scholarly journals Stabilization of GaAs photoanodes by in situ deposition of nickel-borate surface catalysts as hole trapping sites

2019 ◽  
Vol 3 (3) ◽  
pp. 814-822 ◽  
Author(s):  
Chaoran Jiang ◽  
Jiang Wu ◽  
Savio J. A. Moniz ◽  
Daqian Guo ◽  
Mingchu Tang ◽  
...  

A nanocomposite Ni–B/Ga(As)Ox/GaAs photoanode fabricated by combining molecular beam epitaxy with in situ photoassisted electrodeposition enables efficient and stable photoelectrochemical water splitting.

1996 ◽  
Vol 421 ◽  
Author(s):  
M. Passlack ◽  
M. Hong

AbstractWe have extended the spectrum of molecular-beam epitaxy (MBE) related techniques by introducing in-situ deposition of oxides. The oxide films have been deposited on clean, atomically ordered (100) GaAs wafer surfaces using molecular beams of gallium-, magnesium-, silicon-, or aluminum oxide. Among the fabricated oxide-GaAs heterostructures, Ga2O3-GaAs interfaces exhibit unique electronic properties including an interface state density Dit in the low 1010 cm−2eV−1 range and an interface recombination velocity S of 4000 cm/s. The formation of inversion layers in both n- and p-type GaAs has been clearly established. Further, thermodynamic and photochemical stability of excellent electronic interface properties of Ga2O3-GaAs structures has been demonstrated.


2019 ◽  
Vol 371 ◽  
pp. 885-892 ◽  
Author(s):  
Shiqian Zhou ◽  
Pengfei Yue ◽  
Jingwei Huang ◽  
Lei Wang ◽  
Houde She ◽  
...  

2018 ◽  
Vol 29 (47) ◽  
pp. 475603 ◽  
Author(s):  
Zhenzhu Xu ◽  
Shuguang Zhang ◽  
Fangliang Gao ◽  
Lei Wen ◽  
Yuefeng Yu ◽  
...  

Author(s):  
D. Loretto ◽  
J. M. Gibson ◽  
S. M. Yalisove ◽  
R. T. Tung

The cobalt disilicide/silicon system has potential applications as a metal-base and as a permeable-base transistor. Although thin, low defect density, films of CoSi2 on Si(111) have been successfully grown, there are reasons to believe that Si(100)/CoSi2 may be better suited to the transmission of electrons at the silicon/silicide interface than Si(111)/CoSi2. A TEM study of the formation of CoSi2 on Si(100) is therefore being conducted. We have previously reported TEM observations on Si(111)/CoSi2 grown both in situ, in an ultra high vacuum (UHV) TEM and ex situ, in a conventional Molecular Beam Epitaxy system.The procedures used for the MBE growth have been described elsewhere. In situ experiments were performed in a JEOL 200CX electron microscope, extensively modified to give a vacuum of better than 10-9 T in the specimen region and the capacity to do in situ sample heating and deposition. Cobalt was deposited onto clean Si(100) samples by thermal evaporation from cobalt-coated Ta filaments.


1998 ◽  
Vol 73 (26) ◽  
pp. 3857-3859 ◽  
Author(s):  
D. Stifter ◽  
M. Schmid ◽  
K. Hingerl ◽  
A. Bonanni ◽  
M. Garcia-Rocha ◽  
...  

2000 ◽  
Vol 639 ◽  
Author(s):  
Ryuhei Kimura ◽  
Kiyoshi Takahashi ◽  
H. T. Grahn

ABSTRACTAn investigation of the growth mechanism for RF-plasma assisted molecular beam epitaxy of cubic GaN films using a nitrided AlGaAs buffer layer was carried out by in-situ reflection high energy electron diffraction (RHEED) and high resolution X-ray diffraction (HRXRD). It was found that hexagonal GaN nuclei grow on (1, 1, 1) facets during nitridation of the AlGaAs buffer layer, but a highly pure, cubic-phase GaN epilayer was grown on the nitrided AlGaAs buffer layer.


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