ◽  
Transmission Electron

The formation and growth of bismuth nanoparticles onto BiOCl have been directly observed and characterized using a transmission electron microscope.

Grain Boundary Responses to Local and Applied Stress: An In Situ TEM Deformation Study

2006 ◽  
Vol 976 ◽  
Author(s):  
Bryan Miller ◽  
Jamey Fenske ◽  
Dong Su ◽  
Chung-Ming Li ◽  
Lisa Dougherty ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Grain Boundary ◽  
Grain Boundaries ◽  
Grain Growth ◽  
Transmission Electron Microscope ◽  
In Situ Tem ◽  
Deformation Twins ◽  
Transmission Electron ◽  
Dislocation Interactions

AbstractDeformation experiments at temperatures between 300 and 750 K have been performed in situ in the transmission electron microscope to investigate dislocation interactions and reactions with grain boundaries and other obstacles. Dislocations, both partial and perfect, as well as deformation twins have been observed being emitted from grain boundaries and, in some cases, even the same grain boundary. The ejection of dislocations from the grain boundary can result in its partial or total annihilation. In the latter case, the disintegration of the grain boundary was accompanied by grain growth and a change in misorientation.

In Situ Ultrahigh Vacuum Transmission Electron Microscope Investigations of Dynamical Changes of Nanostructures on Silicon

2006 ◽  
Vol 46 ◽  
pp. 111-119 ◽  
Author(s):  
Lih Juann Chen ◽  
Wen Wei Wu ◽  
C.H. Liu
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Ultrahigh Vacuum ◽  
In Situ Tem ◽  
Dynamic Changes ◽  
Directed Movement ◽  
Precise Knowledge ◽  
Transmission Electron ◽  
Unique Capability

In situ ultrahigh vacuum transmission electron microscope (TEM) is a powerful tool to investigate the dynamic changes of nanostructures on silicon. By observing growth and phase transitions in situ, understanding of their mechanisms can be used to model relevant processes. With the precise knowledge of the changes occurred on an atomic level, accurate control of the growth process can be achieved. The dynamical changes occurred on the nano scale are often unexpected, which also underscores the importance of the approach. In this presentation, we highlight two examples to demonstrate the unique capability of in situ TEM to study the dynamical changes. The examples include collective movement of Au nanoparticles and directed movement of Au-Si droplets on Si bi-crystal.

The Etching of Silicon by Oxygen Observed by in situ Tem

1991 ◽  
Vol 222 ◽  
Author(s):  
Frances M. Ross ◽  
J. Murray Gibson
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
In Situ Tem ◽  
Step Motion ◽  
Etching Mechanism ◽  
Transmission Electron ◽  
Macroscopic Parameters ◽  
Made In ◽  
Oxygen Etching

ABSTRACTWe describe observations made in situ in a modified UHV transmission electron microscope of the process of etching of the Si (111) surface by oxygen. Etching occurs by the motion of individual bilayer steps across the surface and by analysing the step motion we discuss the etching mechanism in the context of macroscopic parameters.

In Situ Tem Study of Amorphous to Crystalline Transformation in R-Fe-B Ribbons

1991 ◽  
Vol 232 ◽  
Author(s):  
Y. J. Zhang ◽  
Y. Z. Wang ◽  
G. C. Hadjipanayis
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Building Blocks ◽  
In Situ Tem ◽  
Local Unit ◽  
X Ray Diffraction ◽  
X Ray ◽  
Unit Structure ◽  
Transmission Electron

ABSTRACTThe amorphous-crystalline transformation in R-Fe-B ribbons was studied in situ in a transmission electron microscope (TEM) and with X-ray diffraction. Metastable phases of α-Fe(R) and Fe3B were found to form during crystallization before the final R2Fe14B phase is formed. The Fe3B phase is believed to be important for the formation of the 2:14:1 phase because its “local unit structure” is one of the basic building blocks in the 2:14:1 unit cell.

In situ TEM observations of melting in nanosized eutectic Pb-Cd inclusions embedded in Al

1996 ◽  
Vol 54 ◽  
pp. 986-987
Author(s):  
S. Hagège ◽  
U. Dahmen ◽  
E. Johnson ◽  
A. Johansen ◽  
V.S. Tuboltsev
Keyword(s):  
Electron Microscope ◽  
Melt Spinning ◽  
Ternary Alloys ◽  
Solid Matrix ◽  
Eutectic System ◽  
In Situ Tem ◽  
In Situ Observation ◽  
Orientation Relationships ◽  
Transmission Electron

Small particles of a low-melting phase embedded in a solid matrix with a higher melting point offer the possibility of studying the mechanisms of melting and solidification directly by in-situ observation in a transmission electron microscope. Previous studies of Pb, Cd and other low-melting inclusions embedded in an Al matrix have shown well-defined orientation relationships, strongly faceted shapes, and an unusual size-dependent superheating before melting.[e.g. 1,2].In the present study we have examined the shapes and thermal behavior of eutectic Pb-Cd inclusions in Al. Pb and Cd form a simple eutectic system with each other, but both elements are insoluble in solid Al. Ternary alloys of Al (Pb,Cd) were prepared from high purity elements by melt spinning or by sequential ion implantation of the two alloying additions to achieve a total alloying addition of up to lat%. TEM observations were made using a heating stage in a 200kV electron microscope equipped with a video system for recording dynamic behavior.

Remote On-Line Control of a High-Voltage in situ Transmission Electron Microscope with A Rational User Interface

1996 ◽  
Vol 54 ◽  
pp. 384-385
Author(s):  
M.A. O’Keefe ◽  
J. Taylor ◽  
D. Owen ◽  
B. Crowley ◽  
K.H. Westmacott ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
User Interface ◽  
Transmission Electron Microscope ◽  
High Voltage ◽  
Materials Science ◽  
Transmission Electron ◽  
On Line ◽  
Electron Microscopes

Remote on-line electron microscopy is rapidly becoming more available as improvements continue to be developed in the software and hardware of interfaces and networks. Scanning electron microscopes have been driven remotely across both wide and local area networks. Initial implementations with transmission electron microscopes have targeted unique facilities like an advanced analytical electron microscope, a biological 3-D IVEM and a HVEM capable of in situ materials science applications. As implementations of on-line transmission electron microscopy become more widespread, it is essential that suitable standards be developed and followed. Two such standards have been proposed for a high-level protocol language for on-line access, and we have proposed a rational graphical user interface. The user interface we present here is based on experience gained with a full-function materials science application providing users of the National Center for Electron Microscopy with remote on-line access to a 1.5MeV Kratos EM-1500 in situ high-voltage transmission electron microscope via existing wide area networks. We have developed and implemented, and are continuing to refine, a set of tools, protocols, and interfaces to run the Kratos EM-1500 on-line for collaborative research. Computer tools for capturing and manipulating real-time video signals are integrated into a standardized user interface that may be used for remote access to any transmission electron microscope equipped with a suitable control computer.

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